• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to project page

1994 Fiscal Year Final Research Report Summary

Molecular Beam Epitaxy on the (NH_4)_2S_x-treated Surface of GaAs

Research Project

Project/Area Number 05452091
Research Category

Grant-in-Aid for General Scientific Research (B)

Allocation TypeSingle-year Grants
Research Field Applied materials science/Crystal engineering
Research InstitutionUniversity of Tsukuba

Principal Investigator

NANNICHI Yasuo  University of Tsukuba, Inst.Mat.Sci., Professor, 物質工学系, 教授 (10133026)

Co-Investigator(Kenkyū-buntansha) OIGAWA Haruhiro  University of Tsukuba, Inst.Mat.Sci., Lecturer, 物質工学系, 講師 (60223715)
SHIGEKAWA Hidemi  University of Tsukuba, Inst.Mat.Sci., Assistant Professor, 物質工学系, 助教授 (20134489)
Project Period (FY) 1993 – 1994
KeywordsSulfur Treatment / GaAs / Molecular Beam Epitaxy / Interface Structure / Photoelectron Spectroscopy / X-ray Standing Wave Technique / Scanning Tunneling Microscopy / Reflection High-energy ElectronDiffraction
Research Abstract

The surface/interface properties of GaAs remain uncontrollable to date, except for the use of heterojunctions, initially, of GaAs/AlGaAs. In particular, the presence of oxygen induces the surface defects, and degrades the performance and reliability of surface devices. In recent years, we found that the surface treatment of GaAs using ammonium polysulfide ((NH_4)_2S_x) solution markedly decreases its surface state densities. For the development of high-performance devices, therefore, it is necessary to epitaxially grow metal and insulator films on the (NH_4)_2S_x-treated surface. So we tried the epitaxial growth of Al and CaF_2 on the (NH_4)_2S_x-treated surface of GaAs with a molecular beam epitaxy (MBE) technique. Here it is important not to collapse a passivating monomolecular layr of sulfur during the deposition, because the effect of (NH_4)_2S_x treatment is brought about by a surface coverage with its layr. Accordingly, we also studied the change in surface/interface structure and chemical state of sulfur with increasing the film thickness by means of reflection high-energy electron diffraction (RHEED), X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM). As a result, the significant effect of (NH_4)_2S_x treatment was observed as follows :
1)S atoms occupy the near-site of As on top of the surface, where S-Ga bonds are formed.
2)Such a surface is stabilized through charge transfer of excess electrons into the dangling bond states of S,resulting in the reconstruction with S-S dimer structure.
3)The films of Al and CaF_2 are epitaxially grown on the (NH_4)_2S_x-treated surface.
4)When the Al and CaF_2 are deposited, the Al-S and Ca-S bonds are respectively formed at the interface.
5)These interface structures are also stable against the heat treatment.

  • Research Products

    (26 results)

All Other

All Publications (26 results)

