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2000 年度 研究成果報告書概要

ナノ構造の表面・界面の制御と単電子トンネル障壁の最適化

研究課題

研究課題/領域番号 08247101
研究種目

重点領域研究

配分区分補助金
研究機関北海道大学

研究代表者

長谷川 英機  北海道大学, 大学院・工学研究科, 教授 (60001781)

研究分担者 澤木 宣彦  名古屋大学, 工学研究科, 教授 (70023330)
小間 篤  東京大学, 理学系研究科, 教授 (00010950)
岩見 基弘  岡山大学, 理学部, 教授 (80029123)
菅野 卓雄  東洋大学, 工学部, 教授 (50010707)
安田 幸夫  名古屋大学, 工学研究科, 教授 (60126951)
研究期間 (年度) 1996 – 1999
キーワード単電子デバイス / ナノ構造 / 表面・界面 / トンネル障壁 / 量子ドット / 量子デバイス / 原子スケール制御 / 高密度集積化
研究概要

本研究の目的は、ナノ構造の原子スケール制御に対し、十分な研究実績をもつ班員の実績を活かして、「ナノ構造の表面・界面の制御と単電子トンネル障壁の最適化」の研究を担当し、室温動作の単電子デバイスや、新しい機能もつ単電子デバイスを、単体ないし小規模集積レベルで実現する要素デバイス技術およびプロセス技術を確立することにある。
主要な成果として、まず、化合物半導体の2次元電子ガスに対する新しいインプレーンゲート、ラップゲート構造による単電子トランジスタについて、従来のスプリットゲート素子に比較して、動作温度の大幅な向上、動作機構の理解、1以上の電圧利得の達成、論理インバータ回路・BDDスイッチ回路などの小規模集積回路の試作と実証など、世界に先駆け大きな進歩がもたらされた。また、シリコン系については、プラズマプロセスで形成したシリコンドットにおける室温のクーロン階段の観測や、単電子トランジスタの動作確認、縦形トランジスタでの量子化コンダクタンスの観測、ホッピング伝導系でのクローンブロケッド現象の発見、非対称トンネル障壁構造を用いてデバイス特性を最適化する研究が推進された。さらに、シリコン系および化合物半導体系量子ドット構造を、表面・界面の原子配列と電子物性を評価・制御しつつ形成する手法について、大きな進展が認められた。また、「トンネル障壁」におけるトンネル時間やドット内の波束の運動の検討など、単電子過程を解明する基礎研究も進展した。

  • 研究成果

    (198件)

すべて その他

すべて 文献書誌 (198件)

  • [文献書誌] K.Jinushi: "Novel GaAs-Based Single-Electron Transistors with Schottky In-Plane Gates Operating up to 20K"Jpn.J.Appl.Phys.. 35. 1132-1139 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] S.Kasai: "Fabrication and Characterization of Navel Lateral Surface Superlattice Structure Utilizing Schottky Barrier Height Control by Doped Silicon Interface Control Lavers"Jpn.J.Appl.Phys.. 35. 1340-1347 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Photoluminescence and Cathodoluminescence Investigation of Optical Properties of InP-Based InGaAs Ridge Quantum Wires Formed by Selective Molecular Beam Epitaxy"Jpn.J.Appl.Phys.. 35. 1333-1339 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Surface Passivation of InGaAs Ridge Quantum Wires Using Silicon Interface Control Laver"J.Vac.Sci.Technol.B. 14. 2888-2894 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Hashizume: "Quantum Transport in A Schottky In-Plane-Gate Controlled GaAs/ AlGaAs Quantum Well Wires"Phisica B. 227. 42-45 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Tomozawa: "Design and Fabrication of GaAs/AlGaAs Single Electron Transistors Based on In-Plane Schottky Gate Control of 2DEG"Phisica B. 227. 112-115 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Fabrication of InP-Based InGaAs Ridge Quantum Wires Utilizing Selective Molecular Beam Epitaxial Growth on (311)A Facets"J.Electron.Mater. 25. 619 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] S.Kasai: "Electron Beam Induced Current Characterization of Novel GaAs Quantum Nanostructures Based on Potential Modulation of 2DEG by Schottky In-Plane Gates"Jpn.J.Appl.Phys. vol.34, part1. No.12B 6652-6658 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Okada: "Realization of GaAs-Based Small Quantum Structures by Schottky In-Plane-Gate Control of 2DEG"Proceedings of the 23rd International Conference on the Physics of Semiconductors. 1237-1240 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.0kada: "Realization of GaAs-Based Small Quantum Structures by Schottky In-Plane-Gate Control of 2DEG"Proceedings of 23rd International Conference on the Physics of Semiconductors. 1237-1240 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] 長谷川英機: "化合物半導体量子細線および量子ドットの製作"光学. 25巻、8号. 448-455 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] 長谷川英機: "化合物半導体量子構造表面の Si 超薄膜界面制御層によるパッシべーション"表面科学. 17巻、9号. 567-574 (1996)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] M.Araki: "Fabrication of InGaAs Quantum Wires and Dots by Selective Molecular Beam Epitaxial Growth on Various Mesa-Patterned (001) InP Substrates"Jpn.J.Appl.Phys.. 36. 1763-1769 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Excitation Power Dependent Photoluminescence Behavior in Etched Quantum Wires Having Silicon Interlayer-Based Edge Passivation and Its Interpretation"Jpn.J.Appl.Phys.. 36. 1937-1943 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] S.Kasai: "Fabrication and Characterization of GaAs Single Electron Devices Having Single and Multiple Dots Based on Schottky In-Plane-Gate and Wrap-Gate Control of Two Dimensional Electron Gas"Jpn.J.Appl.Phys.. 36. 1678-1685 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Okada: "0bservation of Coulomb Blockade Oscillations up to 50K in Gated InGaAs Ridge Quantum Wires Grown by Molecular Beam Epitaxy in InP substrates"Jpn.J.Appl.Phys.. vol.36, part1. No.3B 1672-1677 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Kudoh: "Controlled Formation of Metal-Semiconductor Interface to 2DEG Layer by In-Situ Electrochemical Process and Its Application to In-Plane Gated Electron Waveguide Devices"Appl.Sur.Sci. vol.117/118. 342-346 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] M.Kihara: "Effect of Mis-Orientation of Mesa-Stripes on the Growth of InGaAs Quantum Wires by Selective Molecular Beam Epitaxy"Appl.Sur.Sci.. Vol.117/118. 385-389 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Excitation Power Dependent Photoluminescence Characterization of Insulator-Semiconductor Interfaces on Near Surface Quantum Structures Passivated by Silicon Interface Control Layer Technology"Appl.Surf.Sci.. 117/118. 710-713 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] K.Ikeya: "Successful Surface Passivation of Air-Exposed AlGaAs by a Silicon Interface Control LAyer-Based Technique"Jpn.J.Appl.Phys.. vol.36, part1. No.3B, 1756-1762 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Formation of Two-Dimensional Arrays of InP-Based InGaAs Quantum Dots on Patterned Substrates by Selective Molecular Beam Epitaxy"Jpn.J.Appl.Phys.. 36. 4092-4096 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Okada: "Basic Control Characteristics of Novel Schottky In-Plane and Wrap Gate Structures Studied by Simulation and Transport Measurements in GaAs and InGaAs Quantum Wires"Jpn.J.Appl.Phys.. vol.36, part1. No.6B 4156-4160 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] Y.Ishikawa: "Kink defects and fermi level pinning on (2x4) reconstructed molecular beam epitaxially grown surfaces of GaAs and InP studied by ultrahigh-vacuum scanning tunneling microscopy and X ray photoelectron spectroscopy"J.Vac.Sci.Technol.B. vol.15. 1163-1172 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Evolution Mechanism of Nearly-Pinning Platinum/N-Type Indium Phosphide Interface with a High Schottky Barrier Height by In-Situ Electrochemical Process"J.Vac.Sci.Technol.B. vol.15. 1227-1235 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Hashizume: "Dominant Electron Trap with Metastable state in Molecular Beam Epitaxial GaAs Grown at Low Temperatures"Jpn.J.Appl.Phys.. vol.36. 1775-1780 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] K.Ikeya: "Successful Surface Passivation of Air-Exposed AlGaAs by a Silicon Interface Control Layer-Based Technique"Jpn.J.Appl.Phys.. vol.36. 1756-1762 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] Y.Dohmae: "Capacitance-Voltage Behavior of Insulated Gate InGaAs HEMT Capacitor Having Silicon Interface Control Layer"Jpn.J.Appl.Phys.. vol.36. 1834-1840 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] Y.Ishikawa: "Missing-dimer structures and their kink defects on molecular beam epitaxially grown (2x4) reconstructed (001) InP and GaAs surfaces studied by ultrahigh-vacuum scanning tunneling microscopy"Jpn.J.Appl.Phys.. vol.36. 1749-1755 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Yoshida: "Characterization of Interface Electronic Properties or Low Temperature Ultrathin Oxides and Oxynitrides Formed on Si (111) Surfaces by Contactless Capacitance-Voltage and Photoluminescence Methods"Jpn.J.Appl.Phys.. vol.36. 1453-1459 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Sato: "30), S.Uno, T.Hashizume and H.Hasegawa : "Large Schottky Barrier Heights on Indium Phosphide-Based Materials Realized by In-Situ Electrochemical Process"Jpn.J.Appl.Phys.. vol.36. 1811-1817 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Interface-controlled Schottky barriers on InP and related materials"Solid-State Electron. 41. 1441-1450 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] K.Iizuka: "Small-Signal Response of Interface States at Passivated InGaAs Surfaces from Low Frequencies up to Microwave Frequencies"Solid-State Electron. 41. 1463-1468 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] S.Suzuki: "Fabrication and electrical characterization of InP-based insulated gate power HEMTs using ultrathin Si interface control layer"Solid-State Electron.. 