| 研究課題/領域番号 |
23H01352
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| 配分区分 | 補助金 |
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| 研究機関 | 東京大学 |
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研究代表者 |
ヴォルツ セバスチャン 東京大学, 生産技術研究所, 国際研究員 (70533636)
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| 研究分担者 |
野村 政宏 東京大学, 生産技術研究所, 教授 (10466857)
ORDONEZMIRANDA EdilbertoJose 東京大学, 生産技術研究所, 国際研究員 (60909779)
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| 研究期間 (年度) |
2023-04-01 – 2026-03-31
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| キーワード | Non planckian emission / Intermediate range / Diffuse radiation |
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| 研究実績の概要 |
We have successfully fabricated the samples and carried out the characterization of these samples was conducted using IR cameras and several Fourier Transform Infrared Spectroscopies (FTIR), providing detailed insights into optical and thermal properties.
These characterizations have confirmed increase of far-field diffuse emission in SPhP wavelength but not following our predictions. We have deepened the modeling of the cavities using fluctuational-dissipation theory and found that the radiation is confined in the few ten microns above the cavities.
We are now pursuing near-field IR measurements and intend to design new samples with optimized shapes.
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| 現在までの達成度 (区分) |
現在までの達成度 (区分)
2: おおむね順調に進展している
理由
WP1-We have completed the calculations of the heat flux flowing at the aperture of the silicon and the air cavities. We have found that the superplanckian emission decreases after a few tens of microns.
WP2-We have completed the fabrication of the samples and characterized their morphologies. Samples are silicon wafers containing deep linear cavities, 10 and 20 microns in width. Some of the wafers were oxydized to produce thin silica films carrying phonon polaritons.
WP3-thermal emission of air and silicon cavities have been measured using IR camera, FTIR (with temperature and angle dependence), and IR microscopy. the spectra reveals the impact of silica films and cavities increasing absorption.
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| 今後の研究の推進方策 |
We will measure the near-field to far-field electromagnetic energy at the aperture of the cavity using IR-SNOM.
We will design a new sample geometry to allow the cavity energy to propagate in the far-field.
We will investigate the diffuse contribution of the thermal emission which shows a Surface Phonon Polariton signature.
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