-
[文献書誌] K.Sugisaki,M.Niibe,T.Watanabe,H.Kinoshita et al.: "Present Status of the ASET At-Wavelength Phase-Shifting Point Diffraction Interferometer"Proc.SPIE. 4166. 47-53 (2000)
-
[文献書誌] M.Niibe,T.Watanabe,H.Nii,T.Tanaka and H.Kinoshita: "Contrast Measurement of Reflection Masks Fabricated from Cr and Ta Absorbers for Extreme Ultraviolet Lithography"Jpn.J.Appl.Phys.. 39. 6815-6818 (2000)
-
[文献書誌] M.Niibe,T.Watanabe,H.Nii,T.Tanaka and H.Kinoshita: "Contrast Measurement of Reflection Masks for Extreme Ultraviolet Lithography"UVSOR Activity Report. 1999. 48-49 (2000)
-
[文献書誌] M.Niibe: "Phase-measuring interferometry using soft x-rays from long undulator"Iost.for Molecular Sci.Symposium on Vacuum Ultraviolet Radiation Light Sources and Their Materials Applications. 9/18-19. 108-114 (2000)
-
[文献書誌] 新部正人: "NewSUBARU 11m挿入光源のねらい"UVSORワークショップ. VII. 108-116 (2000)
-
[文献書誌] 小倉繁太郎編,新部正人, 他共著: "生産現場における光学薄膜の設計・作製・評価技術"技術情報協会. 337 (2000)