41. 1641-1646 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Electrochemical Formation and Characterization of Schottky In-Plane and Wrap Gate Structures for Realization of GaAs- and InP-Based Quantum Wires and Dots"Appl.Surf.Sci.. 123/124. 335-338 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Hashizume: "Surface Passivation of GaAs with Ultrathin Si3N4/Si Interface Control Layer Formed by MBE and In Situ ECR Plasma Nitridation"Appl.Surf.Sci. 123/124. 599-602 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Takahashi: "Novel InP Metal-Insulator-Semiconductor Structure Having an Ultrathin Silicon Interface Comctrol Layer"Appl.Surf.Sci. 123/124. 615-618 (1997)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] B.Adamowicz: "Computer analysis of Surface Recombination process at Si and compound semiconductor surfaces and behayior of surface recombination velocity"Japanese Journal of Applied Physics. 37. 1631-1637 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Takahashi: "Novel InP Metal-Insulator-Semiconductor Structure Having and Ultrathin Silicon Interface Control Layer"Applied Surface Science. 123/124. 615-618 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] Y.Satoh: "Computer Simulation and Experimental Characterization of Single Electron Transistors Based on Schottky Wrap Gate Control of 2DEG"Japanese Journal of Applied Physics. 37. 1584-1590 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Controlled Formation of Narrow and Uniform InP-Based In0.53Ga0.47As Ridge Quantum Wire Arrays by Selective Molecular Beam Epitaxy"Japanese Journal of Applied Physics. 37. 1584-1590 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Hashizume: "Surface Passivation of GaAs with Ultrathin Si3N4/SiInterface Control Layer Formed by MBE and in situ ECR Plasma Nitridation"Applied Surface Science. 123/124. 599-602 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] N.Tsurumi: "In-situ Tunneling Microscope Study of Formation Process of Ultrathin Si Layer by Molecular Beam Epitaxy on GaAs (001 )-(2x4) Surface"Japanese Journal of Applied Physics. 37. 1501-1507 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Hashizume: "In-Situ Contactless Characterization of Microscopic and Macroscopic Properties of Si-doped MBE-Grown (2x4) GaAs Surfaces"Japanese Journal of Applied Physics. 37. 1626-1630 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Electrochemical Formation and Characterization of Schottky In-Plane and Wrap Gate Structures for Realization of GaAs- and InP-Based Quantum Wires and Dots"Applied Surface Science. 123/124. 335-338 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] Y.Ishikawa: "Scanning tunneling microscopy and x-ray photoelectron spectroscopy studies of atomic level structure and Fermi Level pinning on GaAs (110) surfaces grown by molecular beam epitaxy"Journal of Vacuum Science and Technology B. 16. 2387-2394 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] S.Chakraborty: "Formation of ultrathin oxynitride layers on Si (100) by low-temperature electron cyclotron resonance N20 plasma oxynitridation process"Journal of Vacuum Science and Technology B. 16. 2159-2164 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] B.Adamowicz: "Photoluminescence characterization of air exposed AlGaAs surface and passivated ex situ by ultrathin silicon interface control layer"Physica E. 2. 261-266 (1998)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Sai: "Gas Source Molecular Beam Epitaxial Growth of Inl-xGaxP on GaAs Using Tertiarybutylphosphine"Japanese Journal of Applied Physics. 38. 151-158 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] Y.Satoh: "Voltage Gain in GaAs-Based Lateral Single Electron Transistors Habing Three Schottky Wrap Gates"Japanese Journal of Applied Physics. 38. 415-417 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Control of Dot Size and Tunneling Barrier Profile in In0.53Ga0.47As Coupled Quantum Wire-Dot Structures Grown by Selective Molecular Beam Epitaxy on Patterned InP Substrates"Japanese Journal of Applied Physics. 38. 421-424 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Sai: "Study of Reflection High-Energy Electron Diffraction Oscillation for Optimization fo Tertiarybutylposphine-Based Molectular Beam Epitaxial Growth of In0.48GaO.52P on GaAs"Japanese Journal of Applied Physics. 38. 824-831 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Extra-Side-Facet Control in Selectrive Molecular Beam Epitaxial Growth of InGaAs Ridge Quantum Wires for Improvement of Wire Uniformity"Japanese Journal of Applied Physics. 38. 1067-1070 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Muranaka: "Size-Controlled Formation of Decananometer InGaAs Quantum Wires by Selective Molecular Beam Epitaxy on InP Patterned Substrates"Japanese Journal of Applied Physics. 38. 1071-1074 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Fermi Level Pinning and Schottky Barrier Height Control at Metal Semiconductor Interfaces of GaN and Related Materials"Japanese Journal of Applied Physics. 38. 1098-1102 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Sato: "Strong Correlation Between Interface Microstructure and Barrier Height in n-InP Schottky Contacts Formed by In Situ Electrochemical Process"Japanese Journal of Applied Physics. 38. 1103-1106 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] M.B.Takeyama: "Interfacial Reaction and Electrical Properties in the Sputter-Deposited At/Ti Ohmic Contact to n-InP"Japanese Journal of Applied Physics. 38. 1115-1118 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Takahashi: "X-ray Photoelectron Spectroscopy and Ultrahigh Vacuum Contactless Capacitance-Voltage Characterization of Novel Oxide-Free InP Passivation Process Using a Silicon Surface Quantum Well"Japanese Journal of Applied Physics. 38. 1128-1132 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] C.Kaneshiro: "Electrochemical Etching of Indium Phosphide Surfaces Studied by Volammetry and Scanned Probe Microscopes"Japanese Journal of Applied Physics. 38. 1147-1152 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] B.Adamowicz: "Electronic Properties of AlxGal-xAs Surface Passivated by Ultrathin Silicon Interface Control Layer"Applied Surface Science. 141. 326-332 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Selective Growth of Quantum Wire-Dot Coupled Structures with Novel High Index Facets for InGaAs Single Electron Transistor Arrays"Microelectronics. 30. 397-401 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] M.Mutoh: "Effects of Initial Surface Reconstruction on Silicon Interface Control Layer Based Passivation of (001) GaAs Surfaces Studied in an Ultrahigh-Vacuum Multichamber System"Japanese Journal of Applied Physics. 38. 2538-2543 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Yoshida: "A Novel Non-Destructive Characterization Method of Electronic Properties of Pre- and Post-Processing Silicon Surfaces Based on Ultrahigh-Vacuum Contactless Capacitance-Voltage Measurements"Japanese Journal of Applied Physics. 38. 2349-2354 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Properties of Metal-Semiconductor Interfaces Formed on n-Type GaN"Japanese Journal of Applied Physics. 38. 