| Budget Amount *help |
¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000)
Fiscal Year 2016: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2015: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
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| Outline of Final Research Achievements |
ICs are tested by means of supply current supplied from a DC voltage source to them, since supply currents depend on open defects and short ones that occur in ICs. The test method is called a supply current test method. Larger change occurs in the charge volume supplied from a power supply source circuit within a specified timing window than in a supply current due to the defects. No test method had not been proposed to test ICs by means of the charge volume. We have developed a supply current test method based on the volume of charge supplied from a power supply circuit, together of its supply source circuit and the test input generation algorithm. We show by experiments and simulations that open defects that cannot be detected by measuring output signals of an IC can be detected by the test method.
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