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[文献書誌] Sibuya, M., Suzuki, K.: "Optimum Threshold for the k-out-of-n Monitor with Dual Failurest"Annals of the Institute of Statistical Mathematics. Vol.53. 189-202 (2001)
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[文献書誌] Wang, L., Suzuki, K.: "Lifetime Estimation Based on Warranty Data Without Date-of-Sale Information Cases Where Usage Time Distributions Are Knownt"Journal of the Japanese Society for Quality Control. Vol.31. 148-167 (2001)
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[文献書誌] Suzuki, K., L.Wang: "Analysis of Warranty Claims without Sales Amount Informationt"The 2nd International Symposium on Business and Industrial Statistics. 179-186 (2001)
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[文献書誌] Yamamoto, W., Suzuki, K.: "An Analysis of Defect Patterns of Semiconductor Wafers"The 2nd International Symposium on Business and Industrial Statistics. 157-160 (2001)
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[文献書誌] 鈴木 和幸, 金田 建, 平野 謙: "未然防止への情報共有化に関する一考察-ヒューマンファクターへの着目-"第31回信頼性・保全性シンポジウム. 263-268 (2001)
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[文献書誌] 鈴木 和幸, 田中 健次, 伊藤 誠: "品質危機とヒューマンファクター"品質管理. Vol.52. 812-824 (2001)