  • [Publications] M.Oshima: "Oxidation of Sulfur-Treated GaAs Surfaces Studied by Photoluminescence and Photoelectron Spectroscopy" Japanese Journal of Applied Physics. 32. 518-522 (1993)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Sugiyama: "Interface structure and chemical bondings in Al/S-passivated GaAs(111)" Applied Physics Letters. 63. 2540-2542 (1993)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Oshima: "Combined analysis of overlayer/S/GaAs interfaces with photoemission spectroscopy and X-ray standing wave" Applied Surface Science. 70/71. 496-501 (1993)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Oshima: "Novel interlayer as an interfacial reaction suppressor in high GaAs Schottky barrier" Proc.1st Intl.Symposium on Control of Semiconductor Interfaces. 199-204 (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] H.Shigekawa: "Dimer Model for Comprerhensive Interpretation of Selenium-Passivated GaAs (001) Surface Structures" Proc.1st Intl.Symposium on Control of Semiconductor Interface. 303-304 (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] H.Shigekawa: "Surface Structures of GaAs (001) with Selenium Adsorbate Studied by Scanning Tunneling Microscopy" Proc.1st Intl.Symposium on Control of Semiconductor Interfaces. 573-574 (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] H.Shigekawa: "Selenium-treated GaAs (001)-2×3 surface studied by scanning tunneling microscopy" Applied Physics Letters. 65. 607-609 (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] H.Shigekawa: "Molecular structure of a crystal phase coexisting with κ-(BEDT-TTF)2Cu(NCS)2 studied by scanning tunneling microscopy" Physical Review B. 50. 15427-15430 (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 重川秀実: "STMによるSe処理を施したGaAs(001)表面超構造の研究" 表面科学. 15. 305-310 (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 三宅晃司: "NaOH処理を施した層状物質における表面超構造のSTM" 表面科学. 15. 541-544 (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 三宅晃司: "α-シクロデキストリン/MOS_2の格子整合モデルと包接錯対構造の解析" 表面科学. 15. 610-614 (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] H.Oigawa: "Surface Passivation of III-V Compound Semiconductors with Chalcogen Atoms" Proc.7th Intl.Symposium on the Passivity of Metals and Semiconductors. (1995)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Oshima, T.Scimeca, Y.Watanabe, H.Oigawa and Y.Nannichi: "Oxidation of Sulfur-Treated GaAs Surfaces Studied by Photoluminescence and Photoelectron Spectroscopy" Jpn.J.Appl.Phys.32. 518-522 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Sugiyama, S.Maeyama, T.Scimeca, M.Oshima, H.Oigawa, Y.Nannichi and H.Hashizume: "Interface structure and chemical bondings in Al/S-passivated GaAs (111)" Appl.Phys.Lett.63. 2540-2542 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Oshima, T.Scimeca, M.Sugiyama, S.Maeyama, H.Oigawa, Y.Nannichi and H.Hashizume :"Combined analysis of overlayr/S/GaAs interfaces with photoemission spectroscopy and X-ray standing wave" Appl.Surf.Sci.70/71. 496-501 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Nie and Y.Nannichi: "Apparent Recovery Effect of Hydrogenerated Pd-on-GaAs (n-type) Schottky Interface by Forward Current at Low Temperature" Jpn.J.Appl.Phys.32. L890-893 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Oshima, T.Scimeca, Y.Watanabe, M.Sugiyama, S.Maeyama, H.Oigawa and Y.Nannichi: "Novel interlayr as an interfacial reaction suppressor in high GaAs Schottky barrier" Proc.1st Intl.Symposium on Control of Semiconductor Interfaces. 199-204 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Shigekawa, H.Oigawa, K,Miyake, Y.Aiso, Y.Nannichi, T.Hashizume and T.Sakurai: "Dimer Model for Comprehensive Interpretation of Selenium-Passivated GaAs (001) Surface Structures" Proc.1st Intl.Symposium on Control of Semiconductor Interfaces. 303-304 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Shigekawa, H.Oigawa, K,Miyake, Y.Aiso, Y.Nannichi, T.Hashizume and T.Sakurai: "Surface Structures of GaAs (001) with Selenium Adsorbate Studied by Scanning Tunneling Microscopy" Proc.1st Intl.Symposium on Control of Semiconductor Interfaces. 573-574 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Shigekawa, H.Oigawa, K.Miyake, Y.Aiso and Y.Nannichi: "Surface Structures of GaAs passivated by chalcogen atoms" Appl.Surf.Sci.75. 169-174 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Shigekawa, H.Oigawa, K.Miyake, Y.Aiso, and Y.Nannichi, T.Hashizume and T.Sakurai: "Selenium-treated GaAs(001)-2x3 surface studied by scanning tunneling microscopy" Appl.Phys.Lett.65. 607-609 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Shigekawa, K.Miyake, H.Oigawa, T.Mori and Y.Saito: "Molecular structure of a new crystal phase coexisting with the kappa-(BEDT-TTF)_2Cu(NCS)_2 studied by scanning tunneling microscopy" Phys.Rev.B. 50. 15427-15430 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Shigekawa, H.Oigawa, K.Miyake, Y.Aiso, Y.Nannichi, T.Hashizume and T.Sakurai: "Superstructures of Se-Treated GaAs(001) Surface Studied by Scanning Tunneling Microscopy" J.Surf.Sci.Soc., Japan. 15. 305-310 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Miyake, Y.Aiso, M.Komiyama and H.Shigekawa: "An STM Study of the Superstructures of Layred Compound Surfaces Treated with NaOH Solutions" J.Surf.Sci.Soc., Japan. 15. 541-544 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Miyake, Y.Aiso, M.Komiyama, A.Harada, M.Kamachi and H.Shigekawa: "Structure of Cyclodextrin Inclusion Complexes Studied by Using the Lattice Matching Model of alpha-Cyclodextrin Commensurate with Molybdenum Disulfide" J.Surf.Sci.Soc., Japan. 15. 610-614 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Oigawa, H.Shigekawa and Y.Nannichi: "Surface Passivation of III-V Compound Semiconductors with Chalcogen Atoms" 7th Intl.Symposium on Passivity. (in press.). (1995)

    • Description
      「研究成果報告書概要(欧文)」より

URL: 

Published: 1999-03-09  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi