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[文献書誌] 一宮 正博: "CMOS論理ICの交流電界印加時の電源電流測定によるピン浮き検出法"エレクトロニクス実装学会誌. 6・2. 140-146 (2003)
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[文献書誌] 一宮 正博: "CMOS論理回路の発振を生じるICピン短絡故障検出回路"電子情報通信学会論文誌D-I. 86-D-I・2. 402-411 (2003)
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[文献書誌] 橋爪 正樹: "CMOSマイクロコンピュータ回路の電源電流によるブリッジ故障検出法"エレクトロニクス実装学会誌. 6・7. 564-572 (2003)
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[文献書誌] H.Yotsuyanagi: "Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field"IEICE Transaction on Information and Systems. E86-D・12. 2666-2673 (2003)
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[文献書誌] H.Yotsuyanagi: "Test Sequency Generation for Test Time Reduction of IDDQ Testing"IEICE Transaction on Information and Systems. E87-D・3. 537-543 (2004)
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[文献書誌] M.Hashizume: "Identification and Frequency Estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits"IEICE Transaction on Information and Systems. E87-D・3. 571-579 (2004)
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[文献書誌] M.Hashizume: "Electric Field Application Method Effective for Pin Open Detection Based on Supply Current in CMOS Logic Circuits"Proc.of 2003 International Conference on Electronics Packaging. 75-80 (2003)
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[文献書誌] M.Takagi: "Testability of Pin Open in Small Outline Package ICs by Supply Current Testing"Proc.of 2003 International Technical Conference on Circuits/Systems, Computers and Communications. 836-839 (2003)
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[文献書誌] M.Hashizume: "A BIST Circuits for IDDQ Tests"Proc.of 12-th IEEE Asian Test Symposium. 564-572 (2003)
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[文献書誌] M.Hashizume: "CMOS Open Fault Detection by Appearance Time of Switching Supply Current"Proc.of the second IEEE International Workshop on Electronic Design, Test, and Applications. 183-188 (2003)