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2012 Fiscal Year Final Research Report

Nanometer cale surface charge mapping in liquids

Research Project

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Project/Area Number 22686007
Research Category

Grant-in-Aid for Young Scientists (A)

Allocation TypeSingle-year Grants
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionKyoto University

Principal Investigator

KOBAYASHI Kei  京都大学, 産官学連携本部, 助教 (40335211)

Project Period (FY) 2010 – 2012
Keywords走査プローブ顕微鏡
Research Abstract

A surface charge mapping technique based on frequency modulation atomic force microscopy (FM-AFM) working in liquid environments has been developed. We implemented a phototheimal excitation setup for cantilever oscillation in liquids to perform quantitative force measurements. We analyzed the cantilever oscillation caused by an external modulation voltage between the tip and sample surface, and found that the conventional voltage modulation schemes for surface potential measurement cannot be applied in polar liquids. We also developed a method to estimate surface charge density by comparing measured electrostatic force with theoretically calculated force.

  • Research Products

    (27 results)

All 2013 2012 2011 2010

All Journal Article (11 results) (of which Peer Reviewed: 11 results) Presentation (13 results) Patent(Industrial Property Rights) (3 results)

  • [Journal Article] Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces2013

    • Author(s)
      K.-I. Umeda, K. Kobavashi, N. Oyabu, Y. Hirata, K. Matsushige and H. Yamada
    • Journal Title

      J. Appl. Phys

      Volume: 113

    • DOI

      DOI:10.1063/1.4801795

    • Peer Reviewed
  • [Journal Article] Monotonic damping in nanoscopic hydration experiments2013

    • Author(s)
      A. Labuda, K. Kobayashi, K. Suzuki, H. Yamada and P. Grittier
    • Journal Title

      Phys. Rev. Lett

      Volume: 110

    • DOI

      DOI:10.1063/1.4712286

    • Peer Reviewed
  • [Journal Article] Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields2012

    • Author(s)
      K.-I. Umeda, K. Kobavashi, K. Matsushige and H. Yamada
    • Journal Title

      Appl. Phys. Lett

      Volume: 101

    • DOI

      DOI:10.1063/1.4754289

    • Peer Reviewed
  • [Journal Article] Atomic-Resolution Imaging of Graphite-Water Interface by Frequency Modulation Atomic Force Microscopy2011

    • Author(s)
      K. Suzuki, N. Oyabu, K. Kobayashi, K. Matsushige and H. Yamada
    • Journal Title

      Appl. Phys. Express

      Volume: 4

    • DOI

      DOI:10.1143/APEX.4.125102

    • Peer Reviewed
  • [Journal Article] Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment2011

    • Author(s)
      S. Rode, R. Stark, J. LUbbe, L. TrOger, J. Schiitte, K. Umeda, K. Kobavashi, H. Yamada and A. Kiihnle
    • Journal Title

      Rev. Sci. Instrum

      Volume: 82

    • DOI

      DOI:10.1063/1.3606399

    • Peer Reviewed
  • [Journal Article] Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments2011

    • Author(s)
      A. Labuda, K. Kobayashi, D. Kiracofe, K. Suzuki. P. H. Grutter and H. Yamada
    • Journal Title

      AIP Advances

      Volume: 1

    • DOI

      DOI:10.1063/1.3601872

    • Peer Reviewed
  • [Journal Article] Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy2011

    • Author(s)
      K. Kobavashi, H. Yamada and K. Matsushige
    • Journal Title

      Rev. Sci. Instrum

      Volume: 82

    • DOI

      DOI:10.1063/1.3557416

    • Peer Reviewed
  • [Journal Article] High efficiency laser photothermal excitation of microcantilever vibrations in air and liquids2011

    • Author(s)
      D. Kiracofe, K. Kobayashi, A. Labuda, A. Raman and H. Yamada
    • Journal Title

      Rev. Sci. Instrum

      Volume: 82

    • DOI

      DOI:10.1063/1.3518965

    • Peer Reviewed
  • [Journal Article] Aqueous Solution Structure over a-Al203(01-12) Probed by Frequency-Modulation Atomic Force Microscopy2010

    • Author(s)
      T. Hiasa, K. Kimura, H. Onishi, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobavashi and H. Yamada
    • Journal Title

      J. Phys.Chem

      Volume: 114

    • DOI

      DOI:10.1021加1057447

    • Peer Reviewed
  • [Journal Article] Development of High-Resolution Imaging of Solid-Liquid Interface by Frequency Modulation Atomic Force Microscopy2010

    • Author(s)
      K. Suzuki, S. Kitamura, S. Tanaka, K. Kobayashi and H. Yamada
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 49

    • DOI

      DOI:10.1143/HAP.49.08LB12

    • Peer Reviewed
  • [Journal Article] High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method2010

    • Author(s)
      K.-I. Umeda, N. Oyabu, K. Kobayashi Y. Hirata, K. Matsushige and H. Yamada
    • Journal Title

      Appl. Phys.

