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[文献書誌] B.Gustafson et al.: "Lateral current confinement in selectively grown resonant tunneling transistor with an embedded gate"Physica E. 7・3-4. 819-822 (2000)
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[文献書誌] M.Gerling et al.: "Growth of InAs quantum dots on (110) oriented cleaved GaAs surfaces"25^<th> International Conference on the Physics of Semiconductors. M058. (2000)
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[文献書誌] N.Machida and K.Furuya: "Numerical simulation of hot electron interference in a solid state biprism : Conditions for interference observation"Journal of Applied Physics. 88・5. 2885-2891 (2000)
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[文献書誌] N.Machida and K.Furuya: "Coherent hot electron emitter"Japanese Journal of Applied Physics. 40・1. 64-68 (2001)
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[文献書誌] B.A.M.Hansson et al.: "Simulation of interference patterns in solid-state biprism devices"Solid State Electronics. 44. 1275-1280 (2000)
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[文献書誌] T.Arai et al.: "Toward nano-metal buried structure in InP-2Onm wire and InP buried growth of tungsten"Physica E. 7・3-4. 896-901 (2000)
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[文献書誌] T.Arai et al.: "First fabrication of GaInAs/InP buried metal heterojunction bipolar transistor and reduction of base-collector capacitance"Japanese Journal of Applied Physics. 39・6A. L503-L505 (2000)
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[文献書誌] T.Arai et al.: "GaAs buried growth over tungsten stripes using TEG and TMG "Journal of Crystal Growth. 221・1-4. 212-219 (2000)
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[文献書誌] Y.Miyamoto et al.: "Fabrication and transport properties of 5O-nm-wide Au/Cr/GaInAs electrode for electron wave interference device"Applied Surface Science. 159-160. 179-185 (2000)
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[文献書誌] M.Nagase et al.: "Peak width analysis of current-voltage characteristics of triple-barrier resonant tunneling diodes"Japanese Journal of Applied Physics. 39・6A. 3314-3318 (2000)
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[文献書誌] N.Sakai et al.: "Theoretical relation between spatial resolution and efficiency of detection in scanning hot electron microscope"Japanese Journal of Applied Physics. 39・9A. 5256-5260 (2000)
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[文献書誌] B.Y.Zhang et al.: "A vertical hot electron emitter of InGaAs/AlAs heterostructure with wide energy range at high current density"Physica E. 7. 851-854 (2000)
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[文献書誌] N.Machida et al.: "Numerical simulation of hot electron interference in solid-state biprism "25^<th> International Conference on the Physics of Semiconductors . M261. (2000)
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[文献書誌] T.Arai et al.: "CBC reduction in GaInAs/InP buried metal heterojunction bipolar transistor"12^<th> International Conference on Indium Phosphide and Related Materials. TuB1.6. (2000)
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[文献書誌] T.Arai et al.: "InP DHBT with 0.5 um wide emitter along <010> direction toward BM-HBT with narrow emitter"Topical Workshop on Heterostructure Microelectronics. Tue-3. (2000)
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[文献書誌] M.Nagase et al.: "Phase breaking effect appearing in I-V characteristics of double-barrier resonant-tunneling diodes-Theoretical fitting over four orders of magnitude"2000 International Conference on Solid State Devices and Materials. D-6-5. (2000)
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[文献書誌] B.Zhang and K.Furuya: "Characterization of hot electron transmission tunneling through the gap potential in scanning hot electron microscopy"10^<th> International Conference on Solid Films and Surface. Mo-P-167. (2000)