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[文献書誌] Takayuki Miyamae: "Direct observation of synchrotron radiation stimulated desorption of thin SiO_2 films on Si(111) by scanning tunneling microscopy"Surf. Sci. Lett.. 437. L755-L760 (1999)
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[文献書誌] Takayuki Miyamae: "Synchrotron-radiation stimulaled desorption of SiO_2 thin films on Si(111) surfaces observed by scanning turnneling microscopy"J. Vac. Sci. Technol.. A17. 1733-1736 (1999)
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[文献書誌] Harutaka Mekaru: "Construction of the multilayered-mirror monochromator beam line for the study of synchrotron radiation stimulated process"Rev. Sci. Instru.. 70. 2601-2605 (1999)
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[文献書誌] Takayuki Miyamae: "Scanning tunnelling microscopy for the study of the synchrotro-radiation stimulated process ; synchrotron-radiation stimulated desorption of SiO_2 films on Si(111) surface"Jpn. J. Appl. Phys.. 38 Suppl. 38-1. 249-252 (1999)
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[文献書誌] Tsuneo Urisu: "Infrared reflection absorption spectroscopy of selective etching and decomposition stimulated by synchrotron radiation"MRS Bulletin. 24. 46-48 (1999)
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[文献書誌] Mitsuru Nagasono: "Study of ion desorption induced by resonant core-electron excitation of isolated NH_3 monolayer adsorbed on a Xe film using Auger electron photoion coincidence spectroscopy"Jpn. J. Appl. Phys.. 38 Suppl. 38-1. 325-327 (1999)
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[文献書誌] Yoshikazu Homma: "Aligned island formation using steo-band networks on Si(111)"J. Appl. Phys.. 86. 3083-3088 (1999)
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[文献書誌] Shin-ichi Nagaoka: "Site-specific phenomenand Si:2p core-level photoionization of X_3Si(CH_2)nSi(CH_3)_3(X=F or Cl、n=0-2) condensed on a Si(111) surface"Chem. Phys.. 249. 15-27 (1999)
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[文献書誌] Tsuneo Urisu: "Energy and polarization control in synchrotron radiation stimulated nano-process"SPIE Proceedings. 373. 340-350 (1999)
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[文献書誌] Yongli Gao: "Scanning Tunneling Microscopy Study of Surface Morphology of Si(111) after Synchrotron Radiation Stimulated Desorption of SiO_2"J. Vac. Sci. Technol.. B(in printing). (2000)
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[文献書誌] Yongli Gao: "Scanning Tunneling Microscopy Study of Si(111)Surface Morphology after Removal of SiO_2 by Synchrotron Radiation Illumination"Appl. Phys. Lett.. (in printing). (2000)