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[文献書誌] Y.Ishibashi: "Theory of the Morphotropic Phase Boundary"Ferroelectrics. 267. 1471-1474 (2002)
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[文献書誌] Y.Watanabe, A.Masuda: "Nano-scale theory of Ferroelectric surface predicting skin-deep quan-tized 2D electron gas"Ferroelectrics. 267. 379-384 (2002)
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[文献書誌] M.Iwata, et al.: "Domain Observation in Pb(Zn_<1/3>Nb_<2/3>)O_3-PbTiO_3 Mixed Crystals"Jpn. J. Appl. Phys.. 41. 7007-7010 (2002)
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[文献書誌] T.Shimuta, O.Nakagawara, T.Makino, S.Arai, H.Tabata, T.Kawai: "Enhancement of remanent polarization in epitaxial BaTiO_3/SrTiO_3 superlattice with asymmetric structure"J. Appl. Phys.. 91. 2290-2294 (2002)
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[文献書誌] N.Yasuda, et al.: "Dielectric and piezoelectric properties of lead indium niobate-lead titanate single crystal with high Curie temperature near morphotropic phase boundary"Ferroelectrics. 270. 1433 (2002)
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[文献書誌] W.Sakamoto, M.Mizuno, Y.Horie, T.Yogo, S.Hirano: "Chemical Solution Processing and Characterization of Highly Oriented (Ba, Ln)Nb_2O_6[Ln : La, Gd, Dy] Thin Films"Jpn. J. Appl. Phys.. 41. 6647-6652 (2002)
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[文献書誌] T.Hayashi, D.Togawa, M.Yamada, W.Sakamoto, S.Hirano: "Preparation and Properties of Bi_<4-x>La_xTi_3O_<12> Ferroelectric Thin Films Using Excimer UV Irradiation"Jpn. J. Appl. Phys.. 41. 6814 (2002)
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[文献書誌] Y.Cho, et al.: "Tbit/inch^2 Ferroelectric Data Storage Based on Scanning Nonliner Dielectric Microscopy"Appl. Phys. Lett.. 81. 4401-4403 (2002)
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[文献書誌] T.Karaki, K.Tsu, T.Fujii, M.Adachi: "Field Dependence of Dielectric Properties of (Pb, Sr)TiO_3 Thin Films"Ferroelectrics. 271. 303-308 (2002)
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[文献書誌] M.Shimizu, H.Fujisawa, H.Niu, K.Honda: "Growth of Ferroelectric PbZr_xTi_<1-x>O_3 Thin Films by Metalorganic Chemical Vapor Deposition"J. Cryst. Growth. 237-239. 448 (2002)
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[文献書誌] H.Funakubo, K.Tokita, T.Oikawa, M.Aratani, K.Saito: "Comparison of Crystal Structure and Electrical Properties of Tetragonal and Rhombohedral Pb(Zr, Ti)O_3 Films Prepared by Low Temperature by Pulsed-Metalorganic Chemical Vapor Deposition"J. Appl. Phys.. 92. 5448-5452 (2002)
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[文献書誌] O.Ito, N.Fujimura, K.Kakuno, T.Ito: "Retention Property Analysis of Epitaxially Growth YMnO_3/Y_2O_3/Si Capacitor"Ferroelectrics. 271. 87-92 (2002)
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[文献書誌] M.Takahashi, K.Kodama, M.Noda, P.Hedblom, A.Grishin, M.Okuyama: "Oxygen Annealing Effect of Photoelectron Spectra in SrBi_2Ta_2O_9 Film"Jpn. J. Appl. Phys.. 41. 6797-6802 (2002)