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Glide motion and electronic structure of partial dislocations in 4H-SiC under electronic excitation conditions

Research Project

Project/Area Number 15H03535
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Nanomaterials engineering
Research InstitutionTohoku University

Principal Investigator

Ohno Yutaka  東北大学, 金属材料研究所, 准教授 (80243129)

Research Collaborator MAEDA Koji  東京大学, 名誉教授 (10107443)
Project Period (FY) 2015-04-01 – 2018-03-31
Project Status Completed (Fiscal Year 2017)
Budget Amount *help
¥17,810,000 (Direct Cost: ¥13,700,000、Indirect Cost: ¥4,110,000)
Fiscal Year 2017: ¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000)
Fiscal Year 2016: ¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000)
Fiscal Year 2015: ¥12,090,000 (Direct Cost: ¥9,300,000、Indirect Cost: ¥2,790,000)
Keywords炭化シリコン / 電子励起 / 転位すべり / 格子欠陥 / ナノ欠陥制御
Outline of Final Research Achievements

Photo-induced glide of 30degrees-Si partial dislocations in 4H-SiC was induced by the illumination of laser light with a sub-gap energy (2.71 eV and 3.06 eV) in a transmission electron microscope (TEM), and the glide was observed in-situ by TEM under photo-illumination. It was concluded that the glide was enhanced by the photo-ionization of the dislocations with a localized energy level below 0.55 eV in depth. Under the hypothesis that 1) the glide velocity was determined by the drift motion of kinks on the dislocations and 2) the driving force of the glide was related to the energy of the stacking faults bound by the dislocations as well as to the line tension of the dislocations, the activation energy for the kink motion was estimated to be below 0.6 eV.

Report

(4 results)
  • 2017 Annual Research Report   Final Research Report ( PDF )
  • 2016 Annual Research Report
  • 2015 Annual Research Report
  • Research Products

    (19 results)

All 2018 2017 2016 2015 Other

All Journal Article (5 results) (of which Peer Reviewed: 5 results) Presentation (13 results) (of which Int'l Joint Research: 10 results,  Invited: 7 results) Remarks (1 results)

  • [Journal Article] Intrinsic microstructure of Si/GaAs heterointerfaces fabricated by surface-activated bonding at room temperature2018

    • Author(s)
      Y. Ohno, H. Yoshida, S. Takeda, J. Liang, N. Shigekawa
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 57 Issue: 2S1 Pages: 02BA01-02BA01

    • DOI

      10.7567/jjap.57.02ba01

    • NAID

      210000148616

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Characterization of femtosecond-laser-induced periodic structures on SiC substrates2018

    • Author(s)
      R. Miyagawa, Y. Ohno, M. Deura, I. Yonenaga, O. Eryu
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 57 Issue: 2 Pages: 025602-025602

    • DOI

      10.7567/jjap.57.025602

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Nanoscopic analysis of oxygen segregation at tilt boundaries in silicon ingots using atom probe tomography combined with TEM and ab initio calculations2017

    • Author(s)
      OHNO Y.、INOUE K.、FUJIWARA K.、KUTSUKAKE K.、DEURA M.、YONENAGA I.、EBISAWA N.、SHIMIZU Y.、INOUE K.、NAGAI Y.、YOSHIDA H.、TAKEDA S.、TANAKA S.、KOHYAMA M.
    • Journal Title

      Microscopy

      Volume: 268 Issue: 3 Pages: 230-238

    • DOI

      10.1111/jmi.12602

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Impact of local atomic stress on oxygen segregation at tilt boundaries silicon2017

    • Author(s)
      Y. Ohno, K. Inoue, K. Fujiwara, K. Kutsukake, M. Deura, I. Yonenaga, N. Ebisawa, Y. Shimizu, K. Inoue, Y. Nagai, H. Yoshida, S. Takeda, S. Tanaka, M. Kohyama
    • Journal Title

      Applied Physics Letters

      Volume: 110 Issue: 6

    • DOI

      10.1063/1.4975814

    • Related Report
      2016 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Recombination activity of nickel, copper, and oxygen atoms segregating at grain boundaries in mono-like silicon crystals2016

    • Author(s)
      Y. Ohno, K. Kutsukake, M. Deura, I. Yonenaga, Y. Shimizu, N. Ebisawa, K. Inoue, Y. Nagai, H. Yoshida, S. Takeda
    • Journal Title

      Applied Physics Letters

      Volume: 109 Issue: 14

    • DOI

      10.1063/1.4964440

    • Related Report
      2016 Annual Research Report
    • Peer Reviewed
  • [Presentation] Structural properties of low-resistance Si/GaAs heterointerfaces fabricated by surface-activated bonding at room temperature2018

    • Author(s)
      Y. Ohno
    • Organizer
      Energy, Materials, and Nanotechnology (EMN) Photovoltaics Meeting 2018
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] 半導体の粒界・転位機能-Si粒界とワイドギャップ半導体転位を中心に-2017

    • Author(s)
      大野裕
    • Organizer
      日本金属学会・日本鉄鋼協会東海支部 第71回若手材料研究会「格子欠陥研究の最前線」
    • Place of Presentation
      安保ホール, 名古屋
    • Year and Date
      2017-03-24
    • Related Report
      2016 Annual Research Report
    • Invited
  • [Presentation] Grain boundary segregation in Si studied by atom probe tomography combined with TEM and ab-initio calculations2017

