-
[文献書誌] T.Yoshiie: "Factors to influence the nucleation and growth of interstitial clusters during cascade damage" Jouenal of Nuclear Materials. 212-215. 186-191 (1994)
-
[文献書誌] M.Kiritani: "Formation of vacancy clustered defects from cascade collisions during heavy ion irradiation and their annihilatin by freely migrating interstitial atoms" Journal of Nuclear Materials. 212-215. 192-197 (1994)
-
[文献書誌] M.Kirtani: "Microstructure evolution by neutron irradiation during clyclic temperature variation" Journal of Nuclear Materials. 212-215. 241-245 (1994)
-
[文献書誌] M.Horiki: "Microstructural evolution in low dose neutron irradiated Fe-15Ni-15Cr alloy" Journal of Nuclear Materials. 212-215. 246-251 (1994)
-
[文献書誌] K.Hamada: "Role of solute atoms on microstructural evolution in neutron irradiated nickel" Journal of Nuclear Materials. 212-215. 270-274 (1994)
-
[文献書誌] T.Yoshiie: "Effect of cascade localization enduced bias effect and fluctuation of point defect reactions on defect structure evolution near planar sinks" Journal of Nuclear Materials. 212-215. 315-319 (1994)
-
[文献書誌] M.Narui: "Development of experimental rigs for temperature-controlled reactor irradiation for fundamental study of radiation effects on fusion materials" Journal of Nuclear Materials. 212-215. 1645-1648 (1994)
-
[文献書誌] M.Narui: "Development of' controlled temperataure-cycle irradiation technique in JMTR" Journal of Nuclear Materials. 212-215. 1665-1670 (1994)
-
[文献書誌] Y.Satoh: "Diffraction contrast image of small stacking fault tetrahedra in fcc metals" Philosophical Magazine. A70. 869-891 (1994)
-
[文献書誌] M.Kiritani: "Microstructure Evolution during Radiation Damage" Journal of Nuclear Materials. 216. 220-264 (1994)
-
[文献書誌] K.Arakawa: "Time- and space-wise stohastic fluctuation of point defect reaction in high evergy particle irradiation" Transactions of the Materials Research Society of Japan. 16A. 365-370 (1994)
-
[文献書誌] S.Arai: "Improvement and application of intermittent electron irradiation technique with a high voltage electron microscope" Journal of Electron Microscopy. 44. 1-7 (1995)