X-Ray stress measurements of coarse-grained materials using area detector

2016 Fiscal Year Final Research Report

• Project/Area Number: 26420009
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Research Field: Materials/Mechanics of materials
• Research Institution: Niigata University
• Principal Investigator: Suzuki Kenji 新潟大学, 人文社会・教育科学系, 教授 (30154537)
• Project Period (FY): 2014-04-01 – 2017-03-31
• Keywords: Ｘ線応力測定 / 2次元検出器 / 粗大粒 / 粗大粒 / 二重露光法

Outline of Final Research Achievements

An X-ray area detector is needed for an X-ray stress measurement of coarse-grained materials, because the X-ray diffraction pattern of coarse grains becomes spotted. In this study, I proposed the “direct-method” using the area detector and the normal incident X-ray to determine the optimum values of stresses. The direct-method uses the simplex method which is a kind of linear programing. The error of the diffraction angles for spotted pattern is caused by the difference between the center of the irradiated area and the center of the grains. As the measure against the problems of the coarse-grained materials, the π-method and the double exposure method were examined. In addition, it is clarified that the divergence of the X-ray beam causes the error of the diffraction angle.

Free Research Field

材料力学