研究課題
During the second year of the project we first realizes two new test samples made of multi-layer GaAs/AlAs crystalline coatings deposited on GaAs wafer. On both samples we measured the scattering, the absorption and the point defects. We found more point defects and more scattering than on the previous samples. The absorption was also higher but probably it was affected by some absorption in the substrate since the coating reflectivity was not as high as in the previous samples. Finally we realized one multi-layer GaAs/AlAs crystalline coatings deposited on a GaAs wafer and then transferred on a sapphire wafer. On this sample we measured the scattering and the point defects. Both showed quite good performances. The scattering in particular is comparable to the best scattering measured on the highest quality dielectric coatings.Some of this work was done in collaboration with CNRS/LMA in Lyon (France) and CNRS/LPN in the Paris area (France). Some preliminary results were presented at the JPS meeting in September 2015.
すべて 2016 2015 その他
すべて 国際共同研究 (1件) 雑誌論文 (1件) (うち国際共著 1件、 査読あり 1件、 謝辞記載あり 1件) 学会発表 (1件)
Physical Review D
巻: 93 ページ: 012007-(1-16)
10.1103/PhysRevD.93.012007
