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2002 Fiscal Year Final Research Report Summary

Development of highly sensitive high-resolution PIXE system to chemical state analysis.

Research Project

Project/Area Number 13650054
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Applied physics, general
Research InstitutionHosei University

Principal Investigator

HAMANAKA Hiromi  Hosei University, Faculty of Engineering, Professor, 工学部, 教授 (10061235)

Co-Investigator(Kenkyū-buntansha) MAEDA Kuniko  The Institute of Chemical Physical Research (Riken), Senior Research Scientist, 理化学研究所, 先任研究員 (60087476)
HASEGAWA Kenichi  Hosei University, Faculty of Engineering, Professor, 工学部, 教授 (40010798)
Project Period (FY) 2001 – 2002
KeywordsPIXE / PSPC / Chemical state analysis / X-ray spectrometer / Wavelength dispersive
Research Abstract

We have constructed a wavelength dispersive X-ray spectrometer equipped with a charge-division position-sensitive proportional counter (PSPC) for PIXE measurement under vacuum. A laser displacement sensor was installed in the system to determine the position of a sample in a precision of ±3μm during the ion beam bombardments. The precise measurement of sample position improved the reliability of chemical state analysis. It is important in the stability of PSPC to substitute the air in PSPC with counter gas completely. Some experiments were also performed to improve the feasibility of chemical state analysis in non-vacuum. A crystal spectrometer of v. Hamos geometry composed of a cylindrically curved crystal and a single PSPC was newly constructed. Performance of the newly constructed spectrometer is considerably improved compared to that of previously developed spectrometers for high-resolution PIXE. Sensitivity of the new spectrometer is about 10 times higher than that of a spectrometer consisting of a flat crystal and a single PSPC. Furthermore, ratio of signal peak to background noise of this spectrometer measured at sulfur K 13 is about 5 times higher than that of the spectrometer which consists of a combination of a flat crystal and the multi-stacked PSPC.

  • Research Products

    (24 results)

All Other

All Publications (24 results)

