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[文献書誌] M. Ashino, M. Tomitori and O. Nishikawa: "Atom Probe and Field Emission Electron Spectroscopy Studies of Semiconductor Films on Metals" Appl. Surf. Sci.87/88. 12-17 (1995)
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[文献書誌] O. Nishikawa, M. Iwatsuki, S. Aoki and Y. Ishikawa: "Performance of the Trial Scanning Atom Probe -A New Approach to Evaluate the Micro Tip Apex-" to appear in J. Vac. Sci. Technol. B. 14. (1996)
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[文献書誌] M. Yamamoto, K. Nishikawa T. Nishiuchi: "Quantitative Analysis of Individual Atom Images in FIM of an Ordered Ni_4Mo Alloy" Appl. Surf. Sci.87/88. 291-297 (1995)
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[文献書誌] A. Nagashima, N. Tejima, Y. Gamou, T. Kawai, C. Oshima: "Electronic Structure of Monolayer Hexagonal Boron Nitride Physisorbed on Metal Surfaces" Phys. Rev. Lett.75. 3918-3920 (1995)
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[文献書誌] M. Yoshimura S. Shinaabe, T. Yao: "STM Study of the Interfacial Structure of Nickel Silicides" to appear in J. Vac. Sci. Technol.(1996)
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[文献書誌] H. Morikawa, K. Okamoto: "A Field Emission Microscope Observation of H_2-and Metal-Phthalocyanines" to appear in Jpn. J. Appl. Phys.(1996)