Development of x-ray single-shot two-dimensional detector with sub-micrometer spatial resolution

2015 Fiscal Year Final Research Report

• Project/Area Number: 26790077
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Multi-year Fund
• Research Field: Quantum beam science
• Research Institution: Japan Synchrotron Radiation Research Institute
• Principal Investigator: Kameshima Takashi 公益財団法人高輝度光科学研究センター, XFEL利用研究推進室, 研究員 (50558046)
• Project Period (FY): 2014-04-01 – 2016-03-31
• Keywords: X線検出器 / シンチレーター / セラミックス / YAG / LuAG / XFEL / SACLA / SPring-8

Outline of Final Research Achievements

In this research, we developed an x-ray two-dimensional detector capable of measuring x-ray signals with sub-micrometer structure. We planned to develop a key-factor, a high-spatial resolution scintillator, and to measure the spatial resolving power of the x-ray detector in two years. In 2014, we succeeded in producing a thin-film scintillator with thickness of 4 micrometer by using a novel fabrication method based on solid-state diffusion bonding. In 2015, we have constructed experiment setup for the spatial resolution measurement of the developed x-ray detector. The measurement result showed that the x-ray detector with a thin-film scintillator fabricated by the proposed method achieved spatial resolution of 600 ~ 700 nm.

Free Research Field

X線検出器