  • [Publications] K.Maeda, A.Tonomura, H.Hamanaka, K.Hasegawa: "IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER"Int.J.of PIXE.. 11. 35-44 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Maeda, T.Hasegawa, H.Hamanaka, K.Hasegawa, M.Maeda: "DIRECT SPECIATION OF SULFUR IN MARINE SEDIMENTS BY HIGH-RESOLUTION PIXE"Riken Accel. Prog.Rep.. 34. 224-225 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] H.Hamanaka, K.Hasegawa, K.Maeda: "APPLICATION OF A LASER DISPLACEMENT SENSOR TO HIGH RESOLUTION PIXE"Rep.of Rese.Cent.of Ion Beam Tech. Hosei Univ.. 20. 111-114 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Maeda, K Hasegawa, H.Hamanaka, M.Maeda, S.Yabuki, K.Ogiwara: "RAPID CHEMICAL STATE ANALYSIS BY A HIGHLY SENSITIVE HIGH-RESOLUTION PIXE SYSTEM"Nucl.Instr. and Meth.. B190. 704-708 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 長谷川賢一, 浜中廣見, 前田邦子: "高速結晶分光PIXEに用いる積層検出システム"計測自動制御学会論文集. 39. 11-17 (2003)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 前田邦子, 長谷川賢一, 浜中廣見, 前田 勝: "位置敏感式結晶分光器を用いたPIXE分光:大気中での化学状態分析への応用"X線技術の進歩. 34. 89-113 (2003)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] H.Hamanaka, K.Maeda, K.Hasegawa: "IMPROVEMENT OF THE PRECISION IN PIXE MEASUREMENT USING CRYSTAL SPECTROMETER"Rep.of Rese. Cent.of Ion Beam Tech. Hosei Univ.. 22. 77-81 (2004)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Maeda, K.Hasegawa, H.Hamanaka, M.Tsuji, S.Murao: "APPLICATION OF AN IN-AIR HIGH-RESOLUTION PIXE SYSTEM"Riken Accel. Prog.Rep. 37(in press). (2004)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 浜中廣見, 前田邦子, 長谷川賢一: "結晶分光PIXEによるAlの状態分析:レーザセンサによる試料位置決めの提案"第18回PIXEシンポジウム. (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 前田邦子, 長谷川賢一, 浜中廣見, 前田 勝: "大気中高分解能PIXEの高感度化"第18回PIXEシンポジウム. (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 浜中廣見, 長谷川賢一, 前田邦子: "結晶分光PIXE試料の高精度位置決め法の提案"法政大学イオンビーム工学シンポジウム. (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Maeda, K.Hasegawa, H.Hamanaka, K.Ogiwara: "A HIGHLY SENSITIVE HIGH-RESOLUTION IN-AIR PIXE USING A CURVED CRYSTAL IN VON HAMOS GEOMETRY"The 4^<th> Iint.Symposium on Bio PIXE. (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 前田邦子, 長谷川賢一, 萩原清, 前田 勝, 浜中廣見: "大気中高分解能PIXEの高感度化-II"第19回PIXEシンポジウム、2002年10月9日-11日. (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 浜中廣見, 前田邦子, 長谷川賢一, 辻 正道, 村尾 智: "結晶分光PIXE法によるマイカ中のAlの状態分析"第20回PIXEシンポジウム. (2003)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 前田邦子, 長谷川賢一, 前田 勝, 浜中廣見: "位置敏感式結晶分光PIXEシステムの機能拡張"第20回PIXEシンポジウム. (2003)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Maeda, A.Tonomura, H.Hamanaka, K.Hasegawa: "IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER"Int.J.PIXE. 11. 35-44 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Maeda, T.Hasegawa, H.Hamanaka, K.Hasegawa, M.Maeda: "DIRECT SPECIATION OF SULFUR IN MARINE SEDIMENTS BY HIGH-RESOLUTION PIXE"Riken Accel. Prog. Re. 35. 224-225 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Hamanaka, K.Hasegawa, K.Maeda: "APPLICATION OF A LASER DISPLACEMENT SENSOR TO HIGH RESOLUTION PIXE"Re of Rese. Cent. of Ion Beam Tech (Hosei Univ.). 20. 111-114 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Maeda, K.Hasegawa, H.Hamanaka, M.Maeda, S.Yabuki, K.Ogiwara: "RAPID CHEMICAL STATE ANALYSIS BY A HIGHLY SENSITIVE HIGH-RESOLUTION PIXE SYSTEM"Nucl. Instr. and Meth.. B190. 704-708 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Hamanaka, K.Maeda, K.Hasegawa: "IMPROVEMENT OF THE PRECISION IN PIXE MEASUREMENT USING CRYSTAL PECTROMETER"Re of Rese. Cent. of Ion Beam Tech (Hosei Univ.). 22. 77-81 (2004)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Hasegawa, H.Hamanaka, K.Maeda: "A STACED DETECTOR SYSTEM FOR RAPID HIGH-RESOLUTION PIXE ANALYSIS BY A CRYSTAAL SPECTROMETER"Trans. Soc. Instrum. and Control Engineers. 39. 89-113 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Maeda, K.Hasegawa, H.Hamanaka, M.Maeda: "PARTICLE INDUCED X-RAY EMISSION (PIXE) ANALYSIS USING POSITION-SENSITIVE CRYSTAL SPECTROMETERS : APPLICATION TO CHEMICAL STATE ANALYSIS IN AIR"Adv. X-ray Chem. Anl. Japan. 34. 89-113 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Hamanaka, K.Maeda, K.Hasegawa: "IMPROVEMENT OF THE PRECISION IN PIXE MEASUREMENT USING CRYSTAL SPECTROMETER"Re of Rese. Cent. of Ion Beam Tech (Hosei Univ.). 22. 77-81 (2004)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Maeda, K.Hasegawa, H.Hamanaka, M.Maeda S.Yabuki, K.Ogiwara: "APPLICATION OF AN IN-AIR HIGH-RESOLUTION PIXE SYSTEM"Riken Accel. Prog. Re. 37(in press). (2004)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 2005-04-19  

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