非線形誘電率顕微鏡の高機能化及び電子デバイスへの応用

• 研究課題/領域番号: 23226008
• 研究種目: 基盤研究(S)
• 配分区分: 補助金
• 研究分野: 電子デバイス・電子機器
• 研究機関: 東北大学
• 研究代表者: 長 康雄 東北大学, 電気通信研究所, 教授 (40179966)
• 研究分担者: 山末 耕平 東北大学, 電気通信研究所, 助教 (70467455) ; 平永 良臣 東北大学, 電気通信研究所, 助教 (70436161)
• 研究期間 (年度): 2011-04-01 – 2016-03-31
• 研究課題ステータス: 完了 (2016年度)
• 配分額: 210,340千円 (直接経費: 161,800千円、間接経費: 48,540千円); 2015年度: 26,130千円 (直接経費: 20,100千円、間接経費: 6,030千円); 2014年度: 32,760千円 (直接経費: 25,200千円、間接経費: 7,560千円); 2013年度: 34,580千円 (直接経費: 26,600千円、間接経費: 7,980千円); 2012年度: 41,080千円 (直接経費: 31,600千円、間接経費: 9,480千円); 2011年度: 75,790千円 (直接経費: 58,300千円、間接経費: 17,490千円)
• キーワード: 走査型非線形誘電率顕微鏡 / 超高次走査型非線形誘電率顕微鏡 / 走査型非線形誘電率ポテンショメトリ / 強誘電体記録 / 超高密度記録 / 化合物パワー半導体デバイス / グラフェン / 太陽電池 / SiCーMOSFET / オペランド計測． / 超高次非線形誘電率顕微鏡 法 / 原子分解能SNDM / 半導体計測技術 / 原子双極子モーメント / 半導体原子計測 / 半導体デバイス計測

研究成果の概要

次数の高い高次微分項まで計測し，より詳細な物理情報が取得できる新しいSNDM 法（超高次走査型非線形誘電率顕微鏡法（SHO-SNDM 法）を開発した．本手法を用いると，計測ピクセルごとに局所C - V 曲線を再構成することが簡単に行え，分析能力が飛躍的に増大する．次に双極子モーメント由来の発生電位を原子分解能で可視化する走査型非線形誘電率ポテンショメトリ（SNDP）が開発された．本手法を用いて，4H-SiC(0001)基板上に形成された単層グラフェンの形状像と表面電位分布の同時観察に成功した．最後に回転ディスク型強誘電体記録再生方式において3.4Tbit/inch2の超高密度記録を実現した．

評価記号

検証結果 (区分)

A

研究成果

• [雑誌論文] Nondestructive and local evaluation of SiO2/SiC interface using super-higher-order scanning nonlinear dielectric microscopy (2016)
  • 著者名/発表者名: Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada,Hajime Okumura, and Yasuo Cho
  • 雑誌名: Materials Science Forum 巻: 858 ページ: 469-472
  • DOI: 10.4028/www.scientific.net/msf.858.469
  • 査読あり
• [雑誌論文] Visualization of polarization and two dimensional electron gas distribution in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy (2016)
  • 著者名/発表者名: Kotaro Hirose, Norimichi Chinone, and Yasuo Cho
  • 雑誌名: Materials Science Forum 巻: 858 ページ: 1182-1185
  • DOI: 10.4028/www.scientific.net/msf.858.1182
  • 査読あり / 謝辞記載あり
• [雑誌論文] High-density ferroelectric recording using a hard disk drive-type data storage system (2016)
  • 著者名/発表者名: Tomonori Aoki, Yoshiomi Hiranaga, and Yasuo Cho
  • 雑誌名: J. Appl. Phys. 巻: 119 号: 18 ページ: 184101-184101
  • DOI: 10.1063/1.4948940
  • 査読あり / 謝辞記載あり
• [雑誌論文] Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear dielectric potentiometry (2016)
  • 著者名/発表者名: Kohei Yamasue, Hirokazu Fukidome, Keiichiro Tashima, Maki Suemitsu, and Yasuo Cho
  • 雑誌名: Jpn. J. Appl. Phys. 巻: 55 号: 8S1 ページ: 08NB02-08NB02
  • DOI: 10.7567/jjap.55.08nb02
  • NAID: 210000146969
  • 査読あり / 謝辞記載あり
• [雑誌論文] Simultaneous observation of two dimensional electron gas and polarization in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy (2016)
  • 著者名/発表者名: Kotaro Hirose, Yasunori Goto, Norimichi Chinone, and Yasuo Cho
  • 雑誌名: Jpn. J. Appl. Phys. 巻: 55 号: 8S1 ページ: 08NB13-08NB13
  • DOI: 10.7567/jjap.55.08nb13
  • NAID: 210000146980
  • 査読あり / 謝辞記載あり
• [雑誌論文] Visualization of Gate-Bias-Induced Carrier Redistribution in SiC Power DIMOSFET Using Scanning Nonlinear Dielectric Microscopy (2016)
  • 著者名/発表者名: Norimichi Chinone, and Yasuo Cho
  • 雑誌名: IEEE TRANSACTIONS ON ELECTRON DEVICES 巻: 63 号: 8 ページ: 3165-3170
  • DOI: 10.1109/ted.2016.2571780
  • 査読あり
• [雑誌論文] Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy (2016)
  • 著者名/発表者名: N. Chinone, R.Kosugi ,Y. Tanaka, S. Harada, H. Okumura, and Y. Cho
  • 雑誌名: Microelectronics Reliability 巻: 64 ページ: 566-569
  • DOI: 10.1016/j.microrel.2016.07.088
  • 査読あり
• [雑誌論文] Interfacial charge states in graphene on SiC studied by noncontact scanning nonlinear dielectric potentiometry (2015)
  • 著者名/発表者名: Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, and Yasuo Cho
  • 雑誌名: Physical Review Letters 巻: 114 号: 22 ページ: 226103-226103
  • DOI: 10.1103/physrevlett.114.226103
  • 査読あり / オープンアクセス / 謝辞記載あり
• [雑誌論文] Experimental study of electric dipoles on an oxygen-adsorbed Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy (2015)
  • 著者名/発表者名: Masataka Suzuki, Kohei Yamasue, and Yasuo Cho
  • 雑誌名: Appl. Phys. Lett. 巻: 107 号: 3
  • DOI: 10.1063/1.4927244
  • 査読あり / 謝辞記載あり
• [雑誌論文] Visualization and analysis of active dopant distribution in a p-i-n structured amorphous silicon solar cell using scanning nonlinear dielectric microscopy (2015)
  • 著者名/発表者名: K. Hirose, N. Chinone, and Y. Cho
  • 雑誌名: AIP ADVANCES 巻: 5 号: 9
  • DOI: 10.1063/1.4931028
  • 査読あり / 謝辞記載あり
• [雑誌論文] Scanning nonlinear dielectric potentiometry (2015)
  • 著者名/発表者名: Kohei Yamasue and Yasuo Cho
