| 研究実績の概要 |
In the present research, an instrument for time-resolved measurements of the specular X-ray reflectivity and surface X-ray diffraction was improved and applied to the observation of dynamical processes at surfaces and interfaces, with the goal to further understanding of the functionality of active sites. This instrument can simultaneously observe the in-situ structure on the atomic scale and the nanometer scale with a time resolution of seconds or less.
The first topic that was adressed in FY2016 was the investigation of processes occuring during the photoconversion of organic thin films, which is a promising method for organic device fabrication. The structural evolution during the photoconversion was clarified for two different organic semiconductor materials.
The second topic that was investigated was processes occurring at the interface between an ionic liquid and an electrode. Time-resolved experiments with different electrode surfaces were conducted.
The measurement method was improved by designing a new crystal bender for focusing the X-rays. Another important advance was the extension of the method to monochromatic X-rays, so that both high-brightness undulator X-ray sources and widely available laboratory X-ray sources can be used.
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