-
[文献書誌] S.Watanabe,: "Microscopy of electronic states contributing to lasing in ridge quantum wire laser structure,"Appl. Phys. Lett.. 75. 2190-2192 (1999)
-
[文献書誌] S. Koshiba,: "Selective molecular beam epitaxy(MBE) growth of GaAs/AlAs ridge structures containing 10 nm scale wires and side quantum wells(QWs) and their stimulated emission characteristics,"J. Crystal. Growth. 201/202. 810-813 (1999)
-
[文献書誌] S. Koshiba,: "Fabrication and Control of GaAs/AlAs 10 nano-meter scale Structure by MBE,"Transactions of the Materials Research Society of Japan. 24[1]. 93-96 (1999)
-
[文献書誌] M. Yoshita,: "Carrier transfer in facet-growth GaAs quantum wells studied by solid immersion photoluminescence microscopy,"J. Phys. Conf. Ser. No162/Compound Semicond vectors. 162. 143-148 (1999)
-
[文献書誌] M. Baba,: "Aberrations and allowances for errors in a hemisphere solid immersion lens for submicron-resolution photoluminescence microscopy"J. Appl. Phys.. 85. 6923-6925 (1999)
-
[文献書誌] M. Baba,: "Application of solid immersion lens to submicron resolution imaging of nano-scale quantum wells"Opt. Rev.. 6. 257 (1999)
-
[文献書誌] K. Koyama,: "High collection efficiency in fluorescence microscopy with a solid immersion lens"Appl. Phya. Lett.. 75. 1667-1669 (1999)
-
[文献書誌] J. Kono,: "Picosecond time-resolved cyclotron resonance in semiconductors"Appl. Phys. Lett.. 75. 1119-1121 (1999)
-
[文献書誌] Y. Hanamaki,: "Spontaneous emission alteration in InGaAs/GaAs vertical-cavity surface-emitting laser structures"Semicond. Sci. Technol.. 14. 797-803 (1999)
-
[文献書誌] H. Sakaki,: "10nm-scale edge- and step-quantum wires and related structures : Progress in their desgn,epitaxial synthesis and physics"Physica E. 4. 56-64 (1999)
-
[文献書誌] T. Matsusue,: "Coherent dynamics of excitons in an island-inserted GaAs/AlAs quantum well structure : Suppression of phase relaxation and a deep quantum beat"Jpn. J. Appl. Phys.. 38. 2735-2740 (1999)
-
[文献書誌] H. Yaguchi,: "Time-resolved photoluminescence of cubic GaN grown by metalorganic vapor phase epitaxy"Phys. Stat. Sol.(b). 216. 237-240 (1999)