  • 雑誌名: Review of Scientific Instruments 巻: 86 号: 9 ページ: 093704-093704
  • DOI: 10.1063/1.4930181
  • 査読あり / 謝辞記載あり
• [雑誌論文] Interfacial capacitance between a ferroelectric Fe3O4 thin film and a semiconducting Nb:SrTiO3 substrate (2015)
  • 著者名/発表者名: R. Takahashi,Y. Cho, M. Lippmaa
  • 雑誌名: J. Appl. Phys 巻: 117 号: 1 ページ: 014104-014104
  • DOI: 10.1063/1.4905384
  • 査読あり
• [雑誌論文] Charge gradient microscopy (2014)
  • 著者名/発表者名: Seungbum Hong , Sheng Tong , Woon lk Park , Yoshiomi Hiranaga , Yasuo Cho, Andreas Roelofs
  • 雑誌名: Proc. Natl. Acad. Sci. USA 巻: 111 号: 18 ページ: 6566-6569
  • DOI: 10.1073/pnas.1324178111
  • 査読あり
• [雑誌論文] Nano-Domains and Related Phenomena in Congruent Lithium Tantalate Single Crystals Studied by Scanning Nonlinear Dielectric Microscopy (2014)
  • 著者名/発表者名: Yasuo Cho
  • 雑誌名: IEEE TRANSACTION ON ULTRASONICS, FERROELECTRICS, AND FREQUENCY CONTROL 巻: 61 号: 8 ページ: 1368-1378
  • DOI: 10.1109/tuffc.2014.3045
  • 査読あり / 謝辞記載あり
• [雑誌論文] Cross-sectional dopant profiling and depletion layer visualization of SiC power double diffused metal-oxide-semiconductor field effect transistor using super-higher-order nonlinear dielectric microscopy (2014)
  • 著者名/発表者名: N. Chinone, T.Nakamura, Y. Cho
  • 雑誌名: J. Appl. Phys 巻: 116 号: 8
  • DOI: 10.1063/1.4893959
  • 査読あり / 謝辞記載あり
• [雑誌論文] Improved study of electric dipoles on the Si(100)-2x1 surface by non-contact scanning nonlinear dielectric microscopy (2014)
  • 著者名/発表者名: M. Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho
  • 雑誌名: Applied Physics Letters 巻: 105 号: 10 ページ: 1016031-3
  • DOI: 10.1063/1.4895031
  • 査読あり
• [雑誌論文] Atomic-dipole-moment induced local surface potential on Si(111)-(7x7) surface studied by non-contact scanning nonlinear dielectric microscopy (2014)
  • 著者名/発表者名: K. Yamasue, M. Abe, Y. Sugimoto, and Y. Cho
  • 雑誌名: Applied Physics Letters 巻: 105 号: 12 ページ: 1216011-5
  • DOI: 10.1063/1.4896323
  • 査読あり
• [雑誌論文] Pb (Zr, Ti)O3 recording media for probe data storage devices prepared by rf magnetron sputtering (2014)
  • 著者名/発表者名: Yoshiomi Hiranaga,Yasuo Cho
  • 雑誌名: Jpn. J. Appl. Phys. 巻: 53 号: 9S ページ: 09PA05-09PA05
  • DOI: 10.7567/jjap.53.09pa05
  • NAID: 210000144474
  • 査読あり / 謝辞記載あり
• [雑誌論文] Investigation of solution-processed bismuth-niobium-oxide films (2014)
  • 著者名/発表者名: Satoshi Inoue, Tomoki Ariga, Shin Matsumoto, Masatoshi Onoue, Takaaki Miyasako, Eisuke Tokumitsu, Norimichi Chinone, Yasuo Cho and Tatsuya Shimoda
  • 雑誌名: J. Appl. Phys. 巻: 116 号: 15
  • DOI: 10.1063/1.4898323
  • NAID: 120005652019
  • 査読あり
• [雑誌論文] Simultaneous measurement of tunneling current and atomic dipole moment on Si(111) -(7×7) surface by noncontact scanning nonlinear dielectric microscopy (2013)
  • 著者名/発表者名: Kohei Yamasue, Yasuo Cho
  • 雑誌名: J. Appl. Phys. 巻: 113 号: 1
  • DOI: 10.1063/1.4772705
  • 査読あり / 謝辞記載あり
• [雑誌論文] Atomic dipole moment distribution on a hydrogen-adsorbed Si(111) - (7×7) surface observed by noncontact scanning nonlinear dielectric microscopy (2013)
  • 著者名/発表者名: Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
  • 雑誌名: Appl. Phys. Lett. 巻: 103 号: 10
  • DOI: 10.1063/1.4820348
  • 査読あり / 謝辞記載あり
• [雑誌論文] Measurements of Nonlinear Dielectric Constants of Pb(Zr,Ti)O3 Thin Films Using a Dynamic Measuring Method (2013)
  • 著者名/発表者名: Yoshiomi Hiranaga, Yasuo Cho
  • 雑誌名: Jpn. J. Appl. Phys. 巻: 52 号: 9S1 ページ: 09KA08-09KA08
  • DOI: 10.7567/jjap.52.09ka08
  • NAID: 210000142824
  • 査読あり
• [雑誌論文] High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy (2013)
  • 著者名/発表者名: N. Chinone, K. Yamasue, K. Honda, Y. Cho
  • 雑誌名: Journal of Physics : Conference Series 巻: 471 ページ: 012023-012023
  • DOI: 10.1088/1742-6596/471/1/012023
  • 査読あり / 謝辞記載あり
• [雑誌論文] Electrical conduction in nanodomains in congruent lithium tantalate single crystal (2013)
  • 著者名/発表者名: Yasuo Cho
  • 雑誌名: Appl. Phys. Lett. 巻: 104 号: 4
  • DOI: 10.1063/1.4863754
  • 査読あり / 謝辞記載あり
• [雑誌論文] Visualization of Electrons Localized in Metal-Oxide-Nitride-Oxide-Semiconductor Flash Memory Thin Gate Films by Detecting High-Order Nonlinear Permittivity Using Scanning Nonlinear Dielectric Microscopy (2012)
  • 著者名/発表者名: Koichiro Honda, Yasuo Cho
  • 雑誌名: Appl. Phys. Express 巻: Vol.5 号: 3 ページ: 036602-036602
  • DOI: 10.1143/apex.5.036602
  • NAID: 10030511604
  • 査読あり
• [雑誌論文] Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric Microscopy (2012)
