| Research Abstract |
We have performed the research for ultra-high-speed waveform measurement algorithms which are especially used for waveform sampling technology, and these algorithms will be required in next generation waveform measurement instruments for high-speed and high-frequency information and communication systems. We have obtained the following results :
(1) We have derived explicit formulas for finite aperture time effects in waveform sampling systems. In waveform sampling systems, ideally the sampling should be performed instantaneously, however it takes some time (which is called "aperture time") and this finite aperture time degrades the waveform sampling accuracy. We have derived the relationship between finite aperture time and sampling accuracy, and we have confirmed this result by numerical simulation.
(2) We have derived explicit formulas for aperture jitter effects in waveform sampling systems. In actual waveform sampling systems, the rising edge of the sampling clock fluctuates, which is called "aperture jitter", and this aperture jitter degrades the waveform sampling accuracy. We have derived the relationship between aperture jitter and sampling accuracy, and we have confirmed this result by numerical simulation as well as experiments.
(3) We have derived new algorithms to evaluate the performance of the sampling circuits.
(4) We have derived explicit formulas for dynamic power dissipation of track/hold circuits.
(5) We have derived explicit formulas for channel mismatch effects (such as offset, gain, timing, bandwidth, linearity) in time-interleaved AD converter systems.
(6) We have derived explicit formulas for the sampling jitter effects in DA converters which are used in measurement instruments to generate various waveforms.
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