634-2639 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Sato: "Formation of Size- and Position-Controlled Nanometer Size Pt Dots on GaAs and InP Substrates by Pulsed Electrochemical Deposition"Japanese Journal of Applied Physics. 38. 2448-2452 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] J.Nakamura: "Transport Properties of Schottky In-Plane-Gate GaAs Single and Coupled Quantum Wire Transistors"Inst.Phys.Conf.Ser.. 162. 409-414 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] N.Ono: "Study of Selective MBE Growth on Patterned (001) InP Substrates Toward Realization of $$\langle100\rangle$$-Oriented InGaAs Ridge Quantum Wires"Inst.Phys.Conf.Ser.. 162. 385-390 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] C.Kaneshiro: "Realization of Strongly Metal-Dependent Schottky Barrier Heights on n GaAs by In Situ Electrochemical Process"Inst.Phys.Conf.Ser. 162. 585-590 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Muranaka: "Realization of InP-Based InGaAs Single Electron Transistors on Wires and Dots Grown by Selective MBE"Microelectronic Engineering. 47. 201-203 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Okada: "GaAs-Based Single Electron Logic and Memory Devices Using Electro-Deposited Nanometer Schottky Gates"Microelectronic Engineering. 47. 285-287 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Sai: "Growth of Device Quality InGaP/GaAs Heterostructures by Gas Source Molecular Beam Epitaxy using Tertiarybutylphosphine"Solid State Electronics. 43. 1541-1546 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Takahashi: "In-situ Characterization Technique of Compound Semiconductor Heterostructure Growth and Device Processing Steps Based on UHV Contactless Capacitance-Voltage Measurement"Solid State Electronics. 43. 1561-1570 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] Y.Koyama: "Formation Processes and Properties of Schottky and Ohmic Contacts on n-type GaN form Field Effect Transistor Applications"Solid State Electronics. 43. 1483-1488 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] A.Hamamatsu: "Formation of <001>-Aligned Nano-Scale Pores on (001) n-InP Surfaces by Photoelectrochemical Anodization in HCl"J.Electroanalytical Chem.. 473. 223-229 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Molecular Beam Epitaxy and Device Applications or III-V Semiconductor Nanowires"MRS Bulletin. 24. 25-30 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] B.Adamowicz: "Computer Simulation of the Surface Photovoltage on Si and GaAs Surfaces with U-shaped Surface State Continuum"Vacuum. 54. 173-177 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Properties of nanometer-sized metal-semiconductor interfaces of GaAs and InP formed by an in situ electrochemical process"Journal of Vacuum Science and Technology B. 17. 1856-1866 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Okada: "Characterization of GaAs Schottky in-plane gate quantum wire transistors for switching of quantized conductance"Physica B. 272. 23-126 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] S.Kasai: "Conductance oscillation characteristics of GaAs Schottky wrap-gate single electron transistors"Physica B. 272. 88-91 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] 長谷川英機: "量子構造と MBE"Crystarl Letters. 51. 8-9 (1999)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Unpinning of Fermi level in nanometer-sized Schottky contacts on GaAs and InP"Applied Surface Science. 166. 92-96 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Takahashi: "In situ UHV contactless C-V and XPS characterization of surface passivation process for InP using a partially nitrided Si interface control layer"Applied Surface Science. 166. 526-531 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Formation of device-oriented InGaAs coupled quantum structures by selective MBE growth on patterned InP substrates"Physica E. 7. 864-869 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] C.Jiang: "Vertical barrier layer formation during selective MBE growth of InGaAs ridge quantum wires on InP patterned substates"Physica E. 7. 902-906 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Hasegawa: "Prospects and Key Issues for Compound Semiconductor Quantum Devices"Tehcnical Report of IEICE. ED2000-51. 43-48 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] M.Iyawa: "Chemical and Electrochemical Nanofabrication Processes for Schottky In-Plane Gate GaAs Single and Coupled Quantum Wire Transistors"Jpn.J.Appl.Phys.. 39. 4651-4652 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] H.Fujikura: "Electrochemical Formation of Uniform and Straight Nano-Pore Arrays on (001) InP Surfaces and Their Photoluminescence Characterizations"Jpn.J.Appl.Phys.. 39. 4616-4620 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Yoshida: "Ultrahigh-Vacuum Contactless Capacitance-Voltage Characterization of Hydrogen Terminated-Free Silicon Surfaces"Jpn.J.Appl.Phys.. 39. 4504-4508 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Sato: "Electrical Properties of Nanometer-Sized Schottky Contacts on n-GaAs and n-InP Formed by in Situ Electrochemical Process"Jpn.J.Appl.Phys.. 39. 4609-4615 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] M.Yamada: "Fabrication and Characterization of Novel Oxide-Free InP Metal-Insulator-Semiconductor FETs Having an Ultra Narrow Si Surface Ouantum Well"Jpn.J.Appl.Phys.. 39. 2439-2443 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] S.Ootomo: "Nitridation of GaP (1OO) Surfaces by rf Nitrogen Radicals and by Electron Cyclotron Resonance Nitrogen Plasma"Jpn.J.Appl.Phys.. 39. 2407-2413 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Muranaka: "Selective MBE Growth of InGaAs Quantum Wire-Dot Coupled Structures with Controlled Double-Barrier Potential Profiles"Inst.Phys.Conf.Ser.. 166. 187-190 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] S.Kasai: "GaAs Quantum Wire Transistors and Single Electron Transistors using Schottky Wrap Gates for Quantum Integrated Circuits"Inst.Phys.Conf.Ser.. 166. 219-222 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Muranaka: "Origing of Non-Uniformity in MBE Grown Nanometer-Sized InGaAs Ridge Quantum Wires and Its Removal by Atomic Hydrogen-Assisted Cleanin"Thin Solid Film. 380. 189-191 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] R.Nakasaki: "Insulator-GaN interface structures formed by plasma-assisted chemical vapor deposition"Physica E. 7. 953-957 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] B.Adamowicz: "Analysis of photoluminescence efficiency and surface recombination velocity of MBE-grown AlGaAs layers"Thin Solid Films. 367. 180-183 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] B.Adamowicz: "Computer analysis of photon-induced non-equilibrium phenomena at Si and AlGaAs surfaces"Vacuum. 57. 111-120 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] B.Adamowicz: "Computer Analysis of The Fermi Level Behavior at SiO2/n-GaAs Interfaces"Electron Technology. 33. 249-252 (2000)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] S.Kasai: "GaAs-Based Single Electron Transistors and Logic Inverters Utilizing Schottky Wrap-Gate Controlled Quantum Wires and Dots"Japanese Journal of Applied Physics (in press). 40. (2001)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] T.Sato: "Electrical Properties of Nanometer-Sized Schottky Contacts for Gate Control of III-V Single Electron Devices and Quantum Devices"Japanese Journal of Applied Physics. 40 (in press). (2001)