  • 著者名/発表者名: Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga, Yasuo Cho
  • 雑誌名: Jpn. J. Appl. Phys 巻: Vol.51 号: 9S1 ページ: 09LE07-09LE07
  • DOI: 10.1143/jjap.51.09le07
  • NAID: 210000141273
  • 査読あり
• [雑誌論文] Atomic Scale Imaging of TiO2(100) Reconstructed Surfaces by Noncontact Scanning Nonlinear Dielectric Microscopy (2012)
  • 著者名/発表者名: Nobuhiro Sawai
  • 雑誌名: Jpn. J. Appl Phys. 巻: Vol.51 号: 12R ページ: 121801-121801
  • DOI: 10.1143/jjap.51.121801
  • 査読あり
• [雑誌論文] Scanning nonlinear dielectric microscopy observation of accumulated charges in metal-SiO2-SiN-SiO2-Si flash memory by detecting higher-order nonlinear permittivity (2012)
  • 著者名/発表者名: Koichiro Honda
  • 雑誌名: Appl. Phys. Lett. 巻: Vol.101 号: 24
  • DOI: 10.1063/1.4769352
  • 査読あり
• [雑誌論文] New evaluation of fullerene molecule on Si(111)-7×7 reconstructed structure using non-contact scanning non-linear dielectric microscopy (2012)
  • 著者名/発表者名: Shin-ichiro Kobayashi
  • 雑誌名: Surface Science 巻: Vol.606 号: 3-4 ページ: 174-180
  • DOI: 10.1016/j.susc.2011.09.011
  • 査読あり
• [雑誌論文] Scanning nonlinear dielectric microscopy (2011)
  • 著者名/発表者名: Yasuo Cho
  • 雑誌名: J. Mater. Res. 巻: Vol.26 号: 16 ページ: 2007-2016
  • DOI: 10.1557/jmr.2011.219
  • 査読あり
• [雑誌論文] Observation of Polarization Distribution on Si(111) Surface by Scanning Nonlinear Dielectric Microscopy (2011)
  • 著者名/発表者名: Kohei Yamasue
  • 雑誌名: Jpn. J. Appl. Phys. 巻: Vol.50 号: 9S2 ページ: 09NE12-09NE12
  • DOI: 10.1143/jjap.50.09ne12
  • NAID: 210000071318
  • 査読あり
• [学会発表] urface polarization on a Si(111) reconstructed surface measured by noncontact scanning nonlinear dielectric potentiometry (2016)
  • 著者名/発表者名: K. Yamasue, and Y. Cho
  • 学会等名: ecoss32
  • 発表場所: Grenoble, France
  • 年月日: 2016-08-28
  • 国際学会
• [学会発表] Ferroelectric Nanodomain Observation in Yttrium-Doped HfO2 Thin Films Using Scanning Nonlinear Dielectric Microscopy (2016)
  • 著者名/発表者名: Z. Chen, Y. Hiranaga, T. Shimizu, K. Katayama, T. Mimura, H. Funakubo, and Y. Cho
  • 学会等名: 2016 Joint ISAF/ECAPD/PFM Conference
  • 発表場所: Darmstadt, Germany
  • 年月日: 2016-08-21
  • 国際学会
• [学会発表] Quantitative thickness measurement in polarity-inverted piezoelectric layered thin film using scanning nonlinear dielectric microscopy (2016)
  • 著者名/発表者名: H. Odagawa, K. Terada, H. Nishikawa, Y. Tanaka, T. Yanagitani, and Y. Cho
  • 学会等名: 2016 Joint ISAF/ECAPD/PFM Conference
  • 発表場所: Darmstadt, Germany
  • 年月日: 2016-08-21
  • 国際学会
• [学会発表] Surface polarization measurement on a reconstructed Si(111) surface by noncontact scanning nonlinear dielectric potentiometry (2016)
  • 著者名/発表者名: K. Yamasue, and Y. Cho
  • 学会等名: NC-AFM 2016
  • 発表場所: Nottingham,UK
  • 年月日: 2016-07-25
  • 国際学会
• [学会発表] Two-Dimensional Characterization of Phosphorus-Implanted Emitter and Phosphorus-Diffused Emitter of Silicon Solar Cell Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy (2016)
  • 著者名/発表者名: K. Hirose, N. Chinone & Y. Cho
  • 学会等名: EU PVSEC 2016
  • 発表場所: Munich, Germany
  • 年月日: 2016-06-20
  • 国際学会
• [学会発表] Two-Dimensional Characterization of Active Dopant Distribution in a p-i-n Structured Amorphous Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy (2016)
  • 著者名/発表者名: K. Hirose, N. Chinone & Y. Cho
  • 学会等名: EU PVSEC 2016
  • 発表場所: Munich, Germany
  • 年月日: 2016-06-20
  • 国際学会
• [学会発表] Two-dimensional Analysis of Carrier Distribution in Phosphorus-Implanted Emitter and Phosphorus-Diffused Emitter using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy (2016)
  • 著者名/発表者名: Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Norimichi Chinone, Yasuo Cho
  • 学会等名: 43rd IEEE Photovoltaic Specialists Conference
  • 発表場所: PORTLAND , U.S.A
  • 年月日: 2016-06-05
  • 国際学会
• [学会発表] wo dimensional electron gas and polarization measurement in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy (2015)
  • 著者名/発表者名: K. Hirose, Y. Goto, N. Chinone, and Y. Cho
  • 学会等名: ICSPM23
  • 発表場所: ヒルトンニセコビレッジホテル，北海道虻田郡ニセコ町, Japan
  • 年月日: 2015-12-10
  • 国際学会
• [学会発表] Graphene on C-terminated Face of 4H-SiC Observed by Noncontact Scanning Nonlinear Dielectric Potentiometry (2015)
  • 著者名/発表者名: K. Yamasue, H. Fukidome, K. Tashima, M. Suemitsu, Y. Cho
  • 学会等名: ICSPM23
  • 発表場所: ヒルトンニセコビレッジホテル，北海道虻田郡ニセコ町, Japan
  • 年月日: 2015-12-10
  • 国際学会
• [学会発表] Simultaneous Imaging of Atomically Resolved Topography and Potential of Graphene on C-Terminated Face of SiC Using Scanning Nonlinear Dielectric Potentiometry (2015)
