Study on low irradiation inverse photoemission spectroscopy for organic device development

Research Project

Project/Area Number	15K13414
Research Category	Grant-in-Aid for Challenging Exploratory Research
Allocation Type	Multi-year Fund
Research Field	Quantum beam science
Research Institution	National Institute of Advanced Industrial Science and Technology
Principal Investigator	Ogawa Hiroshi 国立研究開発法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 (60356699)
Co-Investigator(Kenkyū-buntansha)	清紀弘国立研究開発法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 (20357312) 加藤英俊国立研究開発法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 (60583747) 池浦広美国立研究開発法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 (90357319)
Project Period (FY)	2015-04-01 – 2017-03-31
Project Status	Completed (Fiscal Year 2016)
Budget Amount *help	¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000) Fiscal Year 2016: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000) Fiscal Year 2015: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Keywords	逆光電子分光 / 低速電子ビーム
Outline of Final Research Achievements	Inverse photoemission spectroscopy (IPES) is a technique used to study precisely information of unoccupied electronic structure, which is an important factor in the operation of organic devices. However, since IPES has a very low sensitivity, it is necessary to irradiate a large amount of electron beam to the measurement sample, which is a major problem in measurement. In order to solve this problem, we have novelly designed an optical system which can improve the light collection efficiency of photons emitted in the inverse photoemission process and an electron optical system for electron beam irradiation. As a result, we have been able to construct an IPES measurement system that can achieve higher sensitivity than before.