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[文献書誌] T.Yoshimura,N.Fujimura,D.Ito and T.Ito: "Characterization of ferroelectricity in metal/ferroelectric/insulator/semiconductor structure by pulsed C-V measurement ; Ferroelectricity in YMnO_3/Y_2O_3/Si structure"J.Appl.Phys.. 87. 3444 (2000)
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[文献書誌] D.Ito,N.Fujimura,and T.Ito,: "Initial stage of thin film growth of pulsed laser deposited YMnO_3 thin film"Jpn.J.Appl.Phys.. 39. 5525 (2000)
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[文献書誌] K.Tadanaga,H.Kitahata,T.minami,N.Fujimura,and T.Ito: "Preparation and Ferroelectric Properties of YMnO_3 Thin Films With c-Axis Preferred Orientation by the Sol-Gel Method"J.Sol-Get Sci.tech. 19. 589 (2000)
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[文献書誌] D.Ito,T.Yoshimura,N.Fujimura,and T.Ito,: "Improvement of Y_2O_3/Si interface for FeRAM application"Appl.Sur.Sci.. 159. 138 (2000)
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[文献書誌] N.Fujimura,T.Yoshimura,D.Ito and T.Ito: "Evaluation of Ferroelectricity in MFIS Type Capacitor Using Pulsed C-V Measurement"Symposia Proc.of Materials Research Society. 596. 407 (2000)
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[文献書誌] H.Kitahata,K.Tadanaga,T.Minami,N.Fujimura,and T.Ito: "Origin of Leakage Current of YMnO_3 Thin Films Prepared by the Sol-Get Method"Symposia Proc.of Materials Research Society. 596. 481 (2000)
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[文献書誌] N.Fujimura,T.Yoshimura,D.Ito,T.Shimura and T.Ito: "Any candidates of ferroelectric material for transistor type FeRAM?"Applied Physics A. (In press). (2000)