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2009 Fiscal Year Final Research Report

Size effect on parcolative ion conductivity of amorphous metal oxide nanofilms

Research Project

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Project/Area Number 20760460
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeSingle-year Grants
Research Field Structural/Functional materials
Research InstitutionHokkaido University

Principal Investigator

AOKI Yoshitaka  Hokkaido University, 大学院・工学研究科, 助教 (50360475)

Project Period (FY) 2008 – 2009
Keywordsパーコレーション / プロトン伝導体 / アモルファス酸化物 / 電解質膜 / 燃料電池
Research Abstract

Amorphous silicate nanofilms, a-M_<0.1>Si_<0.9>O_x, exhibit unique size-enhancement of the proton conductivity along thickness direction due to the presence of the zeolite-like, acid site network with the mesoscopically-sized length inside glass matrix. These films revealed the complex temperature-and humidity-dependency of proton conductivity by the existence of two kinds of protonic carriers: Bronsted acidic protons and Lewis acidic protons. The Bronsted acidic protons could be persistent in amorphous films at around 500℃, as checked by thermal desorption spectroscopy, so that the film exhibited the humidity-independent proton conductivity at temperatures above 300℃. Furthermore, the conductivity across the film σ increased in a power low by reduction of the film thickness d to less than 120 nm as σ ∝ d^<-τ>, and it was saturated when the thickness become less than 40 nm. The observed scaling index τ was 2.2 in agreement with the value of the theoretical index (2.3) of cluster size scaling in 3-dimensional percolation system. This conduction behavior is explicable by finite size-scaling of the highly-conductive pathway based on the interconnected Bronsted acid centers in the range of a few tens to hundreds nm.

  • Research Products

    (9 results)

All 2010 2009 2008 Other

All Journal Article (4 results) Presentation (4 results) Remarks (1 results)

  • [Journal Article] Ion-conducting, sub-100 nm-thick film of amorphous hafnium silicate2010

    • Author(s)
      Y.Aoki, H.Habazaki, T.Kunitake
    • Journal Title

      Solid State Ionics Vol.115,No.3-4

      Pages: 115-121

  • [Journal Article] Size-scaling of proton conductivity in amorphous aluminosilicate acid thin film2009

    • Author(s)
      Y.Aoki, H.Habazaki, T.Kunitake
    • Journal Title

      Journal of the American Chemical Society Vol.131,No.40

      Pages: 14399-14406

  • [Journal Article] High proton conductivity in anodic ZrO2-WO3 nanofilms2009

    • Author(s)
      D.Kowalski, Y.Aoki, H.Habazaki
    • Journal Title

      Angewandte Chemie International Edition Vol.48,No.41

      Pages: 7582-7585

  • [Journal Article] Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm2008

    • Author(s)
      Y.Aoki, H.Habazaki, T.Kunitake
    • Journal Title

      Electrochemical and Solid-State Letters Vol.11,No.11

      Pages: P13-P16

  • [Presentation] アモルファスシリケートM0.1Si0.9Ox薄膜における伝導率サイズスケーリングの添加元素M依存性2009

    • Author(s)
      青木芳尚、幅崎浩樹
    • Organizer
      第35回固体イオニクス討論会
    • Place of Presentation
      大坂
    • Year and Date
      20091200
  • [Presentation] Power-law scaling of proton conductivity of amorphous silicate thin films2009

    • Author(s)
      Y.Aoki, H.Habazaki, T.Kunitake
    • Organizer
      17th International Symposium on Solid State Ionics
    • Place of Presentation
      Toronto
    • Year and Date
      20090700
  • [Presentation] アモルファスシリケート薄膜における伝導率スケーリング挙動2009

    • Author(s)
      青木芳尚、幅崎浩樹
    • Organizer
      電気化学会第77回大会
    • Place of Presentation
      富山
    • Year and Date
      20090300
  • [Presentation] アモルファスリン酸ジルコニウム薄膜のプロトン伝導挙動2009

    • Author(s)
      小川幸太、青木芳尚、幅崎浩樹、山口周
    • Organizer
      電気化学会第77回大会
    • Place of Presentation
      富山
    • Year and Date
      20090300
  • [Remarks]

    • URL

      http://labs.eng.hokudai.ac.jp/labo/elechem/

URL: 

Published: 2011-06-18   Modified: 2016-04-21  

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