2009 Fiscal Year Final Research Report
Development and application of X-ray differential phase microscopy with X-ray Talbot interferometer
| Project/Area Number |
19360027
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Applied optics/Quantum optical engineering
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| Research Institution | The University of Tokyo |
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Principal Investigator |
MOMOSE Atsushi The University of Tokyo, 大学院・新領域創成科学研究科, 准教授 (20322068)
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| Co-Investigator(Kenkyū-buntansha) |
YASHIRO Wataru 東京大学, 大学院・新領域創成科学研究科, 助教 (10401233)
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| Project Period (FY) |
2007 – 2009
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| Keywords | X線顕微鏡 / シンクロトロン放射光 / 位相計測 / トモグラフィ / CT / 回折格子 / Talbot効果 / Talbot干渉計 |
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| Research Abstract |
Using the X-ray phase measurement techniques with X-ray transmission grating(s), including X-ray Talbot interferometry, in combination with an X-ray imaging microscope with a Fresnel zone plate, X-ray phase-sensitive imaging microscopy has been developed, enabling high-sensitive and high-resolution observation for weakly absorbing objects, such as polymers and biological tissues. In addition, by repeating the phase measurement at plural projection directions, three-dimensional image reconstruction of the refractive index (X-ray phase tomography) has also been demonstrated.
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