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Invention of new functional devices with trap engineering of tunnel field-effect transistors

Research Project

Project/Area Number 15H05526
Research Category

Grant-in-Aid for Young Scientists (A)

Allocation TypeSingle-year Grants
Research Field Electron device/Electronic equipment
Research InstitutionNational Institute of Advanced Industrial Science and Technology

Principal Investigator

Mori Takahiro  国立研究開発法人産業技術総合研究所, エレクトロニクス・製造領域, 主任研究員 (70443041)

Project Period (FY) 2015-04-01 – 2018-03-31
Project Status Completed (Fiscal Year 2017)
Budget Amount *help
¥23,140,000 (Direct Cost: ¥17,800,000、Indirect Cost: ¥5,340,000)
Fiscal Year 2017: ¥6,760,000 (Direct Cost: ¥5,200,000、Indirect Cost: ¥1,560,000)
Fiscal Year 2016: ¥6,630,000 (Direct Cost: ¥5,100,000、Indirect Cost: ¥1,530,000)
Fiscal Year 2015: ¥9,750,000 (Direct Cost: ¥7,500,000、Indirect Cost: ¥2,250,000)
Keywordsトンネルトランジスタ / 等電子トラップ / 相補型集積回路 / スピン量子ビット / 低消費電力 / 量子ビット / CMOS / 量子デバイス / 集積回路 / 集積デバイス
Outline of Final Research Achievements

This research aimed to develop tunnel field-effect transistors (TFET) as a basic element of LSIs and to invent new functional devices with utilizing isoelectronic trap (IET). As for the basic element of LSIs, we realized the operation of both N- and P-type TFETs and succeeded in operating the complementary ring oscillator circuit at world’s first. This achievement was presented in the most prestigious international conference in the semiconductor device field and gained a great response. As for the invention of new functional devices, we succeeded in operating the IET-assisted TFET as a spin qubit and achieved an operating temperature up to 10K. This is the world's highest operating temperature of electronic-device-type spin qubits. This achievement was presented at conferences and submitted in a journal.

Report

(4 results)
  • 2017 Annual Research Report   Final Research Report ( PDF )
  • 2016 Annual Research Report
  • 2015 Annual Research Report
  • Research Products

    (17 results)

All 2018 2017 2016 2015 Other

All Journal Article (5 results) (of which Peer Reviewed: 4 results,  Open Access: 1 results,  Acknowledgement Compliant: 3 results) Presentation (11 results) (of which Int'l Joint Research: 7 results,  Invited: 6 results) Remarks (1 results)

  • [Journal Article] Process and device integration for silicon tunnel FETs utilizing isoelectronic trap technology to enhance the ON current2018

    • Author(s)
      Mori Takahiro、Asai Hidehiro、Fukuda Koichi、Matsukawa Takashi
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 57 Issue: 4S Pages: 04FA04-04FA04

    • DOI

      10.7567/jjap.57.04fa04

    • NAID

      210000148852

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Material engineering for silicon tunnel field-effect transistors: isoelectronic trap technology2017

    • Author(s)
      T. Mori, S. Iizuka, T. Nakayama
    • Journal Title

      MRS communications

      Volume: 7 Issue: 3 Pages: 541-550

    • DOI

      10.1557/mrc.2017.63

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Suppression of tunneling rate fluctuations in tunnel field-effect transistors by enhancing tunneling probability2017

    • Author(s)
      T. Mori, S. Migita, K. Fukuda, H. Asai, Y. Morita, W. Mizubayashi, Y. Liu, S. O'uchi, H. Fuketa, S. Otsuka, T. Yasuda, M. Masahara, H. Ota, and T. Matsukawa
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 56 Issue: 4S Pages: 04CD02-04CD02

    • DOI

      10.7567/jjap.56.04cd02

    • NAID

      210000147562

    • Related Report
      2016 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] 等電子トラップ技術によるオン電流増大に伴う相補型トンネルトランジスタ回路の性能向上2017

    • Author(s)
      森貴洋、浅井栄大、服部淳一、福田浩一、大塚慎太郎、森田行則、大内真一、更田裕司、右田真司、水林亘、太田裕之、松川貴
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 116(448) Pages: 1-4

    • Related Report
      2016 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] Demonstrating Performance Improvement of Complementary TFET Circuits by I_ON Enhancement Based on Isoelectronic Trap Technology2016

    • Author(s)
      T. Mori, H. Asai, J. Hattori, K. Fukuda, S. Otsuka, Y. Morita, S. O’uchi, H. Fuketa, S. Migita, W. Mizubayashi, H. Ota, and T. Matsukawa
    • Journal Title