  • 著者名/発表者名: Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
  • 学会等名: 2015 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2015-11-29
  • 国際学会
• [学会発表] Polarization and Two Dimensional Electron Gas Visualization in AlGaN/GaN Heterostructure (2015)
  • 著者名/発表者名: Kotaro Hirose, Norimichi Chinone, Yasunori Goto, Yasuo Cho
  • 学会等名: 2015 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2015-11-29
  • 国際学会
• [学会発表] Negligible Covalent Bonding in Proper Ferroelectric Ferromagnet: Strained La2NiMnO6 Thin Film (2015)
  • 著者名/発表者名: Ryota Takahashi, Isao Ohkubo, Kunihiko Yamauchi, Miho Kitamura, Yasunari Sakurai, Masaharu Oshima, Tamio Oguchi, Yasuo Cho, Mikk Lippmaa
  • 学会等名: 2015 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2015-11-29
  • 国際学会
• [学会発表] Hard-Disk-Drive-Type Ferroelectric Data Recording with Memory Density over 1 Tbit/inch2 Based on Scanning Nonlinear Dielectric Microscopy (2015)
  • 著者名/発表者名: Tomonori Aoki, Yoshiomi Hiranaga, Yasuo Cho
  • 学会等名: 2015 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2015-11-29
  • 国際学会 / 招待講演
• [学会発表] Local and Nondestructive Evaluation of SiO2/SiC Interface Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy (2015)
  • 著者名/発表者名: Norimichi Chinone, Ryoji Kosugi, Yasuonori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho
  • 学会等名: 2015 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2015-11-29
  • 国際学会
• [学会発表] Visualization of Carrier Distribution in Operated SiC Power-MOSFET Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy (2015)
  • 著者名/発表者名: Norimichi Chinone, Yasuo Cho
  • 学会等名: 2015 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2015-11-29
  • 国際学会
• [学会発表] Investigation of Oxygen Adsorbed Si(100)-(2x1) Surface Using Noncontact Scanning Nonlinear Dielectric Microscopy (2015)
  • 著者名/発表者名: Masataka Suzuki, Kohei Yamasue, Yasuo Cho
  • 学会等名: 2015 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2015-11-29
  • 国際学会
• [学会発表] Dopant Profiling Analysis of P-I-N Structure in Thin-Film Amorphous Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy (2015)
  • 著者名/発表者名: Kotaro Hirose, Norimichi Chinone, Yasuo Cho
  • 学会等名: 2015 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2015-11-29
  • 国際学会
• [学会発表] Carrier redistribution analysis of gate-biased SiC power-MOSFET using super-higher-order scanning nonlinear dielectric microscopy (2015)
  • 著者名/発表者名: Norimichi Chinone and Yasuo Cho
  • 学会等名: ISTFA 2015
  • 発表場所: Portland, USA
  • 年月日: 2015-11-01
  • 国際学会
• [学会発表] Observation of polarization and two dimensional electron gas in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy (2015)
  • 著者名/発表者名: Kotaro Hirose, Norimichi Chinone and Yasuo Cho
  • 学会等名: ISTFA 2015
  • 発表場所: Portland, USA
  • 年月日: 2015-11-01
  • 国際学会
• [学会発表] Visualization of gate-bias dependent carrier distribution in SiC power-MOSFET using super-higher-order scanning nonlinear dielectric microscopy (2015)
  • 著者名/発表者名: Norimichi Chinone and Yasuo Cho
  • 学会等名: ESREF 2015
  • 発表場所: Toulouse, France
  • 年月日: 2015-10-05
  • 国際学会
• [学会発表] Visualization of polarization and two dimensional electron gas distribution in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy (2015)
  • 著者名/発表者名: Kotaro Hirose, Norimichi Chinone, Yasuo Cho
  • 学会等名: ICSCRM 2015
  • 発表場所: Giardini Naxos, Italy
  • 年月日: 2015-10-04
  • 国際学会
• [学会発表] Nondestructive and local evaluation of SiO2/SiC interface using superhigher-order scanning nonlinear dielectric microscopy (2015)
  • 著者名/発表者名: Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho
  • 学会等名: ICSCRM 2015
  • 発表場所: Giardini Naxos, Italy
  • 年月日: 2015-10-04
  • 国際学会
• [学会発表] Observation of graphene on C-terminated face of SiC using noncontact scanning nonlinear dielectric potentiometry (2015)
  • 著者名/発表者名: K. Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, and Y. Cho
  • 学会等名: nc AFM 2015
  • 発表場所: Cassis, France
  • 年月日: 2015-09-07
  • 国際学会
• [学会発表] Oxygen adsorption on a Si(100)-(2×1) surface studied by noncontact scanning nonlinear dielectric microscopy (2015)
  • 著者名/発表者名: M. Suzuki, K. Yamasue, and Y. Cho
  • 学会等名: nc AFM 2015
  • 発表場所: Cassis, France
  • 年月日: 2015-09-07
  • 国際学会
• [学会発表] Graphene on C-terminated face of 4H-SiC studied by noncontact scanning nonlinear dielectric potentiometry (2015)
  • 著者名/発表者名: Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
  • 学会等名: ECOSS-31
  • 発表場所: Barcelona, Spain
  • 年月日: 2015-08-31
  • 国際学会
• [学会発表] Non-contact scanning nonlinear dielectric microscopy study of oxygen-adsorption on a Si(100)-(2×1) surface (2015)
  • 著者名/発表者名: Kohei Yamasue, Masataka Suzuki, Yasuo Cho
  • 学会等名: ECOSS-31
  • 発表場所: Barcelona, Spain
  • 年月日: 2015-08-31
  • 国際学会
• [学会発表] Charge Gradient Microscopy : Electromechanical Charge Scraping and Refill of Screening Charges (2015)
  • 著者名/発表者名: Seungbum Hong, Sheng Tong, Yoon-Young Choi, Woon Ik Park, Liliana Stan, Yoshiomi Hiranaga, Yasuo Cho,Andreas Roelofs
  • 学会等名: MMC 2015
  • 発表場所: Manchester, UK
  • 年月日: 2015-06-29
  • 国際学会 / 招待講演
• [学会発表] Read/Write Demonstration of Ferroelectric Probe Data Storage with a Density Exceeding 1 Tbit/inch2 (2015)
  • 著者名/発表者名: T. Aoki, Y. Hiranaga, and Y. Cho
  • 学会等名: 13th EUROPEAN MEETING ON FERROELECTRICITY
  • 発表場所: PORTO, PORTUGAL
  • 年月日: 2015-06-28
  • 国際学会
• [学会発表] Method for Measuring Polarity-Inverted Layered Structure in Dielectric Thin Films Using Scanning Nonlinear Dielectric Microscopy (2015)
  • 著者名/発表者名: H.Odagawa, K.Terada, H.Nishikawa, T.Yanagitani, and Y. Cho
  • 学会等名: 13th EUROPEAN MEETING ON FERROELECTRICITY
  • 発表場所: PORTO, PORTUGAL
  • 年月日: 2015-06-28
  • 国際学会
• [学会発表] Surface Analytical Study on Ferroelectric Recording Media Using XPS and SNDM (2015)
  • 著者名/発表者名: Y. Hiranaga, Y. T. Chen, and Y. Cho
  • 学会等名: 13th EUROPEAN MEETING ON FERROELECTRICITY
  • 発表場所: PORTO, PORTUGAL
  • 年月日: 2015-06-28
  • 国際学会
• [学会発表] HYDROGEN-INTERCALATED GRAPHENE ON SiC STUDIED BY NONCONTACT SCANNING NONLINEAR DIELECTRIC POTENTIOMETRY (2015)
  • 著者名/発表者名: Y. Cho, K. Yamasue, H. Fukidome,K. Funakubo, M. Suemitsu
  • 学会等名: ISPM Conference 2015
  • 発表場所: RIO DE JANEIRO, Brazil
  • 年月日: 2015-06-21
  • 国際学会
• [学会発表] SCANNING NONLINEAR DIELECTRIC POTENTIOMETRY：NEW STRATEGY FOR MESURING DIPOLE-INDUCED POTENTIALS IN ATOIMIC SCALE (2015)
  • 著者名/発表者名: Y. Cho, K. Yamasue
  • 学会等名: ISPM Conference 2015
  • 発表場所: RIO DE JANEIRO, Brazil
  • 年月日: 2015-06-21
  • 国際学会
• [学会発表] Gate-bias dependent carrier distribution visualization in SiC power-MOSFET using super-higher-order SNDM (2015)
  • 著者名/発表者名: Norimichi Chinone, Yasuo Cho
  • 学会等名: EMN CANCUN MEETING 2015
  • 発表場所: Cancun,Mexico
  • 年月日: 2015-06-08
  • 国際学会 / 招待講演
• [学会発表] Data Bit Recording with a Density Exceeding 1 Tbit/inch2 Using an HDD-Type Ferroelectric Probe Data Storage Unit (2015)
  • 著者名/発表者名: T. Aoki, Y. Hiranaga, and Y. Cho
  • 学会等名: 2015 JOINT ISAF-ISIF-PFM CONFERENCE
  • 発表場所: SINGAPORE
  • 年月日: 2015-05-24
  • 国際学会
• [学会発表] Effect of Ion Beam Irradiation on Recording Media of Ferroelectric Probe Data Storage (2015)
  • 著者名/発表者名: Y. Hiranaga, Y. T. Chen, and Y. Cho
  • 学会等名: 2015 JOINT ISAF-ISIF-PFM CONFERENCE
  • 発表場所: SINGAPORE
  • 年月日: 2015-05-24
  • 国際学会
• [学会発表] Charge Gradient Microscopy:Electromechanical Charge Scraping at the Nanoscale (2015)
  • 著者名/発表者名: S. Hong, S. Tong, Y. Choi, W. Park, Y. Hiranaga, Y. Cho, A. Roelofs
  • 学会等名: EMA2015
  • 発表場所: Orlando, Florida
  • 年月日: 2015-01-21
  • 国際学会 / 招待講演
• [学会発表] Simultaneous Observation of Topography and Electric Dipole Moments on Si(100)-2×1 Surface Using Non-Contact Scanning Nonlinear Dielectric Microscopy (2014)
  • 著者名/発表者名: Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
  • 学会等名: 2014 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2014-11-30
  • 国際学会
• [学会発表] Dipole-Induced Potential Measurement Using Noncontact Scanning Nonlinear Dielectric Microscopy (2014)
  • 著者名/発表者名: Kohei Yamasue, Yasuo Cho
  • 学会等名: 2014 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2014-11-30
  • 国際学会
• [学会発表] Comparative Study on Pristine and Hydrogen-Intercalated Graphene on 4H-SiC(0001) Surface Using Noncontact Scanning Nonlinear Dielectric Microscopy (2014)
  • 著者名/発表者名: Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
  • 学会等名: 2014 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2014-11-30
  • 国際学会
• [学会発表] Evaluation of Power SiC -MOSFET Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy : Imaging of Carrier Distribution and Depletion Layer (2014)
  • 著者名/発表者名: N. Chinone, T. Nakamura, Y. Cho
  • 学会等名: ISTFA 2014
  • 発表場所: Houston, Texas
  • 年月日: 2014-11-09
  • 国際学会
• [学会発表] High resolution imaging of dopant and depletion layer distribution in SiC power MOSFET using super-higher-order nonlinear dielectric microscopy (2014)