    • 説明
      「研究成果報告書概要(和文)」より
  • [文献書誌] K.Jinushi, H.Okada, T.Hashizume and H.Hasegawa: "Novel GaAs-Based Single-Electron Transistors with Schottky In-Plane Gates Operating up to 20K"Jpn.J.Appl.Phys.. Vol.35. 1132-1139 (1996)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] S.Kasai and H.Hasegawa: "Fabrication and Characterization of Noves Lateral Surface Superlattice Structure Utilizing Schottky Barrier Height Control by Doped Silicon Interface Control Layers"Jpn.J.Appl.Phys.. 35. 1340-1347 (1996)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura and H.Hasegawa: "Photoluminescence and Cathodoluminescence Investigation of Optical Properties of InP-Based InGaAs Ridge Quantum Wires Formed by Selective Molecular Beam Epitaxy"Jpn.J.Appl.Phys. 35. 1333-1339 (1996)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura, S.Kodama, T.Hashizume and H.Hasegawa: "Surface Passivation of InGaAs Ridge Quantum Wires Using Silicon Interface Control Layer"J.Vac.Sci.Technol. B. vol.14. 2888-2894 (1996)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Hashizume, H.Okada and H.Hasegawa: "Quantum Transport in A Schottky In-Plane-Gate Controlled GaAs/AlGaAs Quantum Well Wires"Phisica B. vol.227. 42-45 (1996)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Tomozawa, K.Jinushi, H.Okada, T.Hashizume and H.Hasegawa: "Design and Fabrication of GaAs/AlGaAs Single Electron Transistors Based on In-Plane Schottky Gate Control of 2DEG"Phisica B. vol.227. 112-115 (1996)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura and H.Hasegawa: "Fabrication of InP-Based InGaAs Ridge Quantum Wires Unltzing Selective Molecular Beam Epitaxial Growth on (311) A Facets"J.Electron. Mater.. 25. 619 (1996)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] S.Kasai, T.Hashizume and H.Hasegawa: "Electron Beam Induced Current Characterization of Novel GaAs Quantum Nanostructures Based on Potential Modulation of 2DEG by Schottky In-Plane Gates"Jpn.J.Appl.Phys.. vol.34, Part 1, No.12B. 6652-6658 (1996)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Okada, T.Hashizume, K.Jinushi, T.Kudon and H.Hasegawa: "Realization of GaAs-Based Small Quantum Structures by Schottky In-Plane-Gate Control of 2DEG"Proceedings of the 23rd International Conference on the Physics of Semiconductors. 1237-1240 (1996)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Okada, T.Hashizume, K.Jinushi, T.Kudoh and H.Hasegawa: "Realization of GaAs-Based Small Quantum Structures by Schottky In-Plane-Gate Control of 2DEG"Proceedings of 23rd International Conference on the Physics of Semiconductors. 1237-1240 (1996)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] M.Araki, Y.Hanada, H.Fujikura and H.Hasegawa: "Fabrication of InGaAs Quantum Wires and Dots by Selective Molecular Beam Epitaxial Growth on Various Mesa-Patterned (001) InP Substrates"Jpn.J.Appl.Phys. 36. 1763-1769 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura, M.Kubo and H.Hasegawa: "Excitation Power Dependent Photoluminescence Behavior in Etched Quantum Wires Having Silicon Interlayer-Based Edge Passivation and Its Interpretation"Jpn.J.Appl.Phys.. 36. 1937-1943 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] S.Kasai, K.Jinushi, H.Tomozawa and H.Hasegawa: "Fabrication and Characterization of GaAs Single Electron Devices Having Single and Multiple Dots Based on Schottky In-Plane-Gate and Wrap-Gate Control of Two dimensional Electron Gas"Jpn.J.Appl.Phys. 36. 1678-1685 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Okada, H.Fujikura, T.Hashizume and H.Hasegawa: "Observation of Coulomb Blockade Oscillations up to 50K in Gated InGaAs Ridge Quantum Wires Grown by Molecular Beam Epitaxy in InP substrates"Jpn.J.Appl.Phys.. vol.36, part 1, No.3B. 1672-1677 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Kudoh, H.Okada, T.Hashizume and H.Hasegawa: "Controlled Formation of Metal-Semiconductor Interface to 2DEG Layer by In-Situ Electrochemical Process and Its Application to In-Plane Gated Electron Waveguide Devices"Appl.Sur.Sci.. vol.117/118. 342-346 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] M.Kihara, H.Fujikura and H.Hasegawa: "Effect of Mis-Orientation of Mesa-Stripes on the growth of InGaAs Quantum Wires by Selective Molecular Beam Epitaxy"Appl.Sur.Sci.. vol.117/118. 385-389 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa, S.Kodama, K.Ikeya and H.Fujikura: "Excitation Power Dependent Photoluminescence Characterization of Insulator-Semiconductor Interfaces on Near Surface Quantum Structures Passivated by Silicon Interface Control Layer Technology"Appl.Surf.Sci.. 117/118. 710-713 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] K.Ikeya, T.Hashizume and H.Hasegawa: "Successful Surface Passivation of Air-Exposed AlGaAs by a Silicon Interface Control LAyer-Based Technique"Jpn.J.Appl.Phys.. vol.36, part 1, No.3B. 1756-1762 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura, M.Araki, Y.Hanada, M.Kihara and H.Hasegawa: "Formation of Two-Dimensional Arrays of InP-Based InGaAs Quantum Dots on Patterned Substrates by Selective Molecular Beam Epitaxy"Jpn.J.Appl.Phys.. 36. 4092-4096 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Okada, S.Kasai, H.Fujikura, T.Hashizume and H.Hasegawa: "Basic Control Characteristics of Novel Schottky In-Plane and Wrap Gate Structures Studied by Simulation and Transport Measurements in GaAs and InGaAs Quantum Wires"Jpn.J.Appl.Phys.. vol.36, part 1, No.6B. 4156-4160 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] Y.Ishikawa, T.Fukui and H.Hasegawa: "Kink defacts and fermi level pinning on (2x4) reconstructed molecular beam epitaxially grown surfaces of GaAs and InP studied by ultrahigh-vacuum scanning tunneling microscopy and X ray photoelectron spectroscopy"J.Vac.Sci.Technol. B. vol.15. 1163-1172 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa, T.Sato and T.Hashizume: "Evolution Mechanism of Nearly-Pinning Platinum/N-Type Indium Phosphide Interface with a High Schottky Barrier Height by In-Situ Electrochemical Process"J.Vac.Sci.Technol. B. vol.15. 1227-1235 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Hashizume, S.Shiobara and H.Hasegawa: "Dominant Electron Trap with Metastable state in Molecular Beam Epitaxial GaAs Grown at Low Temperatures"Jpn.J.Appl.Phys.. vol.36. 1775-1780 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] K.Ikeya, T.Hashizume and H.Hasegawa: "Successful Surface Passivation of Air-Exposed AlGaAs by a Silicon Interface Control Layer-Based Technique"Jpn.J.Appl.Phys.. vol.36. 