1996 Fiscal Year Final Research Report Summary
Three dimensional structure analysis of advanced materials by electron microscope images of successive thin sections
| Project/Area Number |
07805061
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Inorganic materials/Physical properties
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| Research Institution | Tohoku University |
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Principal Investigator |
SHINDO Daisuke Tohoku University, Institute for Advanced Materials Research, Professor, 素材工学研究所, 教授 (20154396)
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| Co-Investigator(Kenkyū-buntansha) |
KUDOH Jun-ichi Tohoku University, Computer Center, Associate Professor, 大型計算機センター, 助教授 (40186408)
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| Project Period (FY) |
1995 – 1996
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| Keywords | Electron Microscope / Ultramicrotomy / Imaging Plate / Thin Section / Image Analysis / 3次元構造解析 |
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| Research Abstract |
The purpose of this study is the establishment of three dimensional structure analysis using ultramicrotomy and image processing. First of all, we found the optimum slice conditions for ultramicrotomy of ion oxide small particles. Actually we succeeded in obtaining successive thin section with several ten nm in thickness. Then we carried out high-resolution electron microscopy with a high-voltage high resolution electron microscope in Tohoku University. In order to accurately record the high-resolution images, we used a new recording system, i.e., the imaging plates. We also carried out the imaging processing using Tohoku University computer network system TAINS and SUPER-TAINS.Through these studies, we clarified internal structure of monodisperse ion oxides with various shapes, such as platelet-type, peanut-type and pseudocubic type. We also applied this method to CdS monodisperse particles and succeeded in clarifying their internal and external structure.
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