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[文献書誌] S.Hasegawa, I.Shiraki, 他9名: "Electrical conduction through surface superstructures measured by microscopic four-point probes"Surface Review and Letters. 10. 963-980 (2003)
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[文献書誌] H.Okino, I.Matsuda, T.Tanikawa, S.Hasegawa: "Formation of Facet Structures by Au Adsorption on Vicinal Si(111) Surface"e-Journal of Surface Science and Nanotechnology. 1. 84-90 (2003)
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[文献書誌] T.Tanikawa, K.Yoo, I.Matsuda, S.Hasegawa: "Non-Metallic Transport Property of the Si(111) 7x7 Surface"Physical Review B. 68. 113303-1-113303-4 (2003)
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[文献書誌] T.M.Hansen, K.Stokbro, 他4名: "Resolution enhancement of scanning four-point probe measurement on 2D systems"Review of Scientific Instruments. 74. 3701-3708 (2003)
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[文献書誌] T.Kanagawa, R.Hobara, I.Matsuda, T.Tanikawa, 他2名: "Anisotropy in conductance of a quasi-one-dimensional metallic surface state measured by square micro-four-point probe method"Physical Review Letters. 91. 036805-1-036805-4 (2003)
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[文献書誌] U.Tanikawa, I.Matsuda, R.Hobara, S.Hasegawa: "Variable-temperature micro-four-point probe method for surface electrical conductivity measurements in ultrahigh vacuum"e-Journal of Surface Science and Nanotechnology. 1. 50-56 (2003)
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[文献書誌] 日本表面科学会編(長谷川修司, 他10名, 分担執筆): "表面分析技術選書「ナノテクノロジーのための走査電子顕微鏡」"丸善. 196 (2004)