1756-1762 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] Y.Dohmae, S.Suzuki, T.Hashizume and H.Hasegawa: "Capacitance-Voltage Behavior of Insulated Gate InGaAs HEMT Capacitor Having Silicon Interface Control Layer"Jpn.J.Appl.Phys.. vol.36. 1834-1840 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] Y.Ishikawa, T.Fukui and H.Hasegawa: "Missing-dimer structures and their kink defects on molecular beam epitaxially grown (2x4) reconstructed (001) InP and GaAs surfaces studied by ultrahigh-vacuum scanning tunneling microscopy"Jpn.J.Appl.Phys.. vol.36. 1749-1755 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Yoshida, T.Hashizume and H.Hasegawa: "Characterization of Interface Electronic Properties of Low Temperature Ultrathin Oxides and Oxynitrides Formed on Si (111) Surfaces by Contactless Capacitance-Voltage and Photoluminescence Methods"Jpn.J.Appl.Phys.. vol.36. 1453-1459 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Sato, S.Uno, T.Hashizume and H.Hasegawa: "Large Schottky Barrier Heights on Indium Phosphide-Based Materials Realized by In-Situ Electrochemical Process"Jpn.J.Appl.Phys.. vol.36. 1811-1817 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa: "Interface-controlled Schottky barriers on InP and related materials"Solid-State Electron.. 41. 1441-1450 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] K.Iizuka, T.Hashizume and H.Hasegawa: "Small-Signal Response of Interface States at Passivated InGaAs Surfaces fromn Low Frequencies up to Microwave Frequencies"Solid-State Electron.. 41. 1463-1468 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] S.Suzuki, Y.Dohmae and H.Hashegawa: "Fabrication and electrical characterization of InP-based insulated gate power HEMTs using ultrathin Si interface control layer"Solid-State Electron.. 41. 1641-1646 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa, T.Sato, H.Okada, K.Jinushi, S.Kasai and Y.Satoh: "Electrochemical Formation and Characterization of Schottky In-Plane and Wrap Gate Structures for Realization of GaAs- and InP-Based Quantum Wires and Dots"Appl.Surf.Sci.. 123/124. 335-338 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Hashizume, K.Ikeya, M.Mutoh and H.Hasegawa: "Surface Passivation of GaAs with Ultrathin Si3N4/Si Interface Control Layer Formed by MBE and In Situ ECR Plasma Nitridation"Appl.Surf.Sci.. 123/124. 599-602 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Takahashi, T.Hashizume and H.Hasegawa: "Novel InP Metal-Insulator-Semiconductor Structure Having an Ultrathin Silicon Interface Control Layer"Appl.Surf.Sci.. 123/124. 615-618 (1997)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] B.Adamowicz and H.Hasegawa: "Computer analysis of Surface Recombination process at Si and Compound semiconductor surfaces and behavior of surface recombination velocity"Japanese Journal of Applied Physics.. 37. 1631-1637 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Takahashi, T.Hashizume and H.Hasegawa: "Novel InP Metal-Insulator-Semiconductor Structure Having and Ultrathin silicon Interface Control Layer"Applied Surface Science.. 123/124. 615-618 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] Y.Satoh, S.Kasai, K.Jinushi and H.Hasegawa: "Computer Simulation and Experimental Characterization of Single Electron Transistors Based on Schottky Wrap Gate Control of 2DEG"Jpanese Journal of Applied Physics.. 37. 1584-1590 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura, Y.Hanada, M.Kihara and H.Hasegawa: "Controlled Formation of Narrow and Uniform InP-Based In0.53Ga0.47As Ridge Quantum Wire Arrays by Selective Molecular Beam Epitaxy"Japanese Journal of Applied Physics.. 37. 1584-1590 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Hashizume K.Ikeya, M.Muto and H.Hasegawa: "Surface Passivation of GaAs with Ultrathin Si3N4/SiInterface Control Layer Formed by MBE and in situ ECR Plasma Nitridation"Applied Surface Science.. 123/124. 599-602 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] N.Tsurumi, Y.Ishikawa, T.Fukui and H.Hasegawa: "In-situ Tunneling Microscope Study of Formation Process of Ultrathin Si Layer Molecular Beam Epitaxy on GaAs (001)-(2x4) Surface"Japanese Journal of Applied Physics.. 37. 1501-1507 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Hashizume, Y.Ishikawa, T.Yoshida and H.Hasegawa: "In-Situ Contactless Characterization of Microscopic and Macroscopic Properties of Si-Doped MBE-Grown (2x4) GaAs Surfaces"Japanese Journal of Applied Physics. 37. 1626-1630 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa, T.Sato, H.Okada, K.Jinushi, S.Kasai and Y.Satoh: "Electrochemical Formation and Characterization of Schottky In-Plane and Wrap Gate Structures for Realization of GaAs-and InP-Based Quantum Wires and Dots"Applied Surface Science.. 123/124. 335-338 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] Y.Ishikawa, N.Tsurumi, T.Fukui and H.Hasegawa: "Scanning tunneling microscopy and x-ray photoelectron spectroscopy studies of atomic level structure and Fermi Level pinning on GaAs (110) surfaces grown by molecular beam epitaxy"Journal of Vacuum Science and Technology B. 16. 2387-2394 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] S.Chakraborty, T.Yoshida, T.Hashizume and H.Hasegawa: "Formation of ultrathin oxynitride layers on Si (100) by low-temperature electron cyclotron resonance N2O plasma oxynitridation process"Journal of Vacuum Science and Technology B. 16. 2159-2164 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] B.Adamowicz, K.Ikeya, M.Mutoh, T.Saitoh, H.Fujikura and H.Hasegawa: "Photoluminescence characterization of air exposed AlGaAs surface and passivated ex situ by ultrathin silicon interface control layer"Physica E. 2. 261-266 (1998)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Sai, H.Fujikura and H.Hasegawa: "Gas Source Molecular Beam Epitaxial Growth of Inl-xGaxP on GaAs Using Tertiarybutylphosphine"Japnaese Journal of Applied Physics. 38. 151-158 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] Y.Satoh, H.Okada, K.Jinushi, H.Fujikura and H.Hasegawa: "Voltage Gain in GaAs-Based Lateral Single Electron Transistors Habing Three Schottky Wrap Gates"Japanese Journal of Applied Physics. 38. 