Time-resolved observation of surface and interface structures
Publicly Offered Research
Project Area | 3D Active-Site Science |
Project/Area Number |
15H01044
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Research Category |
Grant-in-Aid for Scientific Research on Innovative Areas (Research in a proposed research area)
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Allocation Type | Single-year Grants |
Review Section |
Science and Engineering
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Research Institution | Tokyo Gakugei University |
Principal Investigator |
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Project Period (FY) |
2015-04-01 – 2017-03-31
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Project Status |
Completed (Fiscal Year 2016)
|
Budget Amount *help |
¥5,980,000 (Direct Cost: ¥4,600,000、Indirect Cost: ¥1,380,000)
Fiscal Year 2016: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Fiscal Year 2015: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
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Keywords | X線反射率 / X線回折 / 表面・界面 / 物性実験 / 時分割測定 / X線反射率 / X線回折 |
Outline of Annual Research Achievements |
In the present research, an instrument for time-resolved measurements of the specular X-ray reflectivity and surface X-ray diffraction was improved and applied to the observation of dynamical processes at surfaces and interfaces, with the goal to further understanding of the functionality of active sites. This instrument can simultaneously observe the in-situ structure on the atomic scale and the nanometer scale with a time resolution of seconds or less. The first topic that was adressed in FY2016 was the investigation of processes occuring during the photoconversion of organic thin films, which is a promising method for organic device fabrication. The structural evolution during the photoconversion was clarified for two different organic semiconductor materials. The second topic that was investigated was processes occurring at the interface between an ionic liquid and an electrode. Time-resolved experiments with different electrode surfaces were conducted. The measurement method was improved by designing a new crystal bender for focusing the X-rays. Another important advance was the extension of the method to monochromatic X-rays, so that both high-brightness undulator X-ray sources and widely available laboratory X-ray sources can be used.
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Research Progress Status |
28年度が最終年度であるため、記入しない。
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Strategy for Future Research Activity |
28年度が最終年度であるため、記入しない。
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Report
(2 results)
Research Products
(13 results)