[文献書誌] A.Sano, K.Ono, K.Takahashi, Y.Setsuhara: "Profile Simulation Model for Nanometer-Scale Control of Critical Dimensions and Etched Profiles"Proceedings of the 2nd International Symposium on Dry Process, DPS-2002, Tokyo, Japan, October 10-11, 2002. 177-182 (2002)