• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to project page

2003 Fiscal Year Final Research Report Summary

Equipping a transmission electron microscope with a field emission electron gun.

Research Project

Project/Area Number 13555006
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field 表面界面物性
Research InstitutionNagoya University

Principal Investigator

TANJI Takayoshi  Nagoya university, Graduate School of Engineering, Associate Professor, 大学院・工学研究科, 助教授 (90125609)

Co-Investigator(Kenkyū-buntansha) KUSUONKI Michiko  Japan Fine Ceramics Center, Senior Researcher, 主任研究員
TANAKA Shigeyasu  Nagoya University, Ecotopia Science Institute, Assistant Professor, 理工科学総合研究センター, 講師 (70217032)
ICHIHASHI Mikio  Nagoya University, Ecotopia Science Institute, Professor, 理工科学総合研究センター, 教授 (90345869)
岡本 篤人  (株)豊田中央研究所, グループリーダ研究員
OKAMAOT Atsuto  Toyota Central Research Laboratory, Researcher
Project Period (FY) 2001 – 2003
Keywordscarbon nano-tube / field emission electron gun / surface decomposition of SiC / precise diamond cutter / focused ion beam (FIB)
Research Abstract

We investigated to apply carbon nano-tubes (CNT) to field emission electron guns for transmission electron microscopes (TEM). Fundamental tips of SiC are prepared by a precision diamond cutter and CNTs are grown by surface decomposition on the top (000-1) surface. The detail of the process is shown hereafter:
1.A rod of SiC single crystal along <0001> orientation having a top surface of 0.5mmx0.5mm is cut out by the precise diamond sow with a blade of a special figure. 2.The strain introduced in the cutting process is removed by chemical etching and chemical washing. 3.Focused Ion Beam (FIB) processing are introduced to make the rod thinner. To avoid damaging the top surface, SiO_2, Al or Won Al was evaporated on the rods. 4.Removed the layer of SiO_2 or Al, the rods were heat-treated in a vacuum of 1Pa at 1700℃ for 6hours. The growth of CNTs was confirmed even on the top surface of 0.2μmx0.3μm. 5.In order to give a high conductivity to the tip, graphite layers were grown on a (1210) surface by a heat-treatment in the vacuum of 1x10^<-2>Pa at 1700℃ for 10hours.
Field emission characteristics were measured in a high vacuum chamber less than 1x10^<-7>Pa and emission patterns were observed on a fluorescent screen.

  • Research Products

    (14 results)

All Other

All Publications (14 results)

  • [Publications] 丹司敬義 他3名: "高精度位相シフト電子線ホログラフィ"電子顕微鏡. 36・1. 71-74 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Kusunoki 他3名: "Aligned carbon nanotube films on Sic(OOO1) wafers"Physica B. 323・1-4. 296-298 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Kusunoki 他3名: "Patterned Carbon Nanotube Films Formed by Surface Decomposition of SiC Wafers"Jpn.J.Appl.Phys.. 42・12A. L1486-L1488 (2003)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Tanji 他3名: "Observation of Magnetic Multilayers by Electron Holography."Microscopy and Microanalysis. 10・1. 146-152 (2004)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Tanaka, T.Tanji 他5名: "Transmission Electron Microscopy Study of an AIN Nucleation layer for the Growth of GaN on a 7-Degree Off-Oriented (001) Si Substrate by Metalorganic Vapor Phase Epitaxy."J.Crystal Growth. 260・3-4. 360-365 (2004)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Kusunoki et al.: "Aligned carbon nanotube films on SiC(0001) wafers."Physica B. 323-1/4. 296-298 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S.Tanaka et al.: "Transmission Electron Microscopy Study of the Microstructure in Selective-Area-Grown GaN and an AlGaN/GaN Heterostructure on a 7-Dagree Off-Oriented (001) Si Substrate"Jpn.J.Appl.Phys.. 41(Part2, 7B). L846-L848 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Kusunoki et al.: "Paterned Carbon Nanotube Films Formed by Surface Decomposition of SiC Wafers."Jpn.J.Appl.Phys.. 42-12A. L1486-L1488 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Tanji et al.: "Observation of magnetic multilayers by electron holography."Microscopy and Microanalysis. 10-1. 146-152 (2004)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S.Tanaka et al.: "Transmission Electron Microscopy Study of an AIN Nucleation layer for the Growth of GaN on a 7-Degree Off-Oriented (001) Si Substrate by Metalorganic Vapor Phase Epitaxy."J.Crystal Growth. 260-3/4. 360-365 (2004)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Tanji et al.: "Holographic Observation of Magnetic Fine-Structures in New Magnetic Materials."Microscopy and Microanalysis 2002, Quebec City, Canada. Aug.4-8. 30-31 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Yamamoto et al.: "Quantitative Evaluation of Fresnel Corrections for High Precision Phase-Shifting Electron Holography."Proc.15th Int.Cong.on Electron Microscopy, Durban, South Africa Sept.1-6. Vol.3. 303-304 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Hibino et al.: "Phase Contrast Transfer Function of Spherical Aberration Corrected Objective Lens."Proc.15th Int.Cong.on Electron Microscopy, Durban, South Africa, Sept.1-6. Vol.3. 39-40 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S.Tanaka et al.: "TEM Characterization of (1-1 0 1) GaN Grown Selectively on a 7-Degree Off-oriented (001)Si Substrate."Proc.15th Int.Cong.on electron Microscopy, Durban, South Africa, Sept.1-6. Vo.1. 117-118 (2002)

    • Description
      「研究成果報告書概要(欧文)」より

URL: 

Published: 2005-04-19  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi