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[文献書誌] F.Iwata,: "Nano wearing property of fatigued polycarbonate surface studied by atomic force microscopy"J.Vac.Sci. & Technol.B. (to be published). (2001)
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[文献書誌] F.Iwata: "Local elasticity imaging of nano bundle structure of polycarbonate surface using atomic force microscopy"Nanotechnology. 11. 11-15 (2000)
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[文献書誌] F.Iwata,: "Scratching on polystyrene thin film without bumps using atomic force microscopy"J.Vac.Sci. & Technol.B. 17. 2452-2456 (1999)
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[文献書誌] F.Iwata: "Observation of a polystyrene surface modified by ultrasonic scratching using atomic force microscopy"Jpn.J.Appl.Phys.. 38. 3936-3939 (1999)
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[文献書誌] F.Iwata: "photoconductive imaging in a photonscanning tunneling microscope capable of point-contact current sersing using a conductive fiber."J.Microscopy. 202(to be published). (2001)
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[文献書誌] F.Iwata: "Conductive atomic force microscopy study of InGaN films grown by hot-wall epitaxy with a mixed (Ga+In)"J.Appl.Phys.. 88. 1670-1673 (2000)