      Technical Digest of International Electron Devices Meeting

      Volume: 2016 Pages: 512-515

    • DOI

      10.1109/iedm.2016.7838453

    • Related Report
      2016 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Presentation] ON-current boosting technology for silicon tunnel field-effect transistors2018

    • Author(s)
      Takahiro Mori
    • Organizer
      NANOTECH Malaysia 2018
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] シリコントンネルトランジスタのスピン量子ビット応用2018

    • Author(s)
      森貴洋、森山悟士、松川貴、安田哲二、大野圭司
    • Organizer
      第65回応用物理学会春季学術講演会
    • Related Report
      2017 Annual Research Report
  • [Presentation] 等電子トラップ技術による相補型TFET回路の特性向上2017

    • Author(s)
      森貴洋、浅井栄大、服部淳一、福田浩一、大塚慎太郎、森田行則、大内真一、更田裕司、右田真司、水林亘、太田裕之、松川貴
    • Organizer
      第64回応用物理学会春季学術講演会
    • Place of Presentation
      神奈川県・横浜市
    • Year and Date
      2017-03-14
    • Related Report
      2016 Annual Research Report
  • [Presentation] ON Current Boosting Technology for Si-based Tunnel Field-Effect Transistors Utilizing Isoelectronic Trap2017

    • Author(s)
      Takahiro Mori
    • Organizer
      2017 MRS Spring Meeting
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Improvement of Device and Circuit Performance of Si-based Tunnel Field-Effect Transistors by Utilizing Isoelectronic Trap Technology2017

    • Author(s)
      Takahiro Mori, Hidehiro Asai, Takashi Matsukawa
    • Organizer
      2017 International Conference on Solid State Devices and Materials
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] 等電子トラップ技術によるオン電流増大に伴う相補型トンネルトランジスタ回路の性能向上2017

    • Author(s)
      森貴洋
    • Organizer
      電子情報通信学会シリコン材料・デバイス研究会
    • Place of Presentation
      東京都・港区
    • Related Report
      2016 Annual Research Report
    • Invited
  • [Presentation] Demonstrating Performance Improvement of Complementary TFET Circuits by I_ON Enhancement Based on Isoelectronic Trap Technology2016

    • Author(s)
      T. Mori, H. Asai, J. Hattori, K. Fukuda, S. Otsuka, Y. Morita, S. O’uchi, H. Fuketa, S. Migita, W. Mizubayashi, H. Ota, and T. Matsukawa
    • Organizer
      International Electron Devices Meeting 2016
    • Place of Presentation
      アメリカ合衆国・サンフランシスコ
    • Year and Date
      2016-12-05
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research
  • [Presentation] On the Variability of Tunnel Field-Effect Transistors: Suppression of BTBT Fluctuation by Tunneling Probability Enhancement2016

    • Author(s)
      T. Mori, S. Migita, K. Fukuda, H. Asai, Y. Morita, W. Mizubayashi, Y. Liu, S. O'uchi, H. Fuketa, S. Otsuka, T. Yasuda, M. Masahara, H. Ota, and T. Matsukawa
    • Organizer
      International Conference on Solid State Devices and Materials 2016
    • Place of Presentation
      茨城県・つくば市
    • Year and Date
      2016-09-26
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 等電子トラップを導入したTFETのばらつき評価2016

    • Author(s)
      森貴洋、右田真司、福田浩一、浅井栄大、森田行則、水林亘、柳永勛、大内真一、 更田裕司、大塚慎太郎、安田哲二、昌原明植、太田裕之、松川貴
    • Organizer
      第77回応用物理学会秋季学術講演会
    • Place of Presentation
      新潟県・新潟市
    • Year and Date
      2016-09-13
    • Related Report
      2016 Annual Research Report
  • [Presentation] New ON current Boosting Technology in Silicon-based Tunnel Field-Effect Transistors Utilizing Isoelectronic Trap2016

    • Author(s)
      Takahiro Mori
    • Organizer
      EMN Meeting on Field-Effect Transistors
    • Place of Presentation
      台湾・高雄
    • Year and Date
      2016-03-15
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] ON current boosting in Silicon-based Tunnel FETs Utilizing Isoelectronic Trap Technology2015

    • Author(s)
      Takahiro Mori
    • Organizer
      2015 International Workshop on Dielectric Thin Films for Future Electron Devices
    • Place of Presentation
      東京都江東区
    • Year and Date
      2015-11-02
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Remarks] Takahiro MORI's homepage

    • URL

      https://staff.aist.go.jp/mori-takahiro/

    • Related Report
      2017 Annual Research Report

URL: 

Published: 2015-04-16   Modified: 2019-03-29  

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