-
[文献書誌] Y.Kanazawa: "Wavelength Dependence of UV Laser Cleaning for Silicon Field Emitter Arrays"Jpn.J.Appl.Phys.. 42,No.6B. 4041-4043 (2003)
-
[文献書誌] K.Murakami: "Fabrication of Nano Electron Source Using Beam Assisted Process"Jpn.J.Appl.Phys.. 42,No.6B. 4037-4040 (2003)
-
[文献書誌] Y.Gotoh: "Measurement of work function of transition metal nitride and carbide thin films"J.Vac.Sci.Technol.. B21. 1607-1611 (2003)
-
[文献書誌] Y.Gotoh: "Formation and control of stoichiometric hafnium nitride thin films by direct sputtering of hafnium nitride target"Jpn.J.Appl.Phys.. 42. L778-L780 (2003)
-
[文献書誌] N.Miyamoto: "Emission Stability of a FEA Observed by an Emission Microscope"J.Vac.Sci.Technol.. B21. 436-439 (2003)
-
[文献書誌] H.Nakane: "Emission Characteristics of Ultra-thin Layer Solid-state Emitters, Temperature and Thickness"J.Vac.Sci.Technol.. B21. 1616-1617 (2003)
-
[文献書誌] H.Mimura: "Growth of a sub-micron single diamond particle on a Si tip and its field emission characteristic"Jpn.J.Appl.Phys.. 42. 4048-4050 (2003)
-
[文献書誌] H.Matsumoto: "Point x-ray source using graphite nanofibers and its application to x-ray radiography"Appl.Phys.Lett.. 82. 1637-1639 (2003)
-
[文献書誌] T.Kondo: "Molecular beam study of CH4 oxidation on a Pt(111)-(2x2)-O surface"J.Chem.Phys.. 118. 760-767 (2003)
-
[文献書誌] A.Sinsarp: "Microscopic study of the work function reduction induced by Cs-adsorption"Jpn.J.Appl.Phys.. 42. 4882-4886 (2003)