415-417 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura, Y.Hanada, T.Muranaka and H.Hasegawa: "Control of Dot Size and Tunneling Barrier Profile in In0.53Ga0.47As Coupled Quantum Wire-Dot Structures Grown by Selective. Molecular Beam Epitaxy on Patterned InP Substrates"Japanese Journal of Applied Physics. 38. 421-424 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Sai, H.Fujikura and H.Hasegawa: "Study of Reflection High-Energy Electron Diffraction Oscillation for Optimization fo Tertiarybutylposphine-Based Molecutular Beam Epitaxial growth of In0.48Ga0.52P on GaAs"Japanese Journal of Applied Physics. 38. 824-831 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura, M.Kihara, and H.Hasegawa: "Extra-Side-Facet Control in Selectrive Molecular Beam Epitaxial Growth of InGaAs Ridge Quantum Wires for Improvement of Wire Uniformity"Japanese Journal of Applied Physics. 38. 1067-1070 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Muranaka, H.Okada, H.Fujikura and H.Hasegawa: "Size-Controlled Formation of Decananometer InGaAs Quantum Wires by Selective Molecular Beam Epitaxy on InP Patterned Substrates"Japanese Journal of Applied Physics. 38. 1071-1074 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa Koyama, Y and T.Hashizume: "Fermi Level Pinning and Schottky Barrier Height Control at Metal Semiconductor Interfaces of GaN and Related Materials"Japanese Journal of Applied Physics. 38. 1098-1102 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Sato, C.Kaneshiro and H.Hasegawa: "Strong Correlation Between Interface Microstructure and Barrier Height in n-InP Schottky Contacts Formed by In Situ Electrochemical Process"Japanese Journal of Applied Physics. 38. 1103-1106 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] M.B.Takeyama, A.Noya, Hashizume. T and H.Hasegawa: "Interfacial Reaction and Electrical Properties in the Sputter-Deposited Al/Ti Ohmic Contact to n-InP"Japanese Journal of Applied Physics. 38. 1115-1118 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Takahashi, T.Sato and H.Hasegawa: "X-ray Photoelectron Spectroscopy and Ultrahigh Vacuum Contactless Capacitance-Voltage Characterization of Novel Oxide-Free InP Passivation Process Using a Silicon Surface Quantum Well"Japanese Journal of Applied Physics. 38. 1128-1132 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] C.Kaneshiro, T.Sato and H.Hasegawa: "Electrochemical Etching of Indium Phosphide Surfaces Studied by Volammetry and Scanned Probe Microscopes"Japanese Journal of Applied Physics. 38. 1147-1152 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] B.Adamowicz, M.Miczek, K.Ikeya, M.Mutoh, T.Saitoh, H.Fujikura and H.Hasegawa: "Electronic Properties of AlxGal-xAs surface Passivated by Ultrathin Silicon Interface Control Layer"Applied Surface Science.. 141. 326-332 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura, T.Muranaka and H.Hasegawa: "Selective Growth of Quantum Wire-Dot Coupled Structures with Novel High Index Facets for InGaAs Single Electron Transistor Arrays"Microelectronics. 30. 397-401 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] M.Mutoh, M.Tsurumi and H.Hasegawa: "Effects of Initial Surface Reconstruction on Silicon Interface Control Layer Based Passivation of (001) GaAs Surfaces Studied in an Ultrahigh-Vacuum Multichamber System"Japanese Journal of Applied Physics. 38. 2538-2543 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Yoshida, H.Hasegawa and T.Sakai: "A Novel Non-Destructive Characterization Method of Electronic Properties of Pre-and Post-Processing Silicon Surfaces Based on Ultrahigh-Vacuum Contactless Capacitance-Voltage Measurements"Japanese Journal of Applied Physics. 38. 2349-2354 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa, Y.Koyama and T.Hashizume: "Properties of Metal-Semiconductor Interfaces Formed on n-Type GaN"Japanese Journal of Applied Physics. 38. 634-2639 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Sato, C.Kaneshiro, H.Okada and T.Hasegawa: "Formation of Size-and Position-Controlled Nanometer Size Pt Dots on GaAs and InP Substrates by Pulsed Electrochemical Deposition"Japanese Journal of Applied Physics. 38. 2448-2452 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] J.Nakamura, T.Kudoh, H.Okada and H.Hasegawa: "Transport Properties of Schottky In-Plane-Gate GaAs Single and Coupled Quantum Wire Transistors"Inst.Phys.Conf.Ser.. 162. 409-414 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] N.Ono, H.Fujikura and H.Hasegawa: "Study of Selective MBE Growth on Patterned (001) InP Substrates Toward Realization of $\langle100\rangle$-Oriented InGaAs Ridge Quantum Wires"Inst.Phys.Conf.Ser.. 162. 385-390 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] C.Kaneshiro, T.Sato and H.Hasegawa: "Realization of Strongly Metal-Dependent Schottky Barrier Heights on n GaAs by In Situ Electrochemical Process"Inst.Phys.Conf.Ser. 162. 585-590 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Muranaka, H.Okada, H.Fujikura and H.Hasegawa: "Realization of InP-Based InGaAs Single Electron Transistors on Wires and Dots Grown by Selective MBE"Microelectronic Engineering. 47. 201-203 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Okada, T.Sato, K.Jinushi and H.Hasegawa: "GaAs-Based Single Electron Logic and Memory Devices Using Electro-Deposited Nanometer Schottky Gates"Microelectronic Engineering. 47. 285-287 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Sai, H.Fujikura, A.Hirama and H.Hasegawa: "Growth of Device Quality InGaP/GaAs Heterostructures by Gas Source Molecular Beam Epitaxy using Tertiarybutylphosphine"Solid State Electronics. 43. 1541-1546 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Takahashi, T.Yoshida, M.Mutoh, T.Sakai and H.Hasegawa: "In-situ Characterization Technique of Compound Semiconductor Heterostructure Growth and Device Processing Steps Based on UHV Contactless Capacitance-Voltage Measurement"Solid State Electronics. 43. 1561-1570 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] Y.Koyama, T.Hashizume and H.Hasegawa: "Formation Processes and Properties of Schottky and Ohmic Contacts on n-type GaN form Field Effect Transistor Applications"Solid State Electronics. 43. 1483-1488 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] A.Hamamatsu, C.Kaneshiro, H.Fujikura and H.Hasegawa: "Formation of <001>-Aligned Nano-Scale Pores on (001) n-InP Surfaces by Photoelectrochemical Anodization in HCI"J.Electroanalytical Chem.. 473. 223-229 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa H.Fujikura and H.Okada: "Molecular Beam Epitaxy and Device Applications of III-V Senmiconductor Nanowires"MRS Bulletin. 