  • 著者名/発表者名: Norimichi Chinone, Takashi Nakamura, Yasuo Cho
  • 学会等名: ESREF2014
  • 発表場所: Berlin, Germany
  • 年月日: 2014-09-29
  • 国際学会
• [学会発表] Investigation of Hydrogen-Intercalated Graphene on 4H-SiC(0001) by Noncontact Scanning Nonlinear Dielectric Microscopy (2014)
  • 著者名/発表者名: Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho
  • 学会等名: ECOSS30
  • 発表場所: Antalya, TURKEY
  • 年月日: 2014-08-31
  • 国際学会
• [学会発表] A New Atomically Resolved Potentiometry for Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy (2014)
  • 著者名/発表者名: Kohei Yamasue, Yasuo Cho
  • 学会等名: ECOSS30
  • 発表場所: Antalya, TURKEY
  • 年月日: 2014-08-31
  • 国際学会
• [学会発表] Investigation of electric dipole moments on Si(100)-2×1 surface using non-contact scanning nonlinear dielectric microscopy (2014)
  • 著者名/発表者名: Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
  • 学会等名: ECOSS30
  • 発表場所: Antalya, TURKEY
  • 年月日: 2014-08-31
  • 国際学会
• [学会発表] Charge gradient microscopy: high-speed visualization of polarization charges using a nanoscale probe (2014)
  • 著者名/発表者名: eungbum Hong, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, and Andreas Roelofs
  • 学会等名: Nanoscale Spectroscopy and Nanotechnology 8
  • 発表場所: Chicago, USA
  • 年月日: 2014-07-28
  • 国際学会 / 招待講演
• [学会発表] High-Resolution Imaging of Hydrogen-Intercalated Graphene on 4H-SiC(0001) Using Non-Contact Scanning Nonlinear Dielectric Microscopy (2014)
  • 著者名/発表者名: Kohei Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, Y. Cho
  • 学会等名: ICN+T 2014
  • 発表場所: Vail, Colorado, USA
  • 年月日: 2014-07-20
  • 国際学会
• [学会発表] A Novel Method for Simultaneous Measurement of Topography and Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy (2014)
  • 著者名/発表者名: K. Yamasue, Yasuo Cho
  • 学会等名: ICN+T 2014
  • 発表場所: Vail, Colorado, USA
  • 年月日: 2014-07-20
  • 国際学会
• [学会発表] Study of Electric Dipole Moment Distribution on Si(100)-2×1 Surface by Non-Contact Scanning Nonlinear Dielectric Microscopy (2014)
  • 著者名/発表者名: Masataka Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, Y. Cho
  • 学会等名: ICN+T 2014
  • 発表場所: Vail, Colorado, USA
  • 年月日: 2014-07-20
  • 国際学会
• [学会発表] Conduction in nanodomain inversion dots in congruent lithium tantalate single crystal (2014)
  • 著者名/発表者名: Y. Cho
  • 学会等名: ECAPD 2014
  • 発表場所: Vilnius, Lithuania
  • 年月日: 2014-07-07
  • 国際学会
• [学会発表] Measurement of Polarization Structure in Layered Piezoelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy (2014)
  • 著者名/発表者名: H. Odagawa, T. Yanagitani, Y. Cho
  • 学会等名: ECAPD 2014
  • 発表場所: Vilnius, Lithuania
  • 年月日: 2014-07-07
  • 国際学会
• [学会発表] Measurement of Nonlinear Dielectric Constants of PZT Thin Films used in Ferroelectric Probe Data Storage Technology (2014)
  • 著者名/発表者名: Y. Hiranaga and Y. Cho
  • 学会等名: 2014 Joint IEEE ISAF-IWATMD-PFM
  • 発表場所: PennState(State college), USA
  • 年月日: 2014-05-12
  • 国際学会
• [学会発表] Pyroelectric Detection of Spontaneous Polarization in Multiferroic La2NiMnO6 Thin Films (2014)
  • 著者名/発表者名: Ryota Takahashi, Isao Ohkubo, Miho Kitamura, Masaharu Oshima, Yasuo Cho, Mikk Lippmaa
  • 学会等名: 2014 MRS Spring Meeting
  • 発表場所: San Francisco, USA
  • 年月日: 2014-04-21
  • 国際学会 / 招待講演
• [学会発表] Charge Gradient Microscopy: A Method to Image Ferroelectric and Piezoelectric Domains (2014)
  • 著者名/発表者名: Andreas Roelofs, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, Seungbum Hong
  • 学会等名: 2014 MRS Spring Meeting
  • 発表場所: San Francisco, USA
  • 年月日: 2014-04-21
  • 国際学会
• [学会発表] Conduction in Nanodomains in Lithium Tantalate Single Crystal (2013)
  • 著者名/発表者名: Yasuo Cho
  • 学会等名: ICSS 2013
  • 発表場所: Las Vegas Nevada, USA
  • 年月日: 2013-12-15 – 2013-12-18
  • 招待講演
• [学会発表] Interfacial Capacitance between an Fe3 O4 Film and a Nb:TiO3 Substrate (2013)
  • 著者名/発表者名: Ryota Takahashi, Yasuo Cho, Mikk Lippmaa
  • 学会等名: 2013 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2013-12-01 – 2013-12-06
• [学会発表] High Resolution Visualization of Carrier Distribution in SiC-MOSFET Using Super-Higher-Order Nonlinear Dielectric Microscopy (2013)
  • 著者名/発表者名: Norimichi Chinone, Takashi Nakamura, Yasuo Cho
  • 学会等名: 2013 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2013-12-01 – 2013-12-06
• [学会発表] Current Conduction around Nanodomain Inversion Dot in Lithium Tantalate Single Crystal Studied by Using C-AFM and SNDM (2013)
  • 著者名/発表者名: Yasuo Cho
