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2019 Fiscal Year Annual Research Report

Control of carrier localization in dilute magnetic semiconductors

Research Project

Project/Area Number 17K05494
Research InstitutionYokohama National University

Principal Investigator

RAEBIGER HANNES  横浜国立大学, 大学院工学研究院, 准教授 (20531403)

Project Period (FY) 2017-04-01 – 2020-03-31
Keywordscarrier localization / polaron states / strain engineeting / magnetic semiconductors
Outline of Annual Research Achievements

We have carried out electronic structure calculations of various defects in GaN and Ga2O3. For GaN, we have focused on the deep Mn and Fe impurities, as well as shallow acceptor Mg. For Ga2O3, in addition to beta phase, we also investigate epsilon and kappa phases, and focus on Cr and Co impurities.
1. We have observed various polaronic states for Mg impurities in GaN, and investigate in detail their sensitivity to strain. In addition to thermodynamic stabilities and thermodynamic transitions, also optical lines are calculated for comparison with experiment. Our calculation clarifies various optical transitions that have been heavily debated in literature. We are in the process of publishing these results.
2. For Ga2O3, we have discovered carrier-mediated ferromagnetism in Cr-doped beta-Ga2O3, as well as described the optical properties of Co-doped epsilon and kappa phases of Ga2O3. Both works are published in peer-reviewed journals.
3. Our review on piezomagnetism in magnetic semiconductors is still under preparation. In addition, a review on first principles methods for defect calculations of semiconductors was published as a book chapter in "Characterization and Control of Defects in Semiconductors" (Ed. F. Tuomisto, IET, United Kingdom 2019).
4. We have expanded this work to the investigation of polaron states in cunprate superconductors. Publication under preparation.

  • Research Products

    (7 results)

All 2020 2019

All Journal Article (2 results) (of which Int'l Joint Research: 2 results,  Peer Reviewed: 2 results) Presentation (4 results) (of which Int'l Joint Research: 3 results) Book (1 results)

  • [Journal Article] Carrier mediated ferromagnetism in Ga2O3:Cr2020

    • Author(s)
      Ichihashi Kodai、Shinya Hikari、Raebiger Hannes
    • Journal Title

      Applied Physics Express

      Volume: 13 Pages: 021002~021002

    • DOI

      10.35848/1882-0786/ab6ca6

    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Modulation of the optical absorption edge of ε- and κ-Ga2O3 due to Co impurities caused by band structure changes: Work function measurements and first-principle calculations2020

    • Author(s)
      Yamanaka K.、Raebiger H.、Mukai K.、Shudo K.
    • Journal Title

      Journal of Applied Physics

      Volume: 127 Pages: 065701~065701

    • DOI

      10.1063/1.5134521

    • Peer Reviewed / Int'l Joint Research
  • [Presentation] Strain control of carrier localization in piezoelectrics2019

    • Author(s)
      H. Raebiger, S. Bae
    • Organizer
      30th International Conference on Defects in Semiconductors, Seattle, WA, USA
    • Int'l Joint Research
  • [Presentation] Calculation of ferromagnetic semiconductors: Cr-doped beta-Ga2O32019

    • Author(s)
      K. Ichihashi, H. Raebiger
    • Organizer
      30th International Conference on Defects in Semiconductors, Seattle, WA, USA
    • Int'l Joint Research
  • [Presentation] Electronic states and band gap adjustment of Co-impurity doped epsilon-Ga2O3 and kappa-Ga2O32019

    • Author(s)
      K. Yamanaka, K. Shudo, H. Raebiger
    • Organizer
      30th International Conference on Defects in Semiconductors, Seattle, WA, USA
    • Int'l Joint Research
  • [Presentation] First principles calculation of hole doped La2CuO42019

    • Author(s)
      Riku SHIROTA, H. Raebiger
    • Organizer
      29th Annual Meeting of MRS-J (2019), Yokohama, Japan
  • [Book] First principles methods for defects: state-of-the-art and emerging approaches in Characterisation and Control of Defects in Semiconductors2019

    • Author(s)
      Ertekin Elif、Raebiger Hannes
    • Total Pages
      289~343
    • Publisher
      The IET, United Kingdom
    • ISBN
      9781785616556

URL: 

Published: 2021-01-27  

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