2009 Fiscal Year Final Research Report
Detecting evanescent THz waves with an AFM probe tip
| Project/Area Number |
20860024
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| Research Category |
Grant-in-Aid for Young Scientists (Start-up)
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| Allocation Type | Single-year Grants |
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| Research Field |
Measurement engineering
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| Research Institution | The University of Tokyo |
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Principal Investigator |
KAJIHARA Yusuke The University of Tokyo, 大学院・総合文化研究科, 研究員 (60512332)
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| Project Period (FY) |
2008 – 2009
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| Keywords | パッシブイメージング / 原子間力顕微鏡 / 近接場顕微鏡 / エバネッセント波 / テラヘルツ波 / 中赤外光 / 表面プラズモン |
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| Research Abstract |
We developed a scattering-type scanning near-field optical microscope, which does not use any external light source. With the developed microscope, we performed passive near-field microscopy of spontaneous thermal emission. By scanning a near-field probe on a GaAs/Au sample at room temperature without an external light, we obtained near-field components derived from thermally activated surface plasmon on Au. The spatial resolution of 150nm (1/100 of wavelength) was successfully achieved.
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