Ferroelectric domain dynamics studied via atomic-resolution in-situ electrical biasing TEM

2017 Fiscal Year Final Research Report

• Project/Area Number: 15H05545
• Research Category: Grant-in-Aid for Young Scientists (A)
• Allocation Type: Single-year Grants
• Research Field: Inorganic materials/Physical properties
• Research Institution: Kyushu University
• Principal Investigator: Sato Yukio 九州大学, 工学研究院, 准教授 (80581991)
• Project Period (FY): 2015-04-01 – 2018-03-31
• Keywords: 誘電体 / 圧電体 / 強誘電体 / 電子顕微鏡 / 電子セラミックス / その場観察

Outline of Final Research Achievements

In this project, we have developed atomic resolution electrical biasing in-situ electron microscopy, which allows us to observe atomistic structure of material under external electric field and determine the atomic position precisely. Also, we have applied this method to characterize ferroelectric materials. We have demonstrated that in a prototypical dielectric crystal, strontium titanate, precision below 10 pm in the atomic position determination can be achieved. (Sato et al., Appl. Phys. Lett., 2017.) We are characterizing other ferroelectric materials using this method and we will publish the results in near future.

Free Research Field

電子セラミックス