  • 学会等名: 2013 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2013-12-01 – 2013-12-06
• [学会発表] Site Specific Measurement of Atomic Dipole Moment Induced Local Surface Potentials on Si(111)-(7× 7) Surface by Noncontact Scanning Nonlinear Dielectric Microscopy (2013)
  • 著者名/発表者名: Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
  • 学会等名: 2013 MRS fall meeting
  • 発表場所: Boston, USA
  • 年月日: 2013-12-01 – 2013-12-06
• [学会発表] Site-specific Measurement of Atomic Dipole Moment Induced Surface Potential on Si(111)-(7×7) by Noncontact Scanning Nonlinear Dielectric Microscopy (2013)
  • 著者名/発表者名: Kohei Yamasue , Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
  • 学会等名: ACSIN-12 & ICSPM21
  • 発表場所: Tsukuba, Japan
  • 年月日: 2013-11-04 – 2013-11-08
• [学会発表] Effectiveness of the scanning nonlinear dielectric microscopy on the failure analysis of semiconductor devices (2013)
  • 著者名/発表者名: Koichiro Honda, Yasuo Cho
  • 学会等名: 24th European Symposium on Reliability of Electron Devices
  • 発表場所: Arcachon, France
  • 年月日: 2013-09-30 – 2013-10-04
  • 招待講演
• [学会発表] Atomic dipole moment induced variation of local surface potential on Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy (2013)
  • 著者名/発表者名: Kohei Yamasue , Yasuo Cho
  • 学会等名: 19th International Vacuum Congress
  • 発表場所: Paris, France
  • 年月日: 2013-09-09 – 2013-09-13
• [学会発表] Observation of atomic dipole moment on hydrogen and oxygen adsorbed Si(111)-7×7 surfaces by using noncontact scanning nonlinear dielectric microscopy (2013)
  • 著者名/発表者名: Y. Cho, D. Mizuno, K. Yamasue
  • 学会等名: 19th International Vacuum Congress
  • 発表場所: Paris, France
  • 年月日: 2013-09-09 – 2013-09-13
• [学会発表] CURRENT CONDUCTION AROUND NANODOMAIN INVERSION DOT IN LITHIUM TANTALATE SINGLE CRYSTAL (2013)
  • 著者名/発表者名: Yasuo Cho
  • 学会等名: 13th International Meeting on Ferroelectricity
  • 発表場所: Krakow, Poland
  • 年月日: 2013-09-02 – 2013-09-06
• [学会発表] Bias voltage dependence of atomic dipole moment and topography on hydrogen-adsorbed Si(111)-(7× 7) surface studied by noncontact scanning nonlinear dielectric microscopy (2013)
  • 著者名/発表者名: Kohei Yamasue, Daisuke Mizuno, Yasuo Cho
  • 学会等名: NC-AFM 2013
  • 発表場所: University of Maryland College Park, Maryland, USA
  • 年月日: 2013-08-05 – 2013-08-09
• [学会発表] Site specific measurement of surface potential shift on Si(111)-(7ｘ7) surface by noncontact scanning nonliear dielectric microscopy (2013)
  • 著者名/発表者名: Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho
  • 学会等名: NC-AFM 2013
  • 発表場所: University of Maryland College Park, Maryland, USA
  • 年月日: 2013-08-05 – 2013-08-09
• [学会発表] Nano -Domains and Their Related Phenomena in LiTaO3 Single Crystal Studied by Using Scanning Nonlinear Dielectric Microscopy (2013)
  • 著者名/発表者名: Yasuo Cho
  • 学会等名: 2013 Joint UFFC, EFTF and PFM Symposium
  • 発表場所: Prague, Czech Republic
  • 年月日: 2013-07-21 – 2013-07-25
  • 招待講演
• [学会発表] High resolution imaging of cross section of metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy (2013)
  • 著者名/発表者名: N.Chinone, K.Yamasue, K.Honda,Y.Cho
  • 学会等名: 18th Microscopy of Semiconducting Materials Meeting
  • 発表場所: University of Oxford, UK University of Oxford, UK Prague, Czech Republic University of Maryland College Park, Maryland, USA 発
  • 年月日: 2013-04-07 – 2013-04-11
• [学会発表] Investigation of physical and electrical properties of hydrogen-adsorbed Si(111)-7×7 surface by using noncontact scanning nonlinear dielectric microscopy (2013)
  • 著者名/発表者名: Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
  • 学会等名: 18th Microscopy of Semiconducting Materials Meeting
  • 発表場所: University of Oxford, UK
  • 年月日: 2013-04-07 – 2013-04-11
• [学会発表] Simultaneous imaging of current and local dipole moments of Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy (2012)
  • 著者名/発表者名: Kohei Yamasue, Yasuo Cho
  • 学会等名: 15th International Conference on non-contact Atomic Force Microscopy
  • 発表場所: Cesky Krumlov, Czech Republic
• [学会発表] Observation of dipole moments on hydrogen-adsorbed Si(111)-(7×7) surface by non-contact scanning nonlinear dielectric microscopy (2012)
  • 著者名/発表者名: Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
  • 学会等名: 15th International Conference on non-contact Atomic Force Microscopy
  • 発表場所: Cesky Krumlov, Czech Republic
• [学会発表] Super-higher order nonlinear dielectric microscopy studies on ferroelectric materials and semiconductor devices (2012)
