電子顕微鏡における試料損傷軽減のための画像処理法

• Project/Area Number: 59550034
• Research Category: Grant-in-Aid for General Scientific Research (C)
• Allocation Type: Single-year Grants
• Research Field: 物理計測・光学
• Research Institution: Nihon University
• Principal Investigator: 石川 晃 日本大学, 文理学部, 講師
• Project Period (FY): 1984
• Project Status: Completed (Fiscal Year 1984)
• Budget Amount: ¥800,000 (Direct Cost: ¥800,000); Fiscal Year 1984: ¥800,000 (Direct Cost: ¥800,000)