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[文献書誌] K.Tohji,Y.Udagawa,T.Matsushita,M.Nomura and T.Ishikawa: "Anisotropic Effects in XーRay Raman Scattering from Graphite" J.Chem.Phys.92. 3233-3235 (1990)
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[文献書誌] T.Ishikawa: "Synchrotron XーRay Topographic Studies on Minute Strain Fields in AsーGrown Silicon Single Crystals" J.Cryst.Growth. 103. 131-140 (1990)
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[文献書誌] T.Kitano,T.Ishikawa and J.Matsui: "Lattice Spacing Measurement around Dislocations in an Undoped GaAs Crystal Grown by LiquidーEncapsulated Czochralski Method" Phil.Mag.A. 63. 95-109 (1991)
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[文献書誌] K.Hirano,K.Izumi,T.Ishikawa,S.Annaka and S.Kikuta: "An XーRay Phase Plate Using BraggーCase Diffraction" Jpn.J.Appl.Phys.30. (1991)
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[文献書誌] T.Ishikawa,K.Hirano and S.Kikuta: "Applications of the Perfect Crystal XーRay Optics" Nutl.Instrum.Method,A.
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[文献書誌] S.Kawado,S.Kojima,I.Maekawa and T.Ishikawa: "Influence of Crystal Imperfection on High Resolution Diffraction Profiles of Silicon Single Crystals Measured by Highly Collimated XーRay Beams" Appl.Phys.Lett.
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[文献書誌] 冨増 多喜夫: "シンクロトロン放射技術" 工業調査会, 541 (1990)