24. 25-30 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] B.Adamowicz and H.Hasegawa: "Computer Simulation of the Surface Photovoltage on Si and GaAs Surfaces with U-shaped Surface State Continuum"Vacuum. 54. 173-177 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa, T.Sato and C.Kaneshiro: "Properties of nanometer-sized metal-semiconductor interfaces of GaAs and InP formed by an in situ electrochemical process"Journal of Vacuum Science and Technology B. 17. 1856-1866 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Okada and H.Hasegawa: "Characterization of GaAs Schottky in-plane gate quantum wire transistors for switching of quantized conductance"Physica B. 272. 23-126 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] S.Kasai, Y.Satoh and H.Hasegawa: "Conductance oscillation characteristics of GaAs Schottky wrap-gate single electron transistors"Physica B. 272. 88-91 (1999)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa, T.Sato and S.Kasai: "Unpinning of Fermi level in nanometer-sized Schottky contacts on GaAs and InP"Applied Surface Science. 166. 92-96 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Takahashi and H.hasegawa: "In situ UHV contactless C-V and XPS characterization of surface passivation process for InP using a partially nitrided Si interface control layer"Applied Surface Science.. 166. 526-531 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura, T.Muranaka and H.Hasegawa: "Formation of device-oriented InGaAs coupled quantum structures by selective MBE growth on patterned InP substrates"Physica E. 7. 864-869 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] C.Jiang, H.Fujikura and H.Hasegawa: "Vertical barrier layer formation during selective MBE growth of InGaAs ridge quantum wires on InP patterned substates"Physica E. 7. 902-906 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa and S.Kasai: "Prospects and Key Issues for Compound Semiconductor Quantum Devices"Tehenical Report of IEICE. ED2000-51. 43-48 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa: "Advanced mesoscopic device concepts and technology"Microelectronic Engineering. 53. 29-36 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] N.Negoro, H.Fujikura and H.Hasegawa: "Scanning tunneling microscopy and spectroscopy study of ultrathin Si interface control layers grown on (001) GaAs for surface passivation"Applied Surface Science. 159/160. 292-300 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] S.Anantathanasarn, S.Ootomo, T.Hashizume and H.Hasegawa: "Surface passivation of GaAs by ultra-thin cubic GaN layer"Applied Surface Science. 159/160. 456-461 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Shiozawa, T.Yoshida, T.Hashizume and H.Hasegawa: "Correlation between interface state properties and electron transport at ultrathin insulator/Si interfaces"Applied Surface Science. 159/160. 98-103 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa: "MBE growth and applications of silicon interface control layers"Thin Solid Films. 367. 58-67 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Hasegawa, N.Negoro, S.Kasai, Y.Ishikawa and H.Fujikura: "Effects of gap states on scanning tunneling spectra observed on (110)-and (001)-oriented molecular beam epitaxy"Journal of Vacuum Science & Technology B. 18. 2100-2108 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] M.Iyawa, S.KaH.Sai, Okada, J.Nakamura and H.Hasegawa: "Chemical and Electrochemical Nanofabrication Processes for Schottky In-Plane Gate GaAs Single and Coupled Quantum Wire Transistors"Jpn.J.Appl.Phys.. 39. 4651-4652 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] H.Fujikura, A.Liu, A.Hamamatsu, T.Sato and H.Hasegawa: "Electrochemical Formation of Uniform and Straight Nano-Pore Arrays on (001) InP Surfaces and Their Photoluminescence Characterizations"Jpn.J.Appl.Phys.. 39. 4616-4620 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Yoshida and H.Hasegawa: "Ultrahigh-Vacuum Contactless Capacitance-Voltage Characterization of Hydrogen Terminated-Free Silicon Surfaces"Jpn.J.Appl.Phys.. 39. 4504-4508 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Sato, S.Kasai, Okada and H.Hasegawa: "Electrical Properties of Nanometer-Sized Schottky Contacts on n-GaAs and n-InP Formed by in Situ Electrochemical Process"Jpn.J.Appl.Phys.. 39. 4609-4615 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] M.Yamada, H.Takahashi, T.Hashizume and H.Hasegawa: "Fabrication and Characterization of Novel Oxide-Free InP Metal-Insulator-Semiconductor FETs Hving an Ultra Narrow Si Surface Quantum Well"Jpn.J.Appl.Phys.. 39. 2407-2413 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] S.Ootomo, T.Hashizume and H.Hasegawa: "Nitridation of GaP (100) Surfaces by rf Nitrogen Radicals and by Electron Cyclotron Resonance Nitrogen Plasma"Jpn.J.Appl.Phys.. 39. 2407-2413 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Muranaka H.Fujikura and H.Hasegawa: "Selective MBE Growth of InGaAs Quantum Wire-Dot Coupled Structur es with Controlled Double-Barrier Potential Profiles"Inst.Phys.Conf.Ser.. 166. 187-190 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] S.Kasai, Y.Satoh and H.Hasegawa: "GaAs Quantum Wire Transistors and Single Electron Transistors using Schottky Wrap Gates for Quantum Integrated Circuits"Inst.Phys.Conf.Ser. 166. 219-222 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] T.Muranaka, C.Jiang, A.Ito and H.Hasegawa: "Origing of Non-Uniformity in MBE Grown Nanometer-Sized InGaAs Ridge Quantum Wires and Its Removal by Atomic Hydrogen-Assisted Cleaning"Thin Solid Film. 380. 189-191 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] R.Nakasaki, T.Hashizume and H.Hasegawa: "Insulator-GaN interface structures formed by plasma-assisted chemical vapor deposition"Physica E. 7. 953-957 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] B.Adamowicz and H.Hasegawa: "Analysis of photoluminescence efficiency and surface recombination velocity of MBE- grown AlGaAs layers"Thin Solid Films. 367. 180-183 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より
  • [文献書誌] B.Adamowicz and H.Hasegawa: "computer analysis of photon-induced non-equilibrium phenomena at Si and AlGaAs surfaces"Vacuum. 57. 111-120 (2000)

    • 説明
      「研究成果報告書概要(欧文)」より

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公開日: 2002-03-26  

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