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2012 Fiscal Year Final Research Report

Acceleration of Timing Analysis using Monte Carlo Methods

Research Project

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Project/Area Number 22360143
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Electron device/Electronic equipment
Research InstitutionKyoto University

Principal Investigator

SATO Takashi  京都大学, 大学院・情報学研究科, 教授 (20431992)

Co-Investigator(Kenkyū-buntansha) OCHI Hiroyuki  京都大学, 大学院・情報学研究科, 准教授 (40264957)
TSUTSUI Hiroshi  京都大学, 大学院・情報学研究科, 助教 (30402803)
Project Period (FY) 2010 – 2012
Keywords集積回路設計技術 / CAD / タイミング解析 / モンテカルロ法
Research Abstract

Timing constraint is one of the most important objectives in advanced integrated circuit design. In this project, acceleration of the timing analysis is studied. Based on the measurements on test-chips, variability- and degradation-aware device models have been first proposed to accurately handle timing information of miniaturized devices. A new algorithm of timing analysis has then been implemented on a hardware, thorough which by more than ten times acceleration has been achieved while maintaining advantages of Monte Carlo based methods that can handle arbitrary delay distribution.

  • Research Products

    (27 results)

All 2013 2012 2011 2010

All Journal Article (5 results) (of which Peer Reviewed: 5 results) Presentation (22 results)

  • [Journal Article] Parallel Acceleration Scheme for Monte Carlo Based SSTA using Generalized STA Processing Element2013

    • Author(s)
      Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi and Takashi Sato
    • Journal Title

      IEICE Transactions on Electronics

      Volume: Vol.E96-C, No.4 Pages: 473-481

    • DOI

      DOI:10.1587/transele.E96.C.473

    • Peer Reviewed
  • [Journal Article] Device-Parameter Estimation Through IDDQ Signatures2013

    • Author(s)
      Michihiro Shintani and Takashi Sato
    • Journal Title

      IEICE Transactions on Information and Systems

      Volume: Vol.E96-D, No.2 Pages: 303-313

    • DOI

      DOI:10.1587/transinf.E96.D.303

    • Peer Reviewed
  • [Journal Article] Powerdistribution network optimization for timing improvement with statistical noise model and timing analysis2012

    • Author(s)
      Takashi Enami, Takashi Sato, and Masanori Hashimoto
    • Journal Title

      IEICE Transactions of Fundamentals on Electronics, Communications and Computer Sciences

      Volume: Vol.E95-A, No.12 Pages: 2261-2271

    • DOI

      DOI:10.1587/transfun.E95.A.2261

    • Peer Reviewed
  • [Journal Article] Bayesian Estimation of Multi-Trap RTN Parameters using Markov Chain Monte Carlo Method2012

    • Author(s)
      Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: Vol.E95-A, No.12 Pages: 2272-2283

    • DOI

      DOI:10.1587/transfun.E95.A.2272

    • Peer Reviewed
  • [Journal Article] A Variability-Aware Energy-Minimization Strategy for Subthreshold Circuits2012

    • Author(s)
      Junya Kawashima, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: Vol.E95-A, No.12 Pages: 2242-2250

    • DOI

      DOI:10.1587/transfun.E95.A.2242

    • Peer Reviewed
  • [Presentation] A Bayesian-Based Process Parameter Estimation using IDDQ Current Signature2013

    • Author(s)
      Michihiro Shintani and Takashi Sato
    • Organizer
      IEEE VLSI Test Symposium (VTS)
    • Place of Presentation
      Hyatt Maui, Hawaii, USA
    • Year and Date
      2013-04-23
  • [Presentation] 回路構造の異なるラッチの消費エネルギーの比較2013

    • Author(s)
      藤田 隆史, 筒井 弘, 越智 裕之, 佐藤高史
    • Organizer
      電子情報通信学会総合大会
    • Place of Presentation
      岐阜大学,岐阜市
    • Year and Date
      2013-03-19
  • [Presentation] Evaluation of dependent node selection of histogram propagation based statistical timing analysis2013

    • Author(s)
      Shiyi Zhang, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      電子情報通信学会総合大会
    • Place of Presentation
      岐阜大学,岐阜市
    • Year and Date
      2013-03-19
  • [Presentation] Multi-Trap RTN Parameter Extraction Based on Bayesian Inference2013

    • Author(s)
      Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      International Symposium on Quality Electrical Design (ISQED) (Techmart Center
    • Place of Presentation
      Santa Clara, USA
    • Year and Date
      2013-03-06
  • [Presentation] オンラインテストを指向したIDDQ電流しきい値決定手法の検討2013

    • Author(s)
      Santa Clara, USA
    • Organizer
      電子情報通信学会 VLSI設計技術研究会
    • Place of Presentation
      沖縄青年会館,那覇市
    • Year and Date
      2013-03-04
  • [Presentation] An Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation2013

    • Author(s)
      Michihiro Shintani and Takashi Sato
    • Organizer
      ACM/IEEE Asia South Pacific Design Automation Conference (ASP-DAC)
    • Place of Presentation
      Pacifico Yokohama, Yokohama, Japan
    • Year and Date
      2013-01-25
  • [Presentation] Aging Statistics Based on Trapping/detrapping: Silicon Evidence, Modeling and Prediction2012

