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[文献書誌] F.Iwawaki,H.Kato,M.Tometri and O.Nishikawa: "STM Study of Geometric and Electronic Structures of Ge Dimers on Si(001)" Ultramicroscopy. 42/44. 895-901 (1992)
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[文献書誌] T.Yamaguchi: "Electronic States of Si(001) Stepped Surface under Electric Field Parallel to Surface" Journal of Physical Society of Japan. 61. 3658-3677 (1992)
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[文献書誌] M.Yoshimura,H.Shigekawa,H.Kawadata,Y.Saito and A.Kawazu: "STM Study of Organic Thin Films of BEDT-TTF Iodide" Applied Surface Science. 60/61. 317-320 (1992)
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[文献書誌] Y.Fukano,Y.Sugawara,Y.Yamanishi,T.T.Oasa and S.Morita: "Scanning Force/Tunneling Microxcopy as a Novel Technique for the srudy of Nanometer-Scale Dielectrec Breakdown of Silicon Oxide Layer" Japanese Journal of Applied Physics. 32. 290-293 (192)
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[文献書誌] H.Arakwa,H.Umemura and A.Ikai: "Protein Images Obtained by STM,AFM and TEM" Nature. 358. 171-173 (1992)
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[文献書誌] K.Nakamoto and K.Uozumi: "A Compact STM Compatible with Conventional SEM" Uitramicroscopy. 42-44. 1569-1573 (1992)