研究概要 |
In fiscal year 2014, we completed the construction of the scanning thermal microscope. We have tested the microscope that is able to produce atomic resolution images in atomic force microscopy (AFM) mode using standard silicon cantilevers using optical interferometric detection of the cantilever dynamics. We tested that we can use the heating tips designed by IBM and performed scanning thermal imaging of a diamond (111) single crystal simultaneously measuring the cantilever displacement over the surface with our optical interferometer with tens of picometer resolution. Accordingly, we are able to decouple thermal signals from the topographic signals. In summary, the scanner thermal microscope we aimed to develop under this project is fully operative.
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