    • Author(s)
      Y. Ohno
    • Organizer
      20th International Conference on Microscopy of Semiconducting Materials
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] シリコン結晶における不純物の粒界偏析 -微視的描像と機能-2017

    • Author(s)
      大野裕
    • Organizer
      第78回応用物理学会秋季学術講演会
    • Related Report
      2017 Annual Research Report
    • Invited
  • [Presentation] Chemical nanoanalyses at grain boundaries by joint use of atom probe tomography and TEM combined with ab-initio calculations2017

    • Author(s)
      Y. Ohno, K. Inoue, K. Fujiwara, K. Kutsukake, M. Deura, I. Yonenaga, Y. Shimizu, K. Inoue, N. Ebisawa, Y. Nagai, H. Yoshida, S. Takeda, S. Tanaka, M. Kohyama
    • Organizer
      Analytical techniques for precise characterization of nano materials (ALTECH 2017) in European Materials Research Society (EMRS) Spring Meeting
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Mechanism of oxygen segregation at tilt boundaries in Si2017

    • Author(s)
      Y. Ohno, K. Inoue, K. Fujiwara, K. Kutsukake, M. Deura, I. Yonenaga, N. Ebisawa, Y. Shimizu, K. Inoue, Y. Nagai, H. Yoshida, S. Takeda, S. Tanaka, M. Kohyama
    • Organizer
      29th International Conference on Defects in Semiconductors (ICDS2017)
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 表面活性化接合Si/GaAs界面の平面TEM観察2016

    • Author(s)
      大野裕
    • Organizer
      独立行政法人日本学術振興会接合界面創成技術第191委員会 第7回研究会
    • Place of Presentation
      東京大学, 東京
    • Year and Date
      2016-12-16
    • Related Report
      2016 Annual Research Report
    • Invited
  • [Presentation] Segregation ability of oxygen and carbon atoms at large-angle grain boundaries in Si2016

    • Author(s)
      Y. Ohno, K. Inoue, K. Fujiwara, K. Kutsukake, M. Deura, I. Yonenaga, Y. Shimizu, K. Inoue, N. Ebisawa, Y. Nagai, H. Yoshida, S. Takeda, S. Tanaka, M. Kohyama
    • Organizer
      9th International Workshop on Crystalline Silicon for Solar Cells (CSSC-9) & 3rd Silicon Materials Joint Workshop
    • Place of Presentation
      Tempe, AZ, USA
    • Year and Date
      2016-10-10
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Nanoscopic segregation ability of large-angle tilt boundaries in Si2016

    • Author(s)
      Y. Ohno, K. Inoue, K. Kutsukake, M. Deura, I. Yonenaga, N. Ebisawa, Y. Shimizu, K. Inoue, Y. Nagai, H. Yoshida, S. Takeda, S. Tanaka, M. Kohyama
    • Organizer
      Extended Defects in Semiconductors 2016
    • Place of Presentation
      Les Issambres, France
    • Year and Date
      2016-09-25
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Three-dimensional evaluation of segregation ability at grain boundaries in Si by atom probe tomography combined with transmission electron microscopy2016

    • Author(s)
      Y. Ohno
    • Organizer
      European Materials Research Society 2016 Spring Meeting
    • Place of Presentation
      Lille, France
    • Year and Date
      2016-05-02
    • Related Report
      2016 Annual Research Report 2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Nanoscopic mechanism of impurity segregation at grain boundaries in silicon2016

    • Author(s)
      Y. Ohno, K. Inoue, S. Ninomiya, K. Kutsukake, K. Fujiwara, M. Deura, I. Yonenaga, N. Ebisawa, Y. Shimizu, K. Inoue, Y. Nagai, H. Yoshida, S. Takeda, S. Tanaka, M. Kohyama
    • Organizer
      Materials Research Society 2016 Spring Meeting
    • Place of Presentation
      Phoenix, USA
    • Year and Date
      2016-03-28
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Impurity segregation at small angle tilt boundaries in silicon: nanoscopic mechanisms and applications2016

    • Author(s)
      Y. Ohno
    • Organizer
      Energy, Materials, and Nanotechnology (EMN) Photovoltaics Meeting 2016
    • Place of Presentation
      Hong Kong, China
    • Year and Date
      2016-01-18
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Metal silicide epilayers self-organized at grain boundaries in silicon2015

    • Author(s)
      Y. Ohno, K. Inoue, K. Kutsukake, M. Deura, I. Yonenaga, H. Yoshida, S. Takeda, R. Taniguchi, H. Otubo, S. R. Nishitani, N. Ebisawa, Y. Shimizu, H. Takamizawa, K. Inoue, Y. Nagai
    • Organizer
      2nd East-Asia Microscopy Conference (EAMC2)
    • Place of Presentation
      Himeji, Japan
    • Year and Date
      2015-11-24
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Remarks] 大野裕HP

    • URL

      http://lab-defects.imr.tohoku.ac.jp/ohno/ohno.html

    • Related Report
      2016 Annual Research Report

URL: 

Published: 2015-04-16   Modified: 2019-03-29  

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