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2015 Fiscal Year Final Research Report

Thermal properties mesurement device for nanogap

Research Project

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Project/Area Number 26600062
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeMulti-year Fund
Research Field Nano/Microsystems
Research InstitutionKyoto University

Principal Investigator

Tsuchiya Toshiyuki  京都大学, 工学(系)研究科(研究院), 准教授 (60378792)

Project Period (FY) 2014-04-01 – 2016-03-31
Keywordsナノギャップ / 熱膨張アクチュエータ / 静電櫛歯アクチュエータ / へき開破壊 / 単結晶シリコン / 熱電子放出 / MEMS
Outline of Final Research Achievements

A nanogap fabrication and measurement device has been proposed, fabricated and tested, in order to measure the thermal and electrical transportation properties of a very narrow conformal gap (called nanogap) of a few to tens of nm wide and a few micrometer square. The device actuates thermal actuator to cause cleave fracture on a single crystal silicon structure and to form the nanogap consisting from a pair of fracture surfaces separated from one body. We successfully fracture-fabricated a nanogap by operating the device. By measuring the voltage-current relationship of the gap of 120 nm wide, we confirmed that the electron emission between the nanogap.

Free Research Field

ナノ・マイクロシステム工学

URL: 

Published: 2017-05-10  

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