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[文献書誌] K.Katayama, et al.: "Dose dependence of carrier and heat dynamics at an ion-implanted silicon surface measured using lens-free heterodyne transient grating method"J.Appl.Phys.. (In press). 2775-2777 (2003)
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[文献書誌] K.Katayama, et al.: "Lens-free heterodyne detection of Transient Grating"Appl.Phys.Lett.. 82. 2775-2777 (2003)
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[文献書誌] K.Katayama, et al.: "Formation of ring patterns surrounded by ripples by single-shot laser irradiation with ultrashort pulse width at the solid'liquid interface"Appl.Phys.Lett.. 82. 4244-4246 (2003)
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[文献書誌] K.Katayama, et al.: "Ultrafast dynamics at a silicon surface detected with femtosecond transient reflecting spectroscopy"J.Appl.Phys.. 81・3. 1074-1080 (2002)
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[文献書誌] K.Shibamoto, et al.: "Fundamental processes of surface enhanced Raman scattering detected by transient reflecting grating spectroscopy"J.Photochem.Photobio.A. 6245. 1-8 (2003)
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[文献書誌] K.Katayama, et al.: "Ultrafast nonlinear response of high density carriers at silicon surface detected by simultaneous measurements of transient reflecting first and second order diffractions"J.Appl.Phys.. 92・9. 5233-5237 (2002)
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[文献書誌] K.Katayama, et al.: "Transient reflecting grating spectroscopy for defect analysis in semiconductor surface layer"J.Appl.Phys.. 92・3. 1367-1371 (2002)
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[文献書誌] K.Shibamoto, et al.: "Fundamental processes of surface enhanced Raman scattering detected with transient reflecting grating spectroscopy"Rev.Sci.Instrum.. 74・1. 910-912 (2003)
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[文献書誌] K.Shibamoto, et al.: "Fundamental processes of surface enhanced Raman Scattering detected with transient reflecting grating spectroscopy"Anal.Sci.. 17. i91-i93 (2002)
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[文献書誌] 片山建二, 澤田嗣郎: "固体表面ナノ領域を分析する光熱変換分光法"M&E. 3. 96-100 (2002)