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2017 Fiscal Year Final Research Report

Proof-of-Concept of Novel Three Dimensional Atom Probe without Needle Structured Sample

Research Project

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Project/Area Number 16K13685
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeMulti-year Fund
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionKyoto University

Principal Investigator

Gotoh Yasuhito  京都大学, 工学研究科, 准教授 (00225666)

Project Period (FY) 2016-04-01 – 2018-03-31
Keywordsアトムプローブ / 静電拡大投影 / 短焦点距離 / 平坦 / 倍率
Outline of Final Research Achievements

A novel method to use flat sample in atom probe tomography where the sample is requested to be formed as a needle structure was examined. It was found that high magnification of the electrostatic projection comparable to the atom probe can be obtained by placing a counter electrode above the flat sample with a very short spacing. The electrodes for this experiment was designed and fabricated, and preliminary experiments were performed.

Free Research Field

真空電子工学

URL: 

Published: 2019-03-29  

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