      Volume: 3

    • DOI

      DOI:10.1143/APEX.3.065205

    • Peer Reviewed
  • [Presentation] Quantitative charge density measurement of biomolecule in aqueous solutions by FM-AFM with force mapping technique2012

    • Author(s)
      K.-I. Umeda, Y. Hirata, N. Oyabu, K. Kobayashi and H. Yamada
    • Organizer
      20th International Colloquium on Scarming Probe Microscopy
    • Place of Presentation
      那覇
    • Year and Date
      2012-12-18
  • [Presentation] Molecular-Scale Investigations of Self-Assembled Surfactant Aggregates on Graphite by Force Mapping Using FM-AFM2012

    • Author(s)
      K. Suzuki, K. Kobayashi, K. Matsushige and H. Yamada
    • Organizer
      20th International Colloquium on Scarming Probe Microscopy
    • Place of Presentation
      ggg
    • Year and Date
      2012-12-17
  • [Presentation] FM-AFMによる界面活性剤分子集合体上の電気二重層力の評価2012

    • Author(s)
      鈴木一博,大藪範昭,止埜圭,松重和美,山田啓文
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛大学・松山大学
    • Year and Date
      2012-09-12
  • [Presentation] 液中動作周波数変調AFMにおけるエネルギー散逸一定モードを用いた電荷密度計測2012

    • Author(s)
      梅田健一,平田芳樹,大藪範昭,小林圭,山田啓文
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛大学・松山大学
    • Year and Date
      2012-09-12
  • [Presentation] FM-AFMによる界面活性剤分子集合体上の電気二重層可視化および界面電荷分布の評価2012

    • Author(s)
      鈴木一博,大藪範昭,小林圭,松重和美,山田啓文
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      早稲田大学
    • Year and Date
      2012-03-17
  • [Presentation] 3次元フォースマッピング法によるカチオン性界面活性剤分子集合体上の電気二重層力評価2012

    • Author(s)
      伊藤史晃,鈴木一博,大藪範昭,小林圭,松重和美,山田啓文
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      早稲田大学
    • Year and Date
      2012-03-17
  • [Presentation] 液中動作周波数変調AFMにおけるエネルギー散逸像コントラストの起源の解明2012

    • Author(s)
      梅田健一,平田芳樹,大藪範昭,小林圭,松重和美,山田啓文
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      早稲田大学
    • Year and Date
      2012-03-17
  • [Presentation] Quantitative study of local electric double layer force by FM-AFM in aqueous solutions2011

    • Author(s)
      K.-I. Umeda, Y. Hirata, N. Oyabu, K. Kobayashi, K. Matsushige and H. Yamada
    • Organizer
      14th International Conference on non-contact Atomic Force Microscopy
    • Place of Presentation
      Lindau, Germany
    • Year and Date
      2011-09-17
  • [Presentation] FM-AFMを用いた局所電荷分布計測技術の開発に向けたコロイダルプローブによる電気二重層力検出2011

    • Author(s)
      梅田健一,平田芳樹,大藪範昭,止埜圭,松重和美,山田啓文
    • Organizer
      イダルプローブによる電気二重層力検出",第72回応用物理学会学術講演会
    • Place of Presentation
      山形大学
    • Year and Date
      2011-09-01
  • [Presentation] High Efficiency Laser Photothennal Excitation of Microcantilever Vibrations in Air and Liquids2010

    • Author(s)
      D. Kiracofe, K. Kobayashi A. Labuda, A. Raman and H. Yamada
    • Organizer
      18th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      熱川ハイツ
    • Year and Date
      2010-12-09
  • [Presentation] Force Spectroscopy Study in Liquids by Frequency Modulation AFM Toward Local Charge Mapping at Solid/liquid Interface2010

    • Author(s)
      K.-I. Umeda, Y. Hirata, N. Oyabu, K. Kobayashi, K. Matsushige and H. Yamada
    • Organizer
      MRS 2010 Fall Meeting
    • Place of Presentation
      Boston, USA
    • Year and Date
      2010-10-29
  • [Presentation] 液中FM-AFMにおける圧電励起法および光熱励振法の比較2010

    • Author(s)
      A.Labuda,鈴木一博,⊥埜圭,大藪範昭,P.Grutter,山田啓文
    • Organizer
      第71回応用物理学会学術講演会
    • Place of Presentation
      長崎大学
    • Year and Date
      2010-09-17
  • [Presentation] 固液界面における局所電荷分布計測へ向けた静電気力の探針-試料間距離依存性に関する研究2010

    • Author(s)
      梅田健一,平田芳樹,大藪範昭,止埜圭,松重和美,山田啓文
    • Place of Presentation
      長崎大学
    • Year and Date
      2010-09-16
  • [Patent(Industrial Property Rights)] 原子間力顕微鏡を用いた誘電特性測定方法2011

    • Inventor(s)
      粉川良平,大田昌弘,梅田健一,木林圭,山田啓文,松重和美
    • Industrial Property Rights Holder
      株式会社島津製作所
    • Industrial Property Number
      特願2011-190981
    • Filing Date
      2011-09-01
  • [Patent(Industrial Property Rights)] 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡2011

    • Inventor(s)
      粉川良平,大田昌弘,梅田健一,木林圭,山田啓文,松重和美
    • Industrial Property Rights Holder
      株式会社島津製作所
    • Industrial Property Number
      特願2011-190980
    • Filing Date
      2011-09-01
  • [Patent(Industrial Property Rights)] 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡2010

    • Inventor(s)
      粉川良平,大田昌弘,梅田健一,大藪範昭,盛圭,山田啓文,松重和美
    • Industrial Property Rights Holder
      株式会社島津製作所
    • Industrial Property Number
      特願2010-128127
    • Filing Date
      2010-06-03

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Published: 2014-08-29  

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