2012 Fiscal Year Final Research Report
Evaluation of ceramics grain blandly using AFM-Raman spectroscopy
| Project/Area Number |
22560679
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Inorganic materials/Physical properties
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| Research Institution | 防衛大学校 |
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Principal Investigator |
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| Co-Investigator(Kenkyū-buntansha) |
NISHIDA Ken 防衛大学校, 電気情報学群, 准教授 (40299384)
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| Project Period (FY) |
2010 – 2012
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| Keywords | 機能性セラミックス / AFM ラマン分光法 |
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| Research Abstract |
We applied AFM-Raman combined equipment for high sensitive and high spatial resolution measurement technique. The intensity of Raman spectra at TERS was 5 times as high as that of normal Raman measurement. The spatial resolution was about 300 nm. We established the evaluation method for perovskite oxides. The changes of phonon modes related to A- and B-site ions was indicated anti-site and appearance of additional mode was showed oxygen vacancy.
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Research Products
(3 results)
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[Presentation] Structural investigation of SrRuO3 films prepared by sputtering method using Raman spectroscopy and X-ray photoemission spectroscopy2012
Author(s)
T. Tai, M. Nishide, M. Matsuoka, J. Kim, T. Kamo, H. Funakubo, T. Katoda, H. Shima, K. Nishida and T. Yamamoto
Organizer
IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012)
Place of Presentation
Pacifico Yokohama, Yokohama, Japan
Year and Date
20120923-28
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