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[文献書誌] J.Kushibiki, Y.Ono, Y.Ohashi, M.Arakawa: "Development of the Line-Focus-Beam Ultrasonic Material Characterization System"IEEE Trans. UFFC. 49・1. 99-113 (2002)
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[文献書誌] J.Kushibaki, I.Takanaga, S.Nishiyama: "Accurate Measurements of the Acoustical Physical Constants of Synthetic α-Quartz for SAW Devices"IEEE Trans. UFFC. 49・1. 125-135 (2002)
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[文献書誌] J.Kushibaki, Y.Ohashi, T.Ujiie: "Standardized Evaluation of Chemical Compositions of LiTaO_3 Single Crystals for SAW Devices Using the LFB Ultrasonic Material Characterization System"IEEE Trans. UFFC. (in press). (2002)
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[文献書誌] J.Kushibaki, Y.Ohashi, Y.Ono, and T.Sasamata: "Evaluation and Improvement of Optical-Grade LiTaO_3 Single Crystals by the LFB Ultrasonic Material Characterization System"IEEE Trans. UFFC. (in press). (2002)
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[文献書誌] J.Kushibaki, M.Arakawa, R.Okabe: "High-Accuracy Standard Specimens for the Line-Focus-Beam Ultrasonic Material Characterization System"IEEE Trans. UFFC. (in press). (2002)
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[文献書誌] I.Takanaga, J.Kushibiki: "A Method of Determining Acoustical Physical Constants for Piezoelectric Materials by Line-Focus-Beam Acoustic Microscopy"IEEE Trans. UFFC. (in press). (2002)
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[文献書誌] J.Kushibaki, I.Takanaga, S, Komatsuzaki, T.Ujiie: "Chemical Composition Dependences of the Acoustical Physical Constans of LiNbO_3 and LiTaO_3 Single Crystals"J. Appl. Phys. (in press). (2002)
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[文献書誌] K.Matsuura, Y.Cho, H.Odagawa: "Measurement of the Ferroelectric Domain Distributions Using Nonlinear Dielectric Response and Piezoelectric Response"Jpn. J. Appl. Phys.. 40・5B. 3534-3537 (2001)
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[文献書誌] Y.Cho, K.Ohara, A.Koike, H.Odagawa: "New Functions of Scanning Nonlinear Dielectric Microscopy (8160)16Higher-Order Measurement and Vertical Resolution(8160)16"Jpn. J. Appl. Phys.. 40・5B. 3544-3548 (2001)
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[文献書誌] Y.Cho, K.Ohara: "Higher Order Nonlinear Dielectric Imaging Using Scanning Nonlinear Dielectric Microscopy"Jpn. J. Appl. Phys.. 40・6B. 4349-4353 (2001)
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[文献書誌] K.Matsuura, Y.Cho, H.Odagawa: "Fundamental Study on Nano Domain Engineering Using Scanning Nonlinear Dielectric Microscopy"Jpn. J. Appl. Phys.. 40・6B. 4354-4356 (2001)
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[文献書誌] K.Ohara, Y.Cho: "Fundamental Study of Surface Layer on Ferroelectrics by Scanning Nonlinear Dielectric Microscopy"Jpn. J. Appl. Phys.. 40・9B. 5833-5836 (2001)
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[文献書誌] Y.Cho, S.Kazuta, H.Ito: "Scanning nonlinear dielectric microscopy study on periodically poled LiNbO_3 for high-performance quasi-phase matching devices"Appl. Phys. Lett.. 79・18. 2955-2957 (2001)
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[文献書誌] T.Sakai, T.Watanabe, Y.Cho, K.Matsuura, H.Funakubo: "Characterization of Ferroelectric Property of C-Axis- and Non-C-Axis-Oriented Epitaxially Grown Bi_2Vo_<5.5> Thin Films"Jpn. J. Appl. Phys.. 40・11. 6481-6486 (2001)
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[文献書誌] Y.Cho, K.Ohara: "Higher Order Nonlinear Dielectric Microscopy"Appl. Phys. Lett.. 79・23. 3842-3844 (2001)
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[文献書誌] H.Odagawa, Y.Cho: "Measuring of ferroelectric polarization component parallel to the surface by scanning nonlinear dielectric microscopy"Appl. Phys. Lett.. (in press). (2002)