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[文献書誌] R.Morrow: "The discharge current inducced by the motion of ccharged particles in time-dependent electric fields; Sato's equation extended" J.Phys.D: Appl.Phys.(印刷中). (1999)
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[文献書誌] E.Stoffels: "Electron attachment mass spectrometry as a diagnostics for electronegative gases and plasmas" Review of Scientific Instruments. 69(1). 116-118 (1998)
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[文献書誌] 飯沼恒一: "多成分大気汚染物質の非保存型輸送・反応モデルとそのベンゼンおよびトルエン濃度予測への応用" 大気環境学会誌. 33(4). 239-249 (1998)
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[文献書誌] 鈴木進: "N_2(A^3Σu^+)の大気汚染ガスによる衝突脱励起反応速度係数の測定" 電気学会放電研究会資料. ED-98-117 (1998)
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[文献書誌] B-H Jeon: "Electron Collision Cross Sections for C3F8 Molecule from Electron Transport Coefficients in C_3F_8-Ar Mixtures" Trans.IEE of Japan. 118-A(7/8). 868-873 (1998)
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[文献書誌] K.Yusa: "Decay of Metastable Argon Atoms in the Afterglow Plasma" Jpn.J.Appl.Phys.37. 103-107 (1998)
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[文献書誌] T.Fujimoto: "Plasma Polarization Spectroscopy" Plasma Physics Control Fusion. 41. 1-9 (1999)
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[文献書誌] T.Kimura: "Formation of dip structure of electron energy distribution function in diffused nitrogen plasmas" J.Phys.Soc, Jpn.67. 3443-3449 (1998)
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[文献書誌] C.P.Lungu: "A Study on NO_2 Decomposition in a Low-Pressure Plasma and 172nm Xe Excimer Lamp Radiation" 51.Ann.Gaseous Electronics Conf.(Am.Phys.Soc.), Oct.1998, Maui, Hawai, USA. KW3-4 (1998)
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[文献書誌] R.Gasparik: "Comparison of copper and stainless steel used for low voltage electrode in wire-to-plane electrode configuration for NOx treatment" Jpn.J.Appl.Phys.37. 4186-4187 (1998)
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[文献書誌] Y.Takeo: "Two dimensional profile of a pulsed capacitively coupled plasma in Ar and CF_4/Ar" Proc.of 4.Int.Conf.on Reactive Plasmas. 249-250 (1998)
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[文献書誌] C.P.Lungu: "A Study on NO_2 Decomposition in a Low-Pressure Plasma and 172nm Xe Excimer Lamp Radiation" Proc.of 4.Int.Conf.on Reactive Prasmas. 283-284 (1998)
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[文献書誌] 鵜飼正敏: "電子と正イオンクラスターとの再結合反応研究の提案" 日本物理学会第54回年会. 30pZC-1 (1999)
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[文献書誌] 近藤敬一: "電子スオームTOFパラメータのボルツマン方程式による解析アルゴリズム" 平成11年電気学会全国大会. No.57 (1999)
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[文献書誌] Hidenori Itoh: "Optical emission spectroscopic and mass spectrometric diagnostics in nitrogen RF discharges" 51.Ann.Gaseous Electronics Conf.(Am.Phys.Soc.), Oct.1998, Maui, Hawai, USA. JTP1-2 (1998)