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[文献書誌] K.Natori: "Scaling Limit of the MOS Transistor -A Ballistic MOSFET-"IEICR Trans.Electron.. E82-C. 2550-2555 (2001)
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[文献書誌] T.Shimizu, K.Natori, N.Sano: "Transport Characteristics of the Cross Junction of Atomic Chains"Jpn.J.Appl.Phys.. 40(7). 4489-4495 (2001)
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[文献書誌] K.Shimoyama, K.Kudo, M.Iida, K.Yamabe, T.Maeda: "Changes in surface states during epitaxial growth of BaTiO3 substrate in connection with composition deviation"J.Vac.Sci.Technol.. A19(5). 2083-2088 (2001)
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[文献書誌] N.Tokuda, M.Murata, D.Hojo, K.Yamabe: "SiO2 Surface and SiO2/Si Interface Topography Change by Thermal Oxidation"Jpn.J.Appl.Phys.. 40. 4763-4768 (2000)
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[文献書誌] K.Shimoyama, K.Kudo, T.Maeda, K.Yamabe: "Epitaxial Growth of BaTiO3 Thin Film on SrTiO3 Substrate in Ultra High Vacuum without Introducing Oxygen"Jpn.J.Appl.Phys.Pt.2. 40, 5A. L463-L464 (2001)
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[文献書誌] T.Kurusu, N.Sano: "Significance of the long-range Coulomb potential on the mobility in impure bulk semiconductors"Physica B. (In press).