2013 Fiscal Year Final Research Report
Development of devices and systems toward realization of high-capacity wireless communications by terahertz waves
Project/Area Number |
21226010
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Research Category |
Grant-in-Aid for Scientific Research (S)
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Allocation Type | Single-year Grants |
Research Field |
Electron device/Electronic equipment
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Research Institution | Tokyo Institute of Technology |
Principal Investigator |
ASADA Masahiro 東京工業大学, 総合理工学研究科(研究院), 教授 (30167887)
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Co-Investigator(Kenkyū-buntansha) |
MIYAMOTO Yasuyuki 東京工業大学, 大学院理工学研究科, 教授 (40209953)
NISHIYAMA Nobuhiko 東京工業大学, 大学院理工学研究科, 准教授 (80447531)
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Co-Investigator(Renkei-kenkyūsha) |
SUZUKI Safumi 東京工業大学, 大学院理工学研究科, 准教授 (40550471)
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Project Period (FY) |
2009-05-11 – 2014-03-31
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Keywords | 電子デバイス・集積回路 / テラヘルツデバイス / 大容量無線通信 / 共鳴トンネルダイオード / 微細スロットアンテナ / テラヘルツ波の変調 |
Research Abstract |
Toward realization of high-capacity wireless communications in the undeveloped terahertz frequency region, we investigated oscillation and modulation of terahertz waves, and wireless data transmission. For the oscillation device, we achieved room-temperature oscillation at 1.55 THz using resonant tunneling diodes with reduced electron delay, which is the highest frequency of semiconductor electron devices. High-power oscillation and high-speed direct modulation of these oscillators were achieved with the structure optimization of the integrated micro-antennas. Modulators for terahertz waves with optical signal and transistors with high current drivability for modulation were also obtained. Wireless data transmission was demonstrated with the resonant- tunneling-diode transmitter and Schottky-barrier-diode receiver, and feasibility of high-capacity communication was obtained.
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Research Products
(21 results)
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[Remarks] 「RTD 素子の性能が大きく向上、室温で1.42THz を発振-テラヘルツ波の用途拡大に道」,日経エレクトロニクス,2014年1月 報道等
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[Remarks] 「共鳴トンネル構造によるテラヘルツ波の発生とその応用」,科研費NEWS(学振),vol.4, p.8,2012 報道等
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[Remarks] "Milestone for wi-fi with T-rays",BBC News, 2012年5月16日、報道等
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[Remarks] "Re-grown source-drain III-V MOSFETs demonstrate higher drain current", Semiconductor Today, 2011年5月 報道等
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