  • 著者名/発表者名: N.CHINONE, K. YAMASUE, Y. HIRANAGA, K.HONDA, Y. CHO
  • 学会等名: International Conference on Nanoscience + Technology 2012
  • 発表場所: Paris, FRANCE
• [学会発表] Atomic electric dipole moment visualization using scanning nonlinear dielectric microscopy (2012)
  • 著者名/発表者名: Y. CHO
  • 学会等名: 11th International Symposium on Ferroic Domains and Micro to Nanoscopic Structures
  • 発表場所: Ekaterinburg, Russia
  • 招待講演
• [学会発表] Observing of charges stored in metal-oxide-nitride-oxide semiconductor flash memory by using higher order nonlinear dielectric microscopy (2012)
  • 著者名/発表者名: K. Honda, T. Iwai, Y. Cho
  • 学会等名: The 15th European Microscopy Congress
  • 発表場所: Manchester, UK
• [学会発表] Resolution improvement of scanning nonlinear dielectric microscopy by measuring the super higher-order nonlinear dielectric constants (2012)
  • 著者名/発表者名: N.Chinone, K. Yamasue, Y. Hiranaga, K.Honda, Y. Cho
  • 学会等名: The 15th European Microscopy Congress
  • 発表場所: Manchester, UK
• [学会発表] Super Higher Order Nonlinear Dielectric Microscopy with Super High Resolution (2012)
  • 著者名/発表者名: Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga Koichiro Honda, Yasuo Cho
  • 学会等名: 2012 MRS fall meeting
  • 発表場所: Boston, USA
• [学会発表] Non-contact Scanning Nonlinear Dielectric Microscopy Studies of Atomic Dipole Moments on Hydrogen-adsorbed Si(111)-7×7 Surface (2012)
  • 著者名/発表者名: Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
  • 学会等名: 2012 MRS fall meeting
  • 発表場所: Boston, USA
• [学会発表] Observation of Threshold Voltage Distribution of Transistors in a Metal-SiO2-SiN-SiO2-semiconductor Flash Memory Using Scanning Nonlinear Dielectric Microscopy (2012)
  • 著者名/発表者名: Koichiro Honda, Yasuo Cho
  • 学会等名: 2012 MRS fall meeting
  • 発表場所: Boston, USA
• [学会発表] Scanning nonlinear dielectric microscopy nano science and technology (2012)
  • 著者名/発表者名: Yasuo Cho
  • 学会等名: 2012 EMN Fall Meeting
  • 発表場所: Las Vegas, USA
  • 招待講演
• [学会発表] Atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface observed by using noncontact scanning nonlinear dielectric microscopy (2012)
  • 著者名/発表者名: Daisuke Mizuno, Kohei Yamasue, Yasuo Cho
  • 学会等名: The 20th International Colloquium on Scanning Probe Microscopy
  • 発表場所: Naha, Japan
• [学会発表] Atomic electric dipole moment visualization using scanning nonlinear dielectric microscopy (2012)
  • 著者名/発表者名: Y. CHO
  • 学会等名: 11th International Symposium on Ferroic Domains and Micro-to Nanoscopic Structures
  • 発表場所: Ekaterinburg, Russia
  • 招待講演
• [学会発表] Scanning nonlinear dielectric microscopy nano science and technology (2012)
  • 著者名/発表者名: Yasuo Cho
  • 学会等名: 2012 EMN Fall Meeting
  • 発表場所: Las Vegas, USA
  • 招待講演
• [学会発表] Scanning nonlinear dielectric microscopy with high resolution and its application to next generation high density ferroelectric data storage (2011)
  • 著者名/発表者名: Yasuo Cho
  • 学会等名: E-MRS ICAM IUMRS 2011 Spring Meeting
  • 発表場所: Nice, France
  • 招待講演
• [学会発表] Study of TiO2(100) Reconstructed Surfaces by Scanning Nonlinear Dielectric Microscopy (2011)
  • 著者名/発表者名: Nobuhiro Sawai
  • 学会等名: 7th NANOSCIENCE and NANOTECHNOLOGY CONFERENCE
  • 発表場所: Istanbul, Turkey
• [学会発表] Observation of local dipole moments on cleaned Si(111) surface with defects by non-contact scanning nonlinear dielectric microscopy (2011)
  • 著者名/発表者名: Kohei YAMASUE
  • 学会等名: 14th International Conference on Noncontact Atomic Force Microscopy
  • 発表場所: Lindau, Germany
• [学会発表] Visualization of Electrons Localized in Metal –SiO2-SiN-SiO2-Semiconductor Flash Memory Thin Gate Films by Detecting the Higher-Order Nonlinear Dielectric Constant Using Scanning Nonlinear Dielectric Microscopy (2011)
  • 著者名/発表者名: Koichiro Honda
  • 学会等名: 2011 MRS fall meeting
  • 発表場所: Boston, USA
• [学会発表] Super Higher-Order Nonlinear Dielectric Microscopy (2011)
  • 著者名/発表者名: N.Chinone
  • 学会等名: The 19th International Colloquium on Scanning Probe Microscopy
  • 発表場所: Hokkaido,Japan
• [図書] Innovative Graphene Technologies: Evaluation and Applications Volume 2 (2013)
  • 著者名/発表者名: Shin-ichiro Kobayashi， Yasuo Cho
  • 総ページ数: 540
  • 出版者: SMITHERS RAPRA TECHNOLOGY LTD.
• [備考] 東北大学電気通信研究所誘電ナノデバイス研究室
  • URL: http://www.d-nanodev.riec.tohoku.ac.jp/
• [備考] 誘電ナノデバイス研究室
  • URL: http://www.d-nanodev.riec.tohoku.ac.jp/
• [備考] 誘電ナノデバイス研究室の研究紹介
  • URL: http://www.d-nanodev.riec.tohoku.ac.jp/research3/index-j.html