    • Author(s)
      Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao
    • Organizer
      IEEE International Reliability Physics Symposium
    • Place of Presentation
      Hyatt Regency Orange County, Anaheim, USA
    • Year and Date
      20121519
  • [Presentation] Statistical Aging Under Dynamic Voltage Scaling: a Logarithmic Model Approach2012

    • Author(s)
      Jyothi Bhaskarr Velamala, Ketul B. Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, and Yu Cao
    • Organizer
      IEEE Custom Integrated Circuits Conference (CICC)
    • Place of Presentation
      DoubleTree Hotel, San Jose, USA
    • Year and Date
      20120909-12
  • [Presentation] チップ試作による最小動作電圧予測手法の評価2012

    • Author(s)
      川島 潤也, 筒井 弘, 越智 裕之, 佐藤高史
    • Organizer
      電子情報通信学会 ICD研究会
    • Place of Presentation
      東京工業大学大岡山キャンパス 東工大大蔵前会館ロイアルブルーホール,東京都
    • Year and Date
      2012-12-17
  • [Presentation] Accurate I/O Buffer Impedance Self-Adjustment using Vth and Temperature Sensors2012

    • Author(s)
      Zhi Li, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      デザインガイア
    • Place of Presentation
      九州大学医学部百年講堂,福岡市
    • Year and Date
      2012-11-27
  • [Presentation] 情報量規準を用いるRTNモデルパラメータ推定の自動化2012

    • Author(s)
      清水 裕史, 筒井 弘, 越智 裕之, 佐藤高史
    • Organizer
      DAシンポジウム
    • Place of Presentation
      ホテル下呂温泉水明館,下呂市
    • Year and Date
      2012-08-29
  • [Presentation] 回路の最小動作電圧改善とその予測精度向上の一検討2012

    • Author(s)
      川島 潤也, 越智 裕之, 筒井 弘, 佐藤高史
    • Organizer
      第25回回路とシステムワークショップ
    • Place of Presentation
      淡路夢舞台国際会議場,淡路市
    • Year and Date
      2012-07-31
  • [Presentation] Physics Matters: Statistical Aging Prediction Under Trapping/detrapping2012

    • Author(s)
      Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao
    • Organizer
      ACM/IEEE Design Automation Conference (DAC)
    • Place of Presentation
      Moscone Center, San Francisco, USA
    • Year and Date
      2012-06-05
  • [Presentation] Acceleration Scheme for Monte Carlo Based SSTA using Generalized STA Processing Element2012

    • Author(s)
      Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      ACM/IEEE International Workshop on Timing Issues (TAU)
    • Place of Presentation
      National Taiwan University, Taipei, Taiwan
    • Year and Date
      2012-01-18
  • [Presentation] Statistical Aging Prediction and Characterization using Trapping/detrapping Based NBTI Models2011

    • Author(s)
      Jyothi Bhaskarr Velamala, Takashi Sato, and Yu Cao
    • Organizer
      Workshop on Variability Modeling and Characterization (VMC)
    • Place of Presentation
      DoubleTree Hotel, San Jose, USA
    • Year and Date
      2011-11-10
  • [Presentation] A Design Strategy for Sub-Threshold Circuits Considering Energy-Minimization and Yield-Maximization2011

    • Author(s)
      Junya Kawashima, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      IEEE International SOC Conference (SOCC)
    • Place of Presentation
      Grand Hotel, Taipei, Taiwan
    • Year and Date
      2011-09-26
  • [Presentation] EM法によるMOSデバイス界面状態数の自動推定2011

    • Author(s)
      清水 裕史, 筒井 弘, 越智 裕之, 佐藤高史
    • Organizer
      電子情報通信学会 ソサイエティ大会
    • Place of Presentation
      北海道大学,札幌市
    • Year and Date
      2011-09-13
  • [Presentation] A Device Array for Efficient Bias-Temperature Instability Measurements2011

    • Author(s)
      Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, a nd Hiroyuki Ochi
    • Organizer
      European Solid-State Device Research Conference (ESSDERC)
    • Place of Presentation
      Finlandia Hall, Helsinki, Finland
    • Year and Date
      2011-09-13
  • [Presentation] エネルギー最小化と動作保証を考慮したサブスレッショルド回路の設計指針の検討2011

    • Author(s)
      川島 潤也, 越智 裕之, 筒井 弘, 佐藤高史
    • Organizer
      第24回回路とシステムワークショップ
    • Place of Presentation
      淡路夢舞台国際会議場,淡路市
    • Year and Date
      2011-08-02
  • [Presentation] A Stress-Parallelized Device Array for Efficient Bias-Temperature Stability Measurements2011

    • Author(s)
      Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, and Hiroyuki Ochi
    • Organizer
      IEEE International Workshop on Design for Manufacturability and Yield 2011(DFM&Y)
    • Place of Presentation
      San Diego Convention Center, San Diego, USA
    • Year and Date
      2011-06-06
  • [Presentation] A fully pipelined implementation of Monte Carlo based SSTA on FPGAs2011

    • Author(s)
      Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      International Symposium on Quality Electrical Design (ISQED)
    • Place of Presentation
      Techmart Center, Santa Clara, USA
    • Year and Date
      2011-03-16
  • [Presentation] A transistor-array for parallel BTI-effects measurements2010

    • Author(s)
      Takumi Uezono, Tadamichi Kozaki, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      Workshop on Variability Modeling and Characterization (VMC)
    • Place of Presentation
      DoubleTreeHotel, San Jose, USA
    • Year and Date
      2010-11-11

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Published